Abstract:
A imaging method is described that includes: obtaining a spectral weighting function indicative of an attribute of the reference sample; illuminating a target sample with light whose spectral flux distribution corresponds to the spectral weighting function to produce a corresponding target image, wherein the target image is indicative of a response of the target sample to the corresponding illumination at multiple spatial locations of the target sample; and identifying one or more target features in the target sample based on the target image.
Abstract:
A multispectral imaging system (1) and method utilize an optical processor (3) for simultaneously comparing an input wavelength spectrum observed in a single spatial pixel in a scene image from a multispectral imager (2) with a plurality of template wavelength spectra to find a correlation. The optical processor exploits the three-dimensional attributes of optical correlation to perform massively parallel correlation processing by modulating (4) respective ones of a plurality of spectral bands of the input wavelength spectrum of an incident light beam (6) with modulating elements (5) to alter at least one property of the incident light beam by a value corresponding to the observed intensity of the input spectrum in the respective spectral band. In a disclosed embodiment, the modulated beam is expanded and transited through a spatial light modulator (7) having a two-dimensional array of modulating elements. Each row of the elements of the array alter the at least one property of the incident light by values corresponding to a particular template wavelength spectrum of a plurality of template wavelength spectra of the modulator. The values corresponding to each template spectrum are the conjugates of the representative values of the modulating elements of the template spectrum of the plurality of template spectra.
Abstract:
Disclosed is a spectrometer system with unique wavelength resolution improving relative positioning of diffraction grating and detector. Also disclosed is a modified evolving windowed factor analysis based method of detecting semiconductor etch end points which is particularly well suited for use in real time monitoring and process control. Use of wavelength group selecting mask filters is also disclosed.
Abstract:
An ellipsometer, and a method of ellipsometry, for analyzing a sample using a broad range of wavelengths, includes a light source for generating a beam of polychromatic light having a range of wavelengths of light for interacting with the sample. A polarizer polarizes the light beam before the light beam interacts with the sample. A rotating compensator induces phase retardations of a polarization state of the light beam wherein the range of wavelengths and the compensator are selected such that at least a first phase retardation value is induced that is within a primary range of effective retardations of substantially 135null to 225null, and at least a second phase retardation value is induced that is outside of the primary range. An analyzer interacts with the light beam after the light beam interacts with the sample. A detector measures the intensity of light after interacting with the analyzer as a function of compensator angle and of wavelength, preferably at all wavelengths simultaneously. A processor determines the polarization state of the beam as it impinges the analyzer from the light intensities measured by the detector.
Abstract:
A disc serving as a spatial radiation modulator has dispersed radiation filters thereon. Each filter has a transmittance or reflectance modulation function of the form sin2(m&thgr;+p&pgr;/4), where m is a positive integer and p has one of the four values 0, 1, 2, 3. A radiation beam including selected wavelength components is diffracted into an elongated image dispersed according to wavelength. Different wavelength components are focused onto different filters on the modulator and are encoded by correspond filters. Since the modulation functions of the filters are orthogonal to one another, it is possible to extract the amplitude of each wavelength component after it has been encoded or modulated by corresponding filter from the total detected signal during one measurement.
Abstract translation:用作空间辐射调制器的盘在其上具有分散的辐射滤波器。 每个滤波器具有形式为sin2(mtata + ppi / 4)的透射率或反射率调制函数,其中m是正整数,p具有四个值0,1,2,3中的一个。包括选择的波长分量 衍射成根据波长分散的细长图像。 不同的波长分量聚焦在调制器上的不同滤波器上,并由相应的滤波器编码。 由于滤波器的调制功能彼此正交,因此可以在一次测量期间从总检测信号对相应的滤波器进行编码或调制之后提取每个波长分量的振幅。
Abstract:
A curved mirrored surface is used to collect radiation scattered by a sample surface and originating from a normal illumination beam and an oblique illumination beam. The collected radiation is focused to a detector. Scattered radiation originating from the normal and oblique illumination beams may be distinguished by employing radiation at two different wavelengths, by intentionally introducing an offset between the spots illuminated by the two beams or by switching the normal and oblique illumination beams on and off alternately. Beam position error caused by change in sample height may be corrected by detecting specular reflection of an oblique illumination beam and changing the direction of illumination in response thereto. Butterfly-shaped spatial filters may be used in conjunction with curved mirror radiation collectors to restrict detection to certain azimuthal angles.
Abstract:
The present invention relates to a double pass monochromator that improves wavelength resolution and reduces the actual length thereof. A return reflection means 7 that reverses the direction of dispersion of the wavelength of the second pass light 1c, 1f emitted and incident on a diffraction grating 4 during the reflection. In addition, the angles of the incident and emitted light during separation of spectral components by the diffraction grating are identical during the first and second diffraction.
Abstract:
A spectrometer having a source of broad band infrared energy, a relay mirror that focuses the infrared energy at an intercepting mirror, a first object mirror that collimates the infrared energy from the intercepting mirror, a spatial light modulator that receives the collimated infrared energy and reflects it back to the first object mirror, the spatial light modulator including deformable mirror elements, and a controller that deforms the mirror elements according to a predetermined pattern. Deformable mirror elements obtain needed spectra while reducing the mechanical complexity of the spectrometer.
Abstract:
An optical pathway of a scanning spectral radiometer for a continuous monitoring of spectral radiation employs a diffuser having an upper source directed surface and a lower sensor directed surface for diffusing radiation incident on the upper surface and transmitting the diffused radiation. An occulting ring laterally surrounds the diffuser. A filter receives the diffused radiation from the light diffuser and passes a predetermined wavelength range. A photodetector is positioned to receive the filtered radiation. The photodetector is positioned at one end of an optical path, with a diffuser being positioned at the other end of the optical path. A collimator is provided between the diffuser and the photodetector, with the optical path extending through the collimator.
Abstract:
The present invention provides a simple, low-cost color classification apparatus having a high resistance to mechanical vibrations and capable of properly performing color classification even if a light source is not specified and its spectrum changes. A color classification apparatus of the present invention is further including an image pickup means for picking up a spectrum of light reflected by a target object, a plurality of bandpass filters having different bands and arranged between the target object and the image pickup means, and a classifying means for calculating a classification spectrum for classification using a statistic technique from a spectrum of light reflected by the target object and picked up by the image pickup means, and classifying the target object using the classification spectrum.