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    Method for Operating an Ion Gate, Device Having an Ion Transport Region, and Computer Program
    11.
    发明申请
    Method for Operating an Ion Gate, Device Having an Ion Transport Region, and Computer Program 审中-公开

    公开(公告)号：US20180224401A1

    公开(公告)日：2018-08-09

    申请号：US15749938

    申请日：2016-08-02

    Applicant: Gottfried Wilhelm Leibniz Universitaet Hannover

    Inventor： Stefan Zimmermann ,  Ansgar Kirk

    IPC: G01N27/62 ,  H01J49/00 ,  H01J49/06 ,  H01J49/10

    CPC classification number: G01N27/622 ,  H01J49/0027 ,  H01J49/061 ,  H01J49/10

    Abstract: The invention relates to a method for operating an ion gate having at least a first, a second, and a third electrode, which are arranged one after the other in an intended drifting direction of ions to be influenced by the ion gate, in such a way that the second electrode is arranged after the first electrode and the third electrode is arranged after the second electrode in the drifting direction, wherein the ion gate can be switched between a closed state, in which ions cannot drift through the ion gate in the intended drifting direction, and an open state, in which ions can drift through the ion gate in the intended drifting direction, by applying potentials that alternate over time to one or more of the electrodes mentioned above, wherein, in a switching cycle of the ion gate, which comprises the open state and the closed state of the ion gate, two different closed states of the ion gate are produced in that, in a first closed state, the ion gate is closed by applying a first potential difference between the second and the third electrodes and, in a second closed state, the ion gate is closed by applying a second potential difference between the first and the second electrodes. The invention further relates to a device having an ion transport region and a computer program for performing the method.

    Analyser arrangement for particle spectrometer
    12.
    发明授权
    Analyser arrangement for particle spectrometer 有权

    公开(公告)号：US09978579B2

    公开(公告)日：2018-05-22

    申请号：US15221340

    申请日：2016-07-27

    Applicant: SCIENTA OMICRON AB

    Inventor： Björn Wannberg

    IPC: H01J49/48 ,  H01J37/05 ,  H01J49/00 ,  H01J49/06 ,  G01N23/227

    CPC classification number: H01J49/48 ,  G01N23/2273 ,  G01N2223/085 ,  H01J37/05 ,  H01J49/0031 ,  H01J49/06 ,  H01J49/061 ,  H01J49/484 ,  H01J2237/0535

    Abstract: The present invention relates to a method for determining at least one parameter related to charged particles emitted from a particle emitting sample, e.g. a parameter related to the energies, the start directions, the start positions or the spin of the particles. The method comprises the steps of guiding a beam of charged particles into an entrance of a measurement region by means of a lens system, and detecting positions of the particles indicative of said at least one parameter within the measurement region. Furthermore, the method comprises the steps of deflecting the particle beam at least twice in the same coordinate direction before entrance of the particle beam into the measurement region. Thereby, both the position and the direction of the particle beam at the entrance of the measurement region can be controlled in a way that to some extent eliminates the need for physical manipulation of the sample. This in turn allows the sample to be efficiently cooled such that the energy resolution in energy measurements can be improved.

    Systems and methods for coupling a laser beam to a mass spectrometer
    16.
    发明授权
    Systems and methods for coupling a laser beam to a mass spectrometer 有权

    公开(公告)号：US09892903B1

    公开(公告)日：2018-02-13

    申请号：US15389377

    申请日：2016-12-22

    Applicant: Thermo Finnigan LLC

    Inventor： Jesse D. Canterbury

    IPC: H01J49/00 ,  H01J49/42 ,  H01J49/06

    CPC classification number: H01J49/427 ,  H01J49/0059 ,  H01J49/061

    Abstract: A mass spectrometry system includes a laser source, a trapping volume, first and second beam deflectors, and a deflector controller. The first and second beam deflectors are arranged on a path from the laser source to the trapping volume. The first beam deflector is configured to oscillate in a first direction at a first frequency and the second beam deflector configured to oscillate in a second direction orthogonal to the first direction at a second frequency. The deflector controller is configured to scan a scanned area within the trapping volume with the laser by controlling the oscillation of the first and second beam deflectors to cause ions trapped within the trapping volume to fragment into fragment ions. The scanned area has a first dimension defined by the oscillation in first direction and a second dimension defined by the oscillation in the second direction.

