公开(公告)号：US08017912B1

公开(公告)日：2011-09-13

申请号：US11796928

申请日：2007-04-30

Applicant: Richard J. Nelson

Inventor： Richard J. Nelson

IPC: G01J5/02 ,  G01K11/30

CPC classification number: G01J3/28 ,  G01J2001/4247 ,  G01N21/3504 ,  G01N2021/1793 ,  G01N2021/3188 ,  G01N2021/3531

Abstract: A method of classifying an electromagnetic-energy emitting source event as one of a first, second, and third class event includes registering an irradiance spectrum from the source event. The intensity of the energy emitted from the source event is measured within each of first, second and third energy sub-ranges and first, second and third relative-energy values are associated with, respectively, the first, second and third energy sub-ranges. A first class-eliminating determination is rendered by comparing to one another a first selected set of two of the relative-energy values, thereby yielding two remaining-candidate event classes. When necessary, a second class-eliminating determination renders the proper classification for the source event by comparing to one another a second selected set of relative-energy values including the relative-energy value not selected for inclusion in the first selected set of two relative-energy values and one of the previously selected relative-energy values. The energy-value comparisons are carried out with reference to modeled source-event irradiance data from which expected ratio behaviors among the selected energy sub-ranges are ascertainable relative particular event types at various ranges and under disparate atmospheric conditions.

Abstract translation: 将电磁能发射源事件分类为第一，第二和第三类事件之一的方法包括从源事件登记辐照度谱。 在源事件中发射的能量的强度在第一，第二和第三能量子范围内的每一个中被测量，并且第一，第二和第三相对能量值分别与第一，第二和第三能量子范围相关联 。 通过彼此比较相对能量值中的两个相对能量值的第一选择集合来呈现第一类别消除确定，从而产生两个剩余候选事件类别。 必要时，第二类别消除确定通过彼此比较第二选择的相对能量集合来呈现源事件的适当分类，所述第二选择的一组相对能量值包括未被选择以包括在第二选定组的两个相对能量值中的相对能量值， 能量值和先前选择的相对能量值之一。 能量值比较是参考建模的源事件辐照度数据进行的，从而可以在各种范围和不同的大气条件下确定所选能量子范围内的预期比例行为相对特定事件类型。

公开(公告)号：US20110188714A1

公开(公告)日：2011-08-04

申请号：US12850202

申请日：2010-08-04

Applicant: Charles W. Gardner, JR. ,  David Exline ,  Sara Nedley

Inventor： Charles W. Gardner, JR. ,  David Exline ,  Sara Nedley

IPC: G06K9/00

CPC classification number: G06K9/00442 ,  G01J3/02 ,  G01J3/0248 ,  G01J3/10 ,  G01J3/28 ,  G01J3/32 ,  G01N21/27 ,  G01N21/4738 ,  G01N21/55 ,  G01N21/6456 ,  G01N2021/6423 ,  G01N2021/6493 ,  G06K9/4652

Abstract: The present disclosure provides for a method for analyzing treated fingerprints on a document. A sample document is provided. A digital image of the sample document is obtained. The sample document is treated with a reagent and a hyperspectral image of the document is obtained. The hyperspectral image of the document is analyzed to determine a region of interest and a hyperspectal image is obtained of the region of interest. The present disclosure also provides for a system comprising a carrier frame, an imaging station for obtaining a digital image of the sample document, a first processing station for treating the document and a second processing station for developing the treated document, a second imaging station for obtaining a hyperspectral image of at least one of the document and a region of interest of the document, and a robotic subsystem for transporting the document through the system.

Abstract translation: 本公开提供了一种用于分析文档上经处理的指纹的方法。 提供样品文件。 获得样品文件的数字图像。 样品文件用试剂处理，得到文件的高光谱图像。 分析文档的高光谱图像以确定感兴趣的区域，并且获得感兴趣区域的超光谱图像。 本公开还提供了一种系统，其包括载体框架，用于获得样本文档的数字图像的成像站，用于处理文件的第一处理站和用于开发经处理的文档的第二处理站，用于 获得文档中的至少一个文档和感兴趣区域的超光谱图像，以及用于通过系统传送文档的机器人子系统。

公开(公告)号：US07990538B2

公开(公告)日：2011-08-02

申请号：US12447595

申请日：2007-11-01

Applicant: Michael L. Myrick ,  Robert P. Freese ,  William Soltmann ,  David L. Perkins

Inventor： Michael L. Myrick ,  Robert P. Freese ,  William Soltmann ,  David L. Perkins

IPC: G01N31/12

CPC classification number: G01J3/02 ,  G01J3/021 ,  G01J3/0229 ,  G01J3/0232 ,  G01J3/0235 ,  G01J3/0243 ,  G01J3/0286 ,  G01J3/08 ,  G01J3/28 ,  G01J3/42 ,  G01J2003/1213 ,  G01N2201/1293

Abstract: The present subject matter relates to methods of high-speed analysis of product samples during production of the product. Light is directed to a portion of a product under analysis and reflected from or transmitted through the product toward optical detectors. Signals from the optical detectors are compared to determine characteristics of the product under analysis. Temperature within the monitoring system may be monitored in order to provide compensation for the signals produced by the optical detectors. The products under analysis may be stationary, moved by an inspection point by conveyor or other means, or may be contained within a container, the container including a window portion through which the product illuminating light may pass.

