公开(公告)号：US06859275B2

公开(公告)日：2005-02-22

申请号：US09798860

申请日：2001-03-01

Applicant: William G. Fateley ,  Ronald R. Coifman ,  Frank Geshwind ,  Richard A. DeVerse

Inventor： William G. Fateley ,  Ronald R. Coifman ,  Frank Geshwind ,  Richard A. DeVerse

IPC: G01J3/02 ,  G01J3/06 ,  G01J3/10 ,  G01J3/18 ,  G01J3/28 ,  G01J3/32 ,  G01J3/457 ,  G01N21/39 ,  G02B26/08 ,  G02B27/10 ,  G01J3/04

CPC classification number: G02B27/1013 ,  G01J3/02 ,  G01J3/021 ,  G01J3/0218 ,  G01J3/0229 ,  G01J3/0232 ,  G01J3/027 ,  G01J3/06 ,  G01J3/10 ,  G01J3/18 ,  G01J3/2823 ,  G01J3/2846 ,  G01J3/2889 ,  G01J3/32 ,  G01J3/42 ,  G01J3/433 ,  G01J3/457 ,  G01J2003/2866 ,  G01N21/39 ,  G01N2021/393 ,  G01N2021/6463 ,  G02B26/0833 ,  G02B26/0841 ,  G02B27/1086 ,  G02B27/126

Abstract: Encoded spatio-spectral information processing is performed using a system having a radiation source, wavelength dispersion device and two-dimensional switching array, such as digital micro-mirror array (DMA). In one aspect, spectral components from a sample are dispersed in space and modulated separately by the switching array, each element of which may operate according to a predetermined encoding pattern. The encoded spectral components can then be detected and analyzed. In a different aspect, the switching array can be used to provide a controllable radiation source for illuminating a sample with radiation patterns that have predetermined characteristics and separately encoded components. Various applications are disclosed.

Abstract translation: 使用具有辐射源，波长色散器件和二维开关阵列（例如数字微镜阵列（DMA））的系统执行编码空间光谱信息处理。 在一个方面，来自样本的频谱分量被分散在空间中，并且由开关阵列分开调制，开关阵列的每个元件可以根据预定的编码模式进行操作。 然后可以检测和分析编码的光谱分量。 在不同的方面，开关阵列可以用于提供用于利用具有预定特征的辐射图案和分开编码的部件来照射样本的可控辐射源。 公开了各种应用。

公开(公告)号：US20050007600A1

公开(公告)日：2005-01-13

申请号：US10615321

申请日：2003-07-07

Applicant: Robert Rafac

Inventor： Robert Rafac

IPC: G01J1/42 ,  G01J3/02 ,  G01J3/28 ,  G01J3/45 ,  G01B9/02

CPC classification number: G01J1/4257 ,  G01J1/0228 ,  G01J3/02 ,  G01J3/027 ,  G01J3/28 ,  G01J3/45

Abstract: A method and apparatus for measuring bandwidth of light emitted from a laser is disclosed which may comprise: a first and second wavelength sensitive optical bandwidth detectors providing, respectively, an output representative of a first parameter indicative of the bandwidth of the emitted light as measured respectively by the first and second bandwidth detectors, and an actual bandwidth calculation apparatus adapted to utilize these two outputs as part of a multivariable linear equation employing predetermined calibration variables specific to either the first or the second bandwidth detector, to calculate a first actual bandwidth parameter or a second actual bandwidth parameter. The first actual bandwidth parameter may be a spectrum full width at some percent of the maximum (“FWXM”), and the second actual bandwidth parameter may be a portion containing some percentage of the energy (“EX”). The first and second bandwidth detectors may an etalon and the outputs may be representative of a fringe width of a fringe of an optical output of the respective etalon at FWXM. The precomputed calibration variables may be derived from respective three dimensional plots representing, respectively, detector outputs in relation to a calibrating input light with known values of the first and second actual bandwidth parameters, which may be FWXM and EX. The first/second three dimensional plot may provide a solution: (first/second output)=(a/d*(calibrating input light known value of FWXM))+(b/e*(calibrating input light known value of EX)+c/f; and the actual bandwidth calculation apparatus may use the derived equation: (first actual bandwidth parameter)=((b*(second output))−(e*(first output))+ce−bf)/(bd−ae), or the equation: (second actual bandwidth parameter)=((a*(second output))−(d*(first output))+cd−af)/(ae−bd). FWXM may be FWHM and EX may be E95. The transfer function of the first optical bandwidth detector may be selected to be much more sensitive to FWXM than to EX and the transfer function of the second optical bandwidth detector may be selected to be much more sensitive to EX than to FWXM.