    NETWORKING MASS ANALYSIS METHOD AND DEVICE
    18.
    发明申请
    NETWORKING MASS ANALYSIS METHOD AND DEVICE 审中-公开

    公开(公告)号：US20170271137A1

    公开(公告)日：2017-09-21

    申请号：US15308443

    申请日：2016-03-23

    Applicant: National Institute of Metrology, China

    Inventor： You JIANG ,  Xiang FANG ,  Xingchuang XIONG ,  Zejian HUANG

    IPC: H01J49/04 ,  H01J49/06 ,  H01J49/40 ,  H01J49/00

    CPC classification number: H01J49/0404 ,  H01J49/0031 ,  H01J49/009 ,  H01J49/061 ,  H01J49/40

    Abstract: The invention discloses a networking mass analysis method and device, and belongs to the field of mass spectrometer and ion mass analysis. The device comprises an ion source, an ion transporter, an ion deflector and multiple mass analyzers, wherein the ion transporter is connected with one of the multiple mass analyzers, the multiple mass analyzers are connected with the ion deflector respectively, the ion source produces the ions to be detected, the ions to be detected enter any of the mass analyzers connected with the ion deflector via the ion transporter for mass analysis, and the remaining ions to be detected are transported to the corresponding mass analyzers via the ion deflector for mass analysis. The invention can improve the mass analysis duty ratio of continuous ion sources and obtain more mass-to-charge ratio information of ion beams within each time slot.

    Ion Entry/Exit Device
    19.
    发明申请
    Ion Entry/Exit Device 有权

    公开(公告)号：US20170125229A1

    公开(公告)日：2017-05-04

    申请号：US15303433

    申请日：2015-04-13

    Applicant: MICROMASS UK LIMITED

    Inventor： Kevin GILES ,  David J. LANGRIDGE ,  Jason Lee WILDGOOSE

    IPC: H01J49/06 ,  G01N27/62 ,  H01J49/00

    CPC classification number: H01J49/061 ,  G01N27/622 ,  H01J49/0031 ,  H01J49/408

    Abstract: A method of introducing and ejecting ions from an ion entry/exit device (4) is disclosed. The ion entry/exit device (4) has at least two arrays of electrodes (20,22). The device is operated in a first mode wherein DC potentials are successively applied to successive electrodes of at least one of the electrode arrays ((20,22) in a first direction such that a potential barrier moves along the at least one array in the first direction and drives ions into and/or out of the device in the first direction. The device is also operated in a second mode, wherein DC potentials are successively applied to successive electrodes of at least one of the electrode arrays (20,22) in a second, different direction such that a potential barrier moves along the array in the second direction and drives ions into and/or out of the device in the second direction. The device provides a single, relatively simple device for manipulating ions in multiple directions. For example, the device may be used to load ions into or eject ions from an ion mobility separator in a first direction, and may then be used to cause ions to move through the ion mobility separator in the second direction so as to cause the ions to separate.

    Systems and methods for identifying precursor ions from product ions using arbitrary transmission windowing
    20.
    发明授权
    Systems and methods for identifying precursor ions from product ions using arbitrary transmission windowing 有权
    使用任意透射窗口从产物离子中鉴定前体离子的系统和方法

    公开(公告)号：US09472387B2

    公开(公告)日：2016-10-18

    申请号：US15089529

    申请日：2016-04-02

    Applicant: DH Technologies Development Pte. Ltd.

    Inventor： Nic G. Bloomfield ,  Frank Londry

    IPC: H01J49/00 ,  H01J49/06

    CPC classification number: H01J49/0036 ,  H01J49/0027 ,  H01J49/004 ,  H01J49/061 ,  H01J49/40 ,  H01J49/4215 ,  H01J49/427

    Abstract: Ions are separated from a sample over time and filtered. The precursor ions produced at each step are fragmented. Resulting product ions are analyzed using a mass analyzer, producing a product ion spectrum for each step of the transmission window and a plurality of product ion spectra for the mass range for the each scan. The plurality of product ion spectra are received, producing a plurality of multi-scan product ion spectra. At least one product ion is selected from the plurality of multi-scan product ion spectra that is present at least two or more times in product ion spectra from each of two or more scans. A known separation profile of a precursor ion is fit to intensities from the at least one product ion in the plurality of multi-scan product ion spectra to reconstruct a separation profile of a precursor ion of the at least one product ion.

    Abstract translation: 离子与样品随时间分离并过滤。 在每个步骤产生的前体离子是碎裂的。 使用质量分析仪分析所得产物离子，产生用于传输窗口的每个步骤的产物离子谱和用于每次扫描的质量范围的多个产物离子光谱。 接收多个产物离子光谱，产生多个多扫描产物离子光谱。 从多个多扫描产物离子光谱中选择至少一个产物离子，所述离子谱在两次或更多次扫描中的每一次的产物离子谱中至少存在两次或更多次。 前体离子的已知分离曲线适合于多个多扫描产物离子光谱中的至少一种产物离子的强度，以重建至少一种产物离子的前体离子的分离曲线。

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