Abstract translation: 本主题涉及产品生产过程中产品样品的高速分析方法。 光被引导到被分析产品的一部分，从产品反射或透射到光学检测器。 将来自光学检测器的信号进行比较，以确定正在分析的产品的特性。 可以监视监视系统内的温度，以便为由光学检测器产生的信号提供补偿。 被分析的产品可以是固定的，由检查点通过输送机或其他方式移动，或者可以容纳在容器内，该容器包括产品照明光通过的窗口部分。

公开(公告)号：US07990532B2

公开(公告)日：2011-08-02

申请号：US12718362

申请日：2010-03-05

Applicant: Jason Neiss ,  Patrick Treado ,  Robert C. Schweitzer

Inventor： Jason Neiss ,  Patrick Treado ,  Robert C. Schweitzer

IPC: G01J3/44

CPC classification number: G01J3/28

Abstract: System and method for assessing the occurrence of an unknown substance in a sample that comprises multiple entities. A reference library is provided comprising a plurality of reference data sets representative of at least one known substance. A first feature of the entities is assessed wherein the first feature is characteristic of the unknown substance. A region of interest is selected wherein the region of interest comprises at least one entity exhibiting the first feature. A spatially accurate wavelength resolved Raman image is obtained wherein each pixel in the image is the Raman spectrum of the sample at the corresponding location. The spatially accurate wavelength resolved image is assessed to thereby identify the unknown substance.

Abstract translation: 用于评估包含多个实体的样品中未知物质的发生的系统和方法。 提供了包括代表至少一种已知物质的多个参考数据集的参考文库。 评估实体的第一特征，其中第一特征是未知物质的特征。 选择感兴趣区域，其中感兴趣区域包括展示第一特征的至少一个实体。 获得空间精确的波长分辨拉曼图像，其中图像中的每个像素是相应位置处样品的拉曼光谱。 评估空间上准确的波长分辨图像，从而识别未知物质。

公开(公告)号：US07940377B1

公开(公告)日：2011-05-10

申请号：US12329031

申请日：2008-12-05

Applicant: Randal L. Schmitt ,  Philip J. Hargis, Jr.

Inventor： Randal L. Schmitt ,  Philip J. Hargis, Jr.

IPC: G01C3/08

CPC classification number: G01S7/4811 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/027 ,  G01J3/28 ,  G01J3/2823 ,  G01J3/44 ,  G01N21/6402 ,  G01N21/65 ,  G01N2021/1793 ,  G01N2021/4709 ,  G01S7/48 ,  G01S17/89

Abstract: A method for passive background correction during spatially or angularly resolved detection of emission that is based on the simultaneous acquisition of both the passive background spectrum and the spectrum of the target of interest.

Abstract translation: 在空间或角度分辨的发射检测中的被动背景校正方法，其基于被动背景光谱和感兴趣目标的频谱的同时采集。

公开(公告)号：US07928392B1

公开(公告)日：2011-04-19

申请号：US12575184

申请日：2009-10-07

Applicant: Abdorreza Heidari

Inventor： Abdorreza Heidari

IPC: G01N21/17

CPC classification number: G01J3/42 ,  G01J3/28 ,  G01N21/3581

Abstract: System and method for blind echo cancellation in a received terahertz signal in a pulsed terahertz system for imaging or spectroscopy. Blind signal processing methods estimate the impulse response of the reflection mechanism and do not require a reference measurement to be taken. The reference signal may be recovered using a successive approach wherein the reference is first estimated using cross-correlation with the received signal and the received signal is represented as a function of the reference signal. For each successive echo, the calculated echo may be subtracted from the received signal and then the estimate of the reference signal is refined. Using an analytical approach, the parameters of a transfer function modeling the reflection mechanism may be estimated by optimizing a cost function.

Abstract translation: 用于成像或光谱学的脉冲太赫兹系统中接收的太赫兹信号中盲目回波消除的系统和方法。 盲信号处理方法估计反射机制的脉冲响应，不需要进行参考测量。 可以使用连续方法来恢复参考信号，其中首先使用与接收信号的互相关来估计参考，并且接收的信号被表示为参考信号的函数。 对于每个连续回波，可以从接收到的信号中减去计算出的回波，然后对参考信号的估计进行细化。 使用分析方法，可以通过优化成本函数来估计对反射机制建模的传递函数的参数。

公开(公告)号：US07924422B2

公开(公告)日：2011-04-12

申请号：US12369947

申请日：2009-02-12

Applicant: Fred Stanke ,  Adam Norton ,  Holger Tuitje

Inventor： Fred Stanke ,  Adam Norton ,  Holger Tuitje

IPC: G01J3/28

CPC classification number: G01J3/02 ,  G01B2210/56 ,  G01J3/0205 ,  G01J3/0224 ,  G01J3/0297 ,  G01J3/28 ,  G01J3/2803 ,  G01J2003/1828 ,  G01N21/274

Abstract: A zoned order sorting filter for a spectrometer in a semiconductor metrology system is disclosed with reduced light dispersion at the zone joints. The order sorting filter comprises optically-transparent layers deposited underneath, or on top of thin-