公开(公告)号：US20050006590A1

公开(公告)日：2005-01-13

申请号：US10909126

申请日：2004-07-30

Applicant: Dale Harrison

Inventor： Dale Harrison

IPC: G01J3/08 ,  G01J3/28 ,  G01J3/36 ,  G01J3/42 ,  G01N3/28 ,  G01N21/21 ,  G01N21/27 ,  G01N21/33 ,  G01N21/47 ,  G01N21/55 ,  G01J5/00

CPC classification number: G01J3/2803 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0232 ,  G01J3/027 ,  G01J3/0286 ,  G01J3/0291 ,  G01J3/08 ,  G01J3/10 ,  G01J3/28 ,  G01J3/2823 ,  G01J3/36 ,  G01J3/42 ,  G01J3/4531 ,  G01N21/211 ,  G01N21/274 ,  G01N21/33 ,  G01N21/47 ,  G01N21/55 ,  G01N21/9501 ,  G01N2021/335

Abstract: A spectroscopy system is provided which is optimized for operation in the VUV region and capable of performing well in the DUV-NIR region. Additionally, the system incorporates an optical module which presents selectable sources and detectors optimized for use in the VUV and DUV-NIR. As well, the optical module provides common delivery and collection optics to enable measurements in both spectral regions to be collected using similar spot properties. The module also provides a means of quickly referencing measured data so as to ensure that highly repeatable results are achieved. The module further provides a controlled environment between the VUV source, sample chamber and VUV detector which acts to limit in a repeatable manner the absorption of VUV photons. The use of broad band data sets which encompass VUV wavelengths, in addition to the DUV-NIR wavelengths enables a greater variety of materials to be meaningfully characterized. Array based detection instrumentation may be exploited to permit the simultaneous collection of larger wavelength regions.

Abstract translation: 提供了一种光谱系统，其被优化用于在VUV区域中的操作并且能够在DUV-NIR区域中表现良好。 此外，该系统还包含一个光学模块，该模块提供可用于VUV和DUV-NIR中优化的可选择的源和检测器。 同样，光学模块提供通用的传送和收集光学器件，以使得能够使用类似的光点特性来收集两个光谱区域中的测量。 该模块还提供了快速参考测量数据的方法，以确保实现高度可重复的结果。 该模块还在VUV源，样品室和VUV检测器之间提供受控的环境，其作用是以可重复的方式限制VUV光子的吸收。 除了DUV-NIR波长之外，使用包含VUV波长的宽带数据集使得可以有意义地表征更多种类的材料。 可以利用基于阵列的检测仪器来允许同时收集更大的波长区域。

公开(公告)号：US06842250B2

公开(公告)日：2005-01-11

申请号：US09736110

申请日：2000-12-13

Applicant: Peter Schwarz

Inventor： Peter Schwarz

IPC: G01J3/10 ,  G01J3/50 ,  G01J3/51 ,  G01N21/01 ,  G01N21/25 ,  G01N21/27 ,  G01N21/55 ,  G01N21/57 ,  G01N21/64 ,  G01N21/95 ,  G01N21/00

CPC classification number: G01J3/02 ,  G01J3/027 ,  G01J3/0272 ,  G01J3/0286 ,  G01J3/10 ,  G01J3/50 ,  G01J3/501 ,  G01J3/502 ,  G01J3/51 ,  G01N21/251 ,  G01N21/57

Abstract: The present invention relates to a device and a method for determining the quality of surface. An illuminating light source radiates light at a predetermined angle onto the measurement surface. An optical detecting device receives the light reflected from said measurement surface and converts same into an electrical measurement signal. A processor controls the measurement sequence and evaluates the measurement results, which are emitted via an output device. The illuminating light source comprises at least one light-emitting diode. The light emitted comprises at least blue, green and red spectral components in the visible range of the spectrum. A filter is provided in the path of radiation between the light source and the photosensor.

