Abstract:
This description discloses a circuit board for a power amplifier that is able to keep a low temperature. In an example embodiment, the circuit board includes: an input board on its substrate, an output board on its substrate, and a power amplifier transistor acting as a bridge to connect the input board and the output board with each other. The substrate of the input board is made from a first kind of material, and the substrate of the output board is made from a second kind of material. The second kind of material has different performance (e.g., relatively better performance for both RF and heat dissipation) than that of the first kind of material. Moreover, this description discloses a power amplifier on the circuit board, a dual radio unit board having such a power amplifier, and a radio base station having such a dual radio unit board.
Abstract:
A system in some embodiments includes a system having a memory module having a first board comprising a first plurality of memory receptacles configured to support a first plurality of in-line memory modules in an overlapping relationship with a second plurality of in-line memory modules disposed on a second board. Further, a method in some embodiments includes rotating first and second memory boards into a parallel configuration via a hinge coupling the first and second memory boards, and inserting the first and second memory boards into first and second board connectors simultaneously.
Abstract:
At least an embodiment of the present technology provides a method of manufacturing a mechanically adapting interconnecting device for multi-substrate packages comprising placing a metal laminate on each side of a polymer composite, forming a channel in the metal laminate; and metallizing the laminate to create a metal connection inside the channel.
Abstract:
A testing substrate comprises internal circuitry connected to external contacts by wiring and meltable conductors are connected to the external contacts of the testing substrate. An interposer having substrate contacts on a first side is connected to the meltable conductors. The interposer is maintained apart from the testing substrate by the meltable conductors. The interposer comprises chip contacts on a second side opposite the first side. The chip contacts are adapted to temporarily connect to an integrated circuit chip being tested and burned-in. The chip contacts can have a different spacing than the substrate contacts. The interposer also includes conductive vias running from the first side to the second side and directly connecting the substrate contacts to the chip contacts.
Abstract:
An electronic product includes a circuit board, an integrated system on module, and an application-specific module. The integrated system on module and the application-specific module are integrated with the circuit board. A method of forming the circuit board is disclosed, as well as a method of forming the electronic product.
Abstract:
A multi-channel memory connection system comprises a circuit board comprising a plurality of memory connectors, at least one of the plurality of memory connectors configured to receive either a memory module or a memory riser, the at least one memory connector having at least two memory channels connected thereto through the circuit board.
Abstract:
A stack-type semiconductor package socket may include: a first package connection portion for connection with leads of a lowermost package of a stack-type semiconductor package; a second package connection portion for connection between pads of an odd-numbered package and leads of an even-numbered package, wherein the odd-numbered package and the even-numbered package are adjacent to each other; a lower case for fixing the first package connection portion; and an upper case for fixing the second package connection portion. A stack-type semiconductor package test system may include: a stack-type semiconductor package socket that includes first and second package connection portions; a printed circuit board electrically connected to leads of the lowermost package through the first package connection portion; and a test controller for receiving, outputting, or receiving and outputting signals from, to, or from and to the stack-type semiconductor package through the PCB and the stack-type semiconductor package socket.
Abstract:
In one exemplary embodiment, a system for supplying electrical connectivity to one or more circuit board based devices includes a backplane and at least one module. The backplane includes a mounting surface having a plurality of modular power connectors. The at least one module includes an interface portion, a power connection portion, and a circuit board. The power connection portion is configured to connect with the corresponding one of the plurality of modular power connectors. The circuit board includes a plurality of power-related electrical contacts and a plurality of data-related electrical contacts. At least one of the plurality of power-related electrical contacts is connected with the power connection portion, and at least one of the plurality of data-related electrical contacts is connected with the interface portion. The backplane is configured to connect with a power supply, such that the power supply supplies power to the at least one module through one of the modular power connectors when the at least one module is connected with the corresponding modular power connector.
Abstract:
A method and apparatus for fabricating a three dimensional array of semiconductor chips is disclosed. The method uses a multiple step fabrication process that automates the surface mounting of semiconductor chips with unique chip carriers to achieve the three dimensional array of chips. The method can include the steps of depositing solder on one or more chip modules, placing and interconnecting low-cost components on the chip modules, and storing the preprocessed chip modules in pallets or in a tape and reel. Later these chip carriers may then be mounted on a circuit board, possibly over; for example, low and/or high cost components and then populated with low and/or high cost components. The apparatus includes a unique stackable chip module pallet and print fixture pedestal.
Abstract:
A multichip assembly includes semiconductor devices or semiconductor device components with outer connectors on peripheral edges thereof. The outer connectors are formed by creating via holes along boundary lines between adjacent, unsevered semiconductor devices, or semiconductor device components, then plating or filling the holes with conductive material. When adjacent semiconductor devices or semiconductor device components are severed from one another, the conductive material in each via between the semiconductor devices is bisected. The semiconductor devices and components of the multichip assembly may have different sizes, as well as arrays of outer connectors with differing diameters and pitches. Either or both ends of each outer connector may be electrically connected to another aligned outer connector or contact area of another semiconductor device or component. Assembly in this manner provides a low-profile stacked assembly.