Abstract translation: 本发明涉及一种用于确定表面质量的装置和方法。 照明光源将预定角度的光照射到测量表面上。 光学检测装置接收从所述测量表面反射的光并将其转换成电测量信号。 处理器控制测量序列并评估通过输出设备发射的测量结果。 照明光源包括至少一个发光二极管。 所发出的光在光谱的可见范围内至少包括蓝色，绿色和红色光谱分量。 在光源和光电传感器之间的辐射路径中提供滤光器。

公开(公告)号：US20040147824A1

公开(公告)日：2004-07-29

申请号：US10757279

申请日：2004-01-13

Inventor： Mohamed Kheir Diab ,  Massi E. Kiani ,  Charles Robert Ragsdale ,  James M. Lepper JR.

IPC: A61B005/00

CPC classification number: A61B5/1495 ,  A61B5/0205 ,  A61B5/02427 ,  A61B5/14552 ,  A61B5/6826 ,  A61B5/6838 ,  A61B2562/08 ,  G01J3/02 ,  G01J3/0254 ,  G01J3/027 ,  G01J3/0275 ,  G01J3/0291 ,  G01J3/10 ,  G01J2003/2866 ,  G01N21/255 ,  G01N21/274 ,  G01N21/31 ,  G01N21/3151 ,  G01N21/39 ,  G01N2021/3144 ,  G01N2201/0627

Abstract: The method and apparatus of the present invention provides a system wherein light-emitting diodes (LEDs) can be tuned within a given range by selecting their operating drive current in order to obtain a precise wavelength. The present invention further provides a manner in which to calibrate and utilize an LED probe, such that the shift in wavelength for a known change in drive current is a known quantity. In general, the principle of wavelength shift for current drive changes for LEDs is utilized in order to allow better calibration and added flexibility in the use of LED sensors, particularly in applications when the precise wavelength is needed in order to obtain accurate measurements. The present invention also provides a system in which it is not necessary to know precise wavelengths of LEDs where precise wavelengths were needed in the past. Finally, the present invention provides a method and apparatus for determining the operating wavelength of a light emitting element such as a light emitting diode.

Abstract translation: 本发明的方法和装置提供了一种系统，其中可以通过选择它们的工作驱动电流来在给定范围内调节发光二极管（LED），以获得精确的波长。 本发明还提供了校准和利用LED探针的方式，使得驱动电流已知变化的波长偏移是已知量。 通常，利用LED的电流驱动变化的波长偏移原理，以便在使用LED传感器时更好地进行校准和增加灵活性，特别是在需要精确波长以获得准确测量的应用中。 本发明还提供一种系统，其中不需要知道过去需要精确波长的LED的精确波长。 最后，本发明提供了一种用于确定诸如发光二极管的发光元件的工作波长的方法和装置。

公开(公告)号：US06750972B2

公开(公告)日：2004-06-15

申请号：US10173190

申请日：2002-06-14

Applicant: Richard L. Sandstrom ,  John T. Melchior ,  Rajasekhar Rao

Inventor： Richard L. Sandstrom ,  John T. Melchior ,  Rajasekhar Rao

IPC: G01B902

CPC classification number: G01J3/26 ,  G01J1/4257 ,  G01J1/429 ,  G01J3/02 ,  G01J3/0205 ,  G01J3/0208 ,  G01J3/024 ,  G01J3/027 ,  G01J9/02 ,  G01J9/0246 ,  G03F7/70025 ,  G03F7/70575 ,  G03F7/70933 ,  H01S3/0057 ,  H01S3/0071 ,  H01S3/02 ,  H01S3/036 ,  H01S3/038 ,  H01S3/0385 ,  H01S3/0401 ,  H01S3/041 ,  H01S3/08009 ,  H01S3/08036 ,  H01S3/097 ,  H01S3/0971 ,  H01S3/0975 ,  H01S3/1024 ,  H01S3/104 ,  H01S3/105 ,  H01S3/1055 ,  H01S3/1305 ,  H01S3/134 ,  H01S3/139 ,  H01S3/22 ,  H01S3/2207 ,  H01S3/223 ,  H01S3/225 ,  H01S3/2251 ,  H01S3/2256 ,  H01S3/2258 ,  H01S3/2333 ,  H01S3/2366

Abstract: The present invention provides a wavemeter for an ultraviolet laser capable of long life beam quality monitoring in a pulsed ultraviolet laser system at pulse rates greater than 2000 Hz at pulse energies at 5 mJ or greater. In a preferred embodiment an enhanced illumination configuration reduces per pulse illumination of an etalon by a factor of 28 compared to a popular prior art configuration. Optics are provided in this embodiment which reduce light entering the etalon to only that amount needed to illuminate a linear photo diode array positioned to measure interference patterns produced by the etalon. In this preferred embodiment two sample beams produced by reflections from two surfaces of a beam splitter are diffused by a defractive diffuser and the output of the defractive diffuser is focused on two separate secondary diffusers effectively combining both beams in two separate spectrally equivalent diffuse beams. One beam is used for wavelength and bandwidth measurement and the other beam is used for calibration. In preferred embodiments an etalon chamber contains nitrogen with an oxygen concentration of between 1.6 and 2.4 percent.

Abstract translation: 本发明提供了一种用于紫外激光器的波长计，其能够在脉冲能量为5mJ以上的脉冲紫外激光系统中以大于2000Hz的脉冲速率进行长寿命光束质量监测。 在一个优选实施例中，与常用的现有技术配置相比，增强的照明配置将标准具的每脉冲照明降低了28倍。 在该实施例中提供光学器件，其将进入标准具的光仅仅照射照亮定位成测量由标准具产生的干涉图案的线性光电二极管阵列所需的量。 在该优选实施例中，通过来自分束器的两个表面的反射产生的两个采样光束被减光扩散器扩散，并且消光扩散器的输出聚焦在两个分开的二次扩散器上，两个分离的二次扩散器在两个分开的光谱等效漫射光束中有效地组合两个光束。 一个波束用于波长和带宽测量，另一个波束用于校准。 在优选实施例中，标准具室含有氧浓度在1.6和2.4％之间的氮。

公开(公告)号：US20030103199A1

公开(公告)日：2003-06-05

申请号：US10302512

申请日：2002-11-22

Inventor： Wayne D. Jung ,  Russell W. Jung ,  Alan R. Loudermilk

IPC: G01N021/00 ,  G01N021/25 ,  G01N021/47

CPC classification number: G01J3/02 ,  G01J3/0205 ,  G01J3/0216 ,  G01J3/0218 ,  G01J3/0229 ,  G01J3/027 ,  G01J3/0272 ,  G01J3/0278 ,  G01J3/04 ,  G01J3/508 ,  G01J3/51 ,  G01J3/513 ,  G01J2003/2866 ,  G01N21/03

Abstract: Optical characteristic measuring systems and methods such as for determining the color or other optical characteristics of an object are disclosed. Perimeter receiver fiber optics are spaced apart from a source fiber optic and receive light from the surface of the object being measured. Light from the perimeter fiber optics pass to a variety of filters. The system utilizes the perimeter receiver fiber optics to determine information regarding the height and angle of the probe with respect to the object being measured. Under processor control, the optical characteristics measurement may be made at a predetermined height and angle. Various color spectral photometer arrangements are disclosed. Translucency, fluorescence, gloss and/or surface texture data also may be obtained. Audio feedback may be provided to guide operator use of the system. The probe may have a removable or shielded tip for contamination prevention. A method of producing prostheses based on measured data also is disclosed. Measured data also may be stored and/or organized as part of a data base.

公开(公告)号：US06542239B1

公开(公告)日：2003-04-01

申请号：US09744326

申请日：2001-01-19

Applicant: Thomas Huth-Fehre ,  Frank Kowol

Inventor： Thomas Huth-Fehre ,  Frank Kowol

IPC: G01J351

CPC classification number: G01J3/28 ,  G01J3/02 ,  G01J3/027

Abstract: The invention relates to a method for testing the functionality of a spectrometer for faults comprising at least one radiation source, one filter arrangement for separating the radiation into different wavelength ranges, and one receiving arrangement. The invention also relates to a spectrometer comprising a fault recognition device. Reference values are generated at at least two different color temperatures of the radiation source and in the different wavelength ranges. Actual received signals at at least two color temperatures to be set are compared with the reference values in order to test the spectrometer. In the occurrence of variations, the type of variation is determined according to the wavelength ranges and the color temperatures, and definite faults are concluded from the type of variation.

Abstract translation: 本发明涉及一种用于测试用于故障的光谱仪的功能性的方法，包括至少一个辐射源，用于将辐射分离成不同波长范围的一个滤波器装置和一个接收装置。 本发明还涉及一种包括故障识别装置的光谱仪。 参考值在辐射源的至少两个不同色温和不同波长范围内产生。 将要设置的至少两个色温的实际接收信号与参考值进行比较，以便测试光谱仪。 在变化的发生中，根据波长范围和色温来确定变化的类型，根据变化的类型确定确定的缺陷。

公开(公告)号：US06472657B1

公开(公告)日：2002-10-29

申请号：US09594663

申请日：2000-06-15

Applicant: Paul C. Miles ,  Eldon L. Porter ,  Thomas L. Prast ,  Duane A. Sunnarborg

Inventor： Paul C. Miles ,  Eldon L. Porter ,  Thomas L. Prast ,  Duane A. Sunnarborg

IPC: G01D534

CPC classification number: G01J3/02 ,  G01J3/0232 ,  G01J3/027

Abstract: A fast mechanical shutter, based on rotating chopper wheels, has been designed and implemented to shutter the entrance slit of a spectrograph. This device enables an exposure time of 9 &mgr;s to be achieved for a 0.8 mm wide spectrograph entrance slit, achieves 100% transmission in the open state, and an essentially infinite extinction ratio. The device further incorporates chopper wheel position sensing electronics to permit the synchronous triggering of a laser source.

Abstract translation: 基于旋转斩波轮的快速机械快门已经被设计和实现，以便遮蔽光谱仪的入口狭缝。 该装置能够实现0.8mm宽的光谱仪入口狭缝的曝光时间为9μs，在打开状态下实现100％透射，并且基本上具有无限大的消光比。 该装置还包括切割轮位置检测电子器件，以允许激光源的同步触发。

公开(公告)号：US20020107666A1

公开(公告)日：2002-08-08

申请号：US10029796

申请日：2001-12-31

Applicant: SHIMADZU CORPORATION

Inventor： Koki Tanaka ,  Koichi Yamamoto ,  Haruhiiko Miyagawa

IPC: G06F015/00

CPC classification number: G01J3/02 ,  G01J3/027 ,  G01J3/28

Abstract: In a maintenance system for an analyzing instrument, a maintenance department remotely operates a first computer by a second computer to execute an initial inspection and a basic function inspection of the instrument. Then, an abnormality contained in the result information for every executed inspection is specified, and optimum maintenance information for solving the specified abnormality is searched in a server and extracted. Thereafter, the extracted maintenance information is sent to the first computer in the user side. Namely, an operator at the user side is only required to deal with the maintenance of the instrument in accordance with the maintenance information sent from the maintenance department.

Abstract translation: 在分析仪器的维护系统中，维护部门由第二计算机远程操作第一计算机，以执行仪器的初始检查和基本功能检查。 然后，指定每次执行检查的结果信息中包含的异常，并且在服务器中搜索用于求解指定异常的最佳维护信息并提取。 此后，提取的维护信息被发送到用户侧的第一计算机。 也就是说，用户侧的操作者仅需要根据维护部门发送的维护信息处理仪器的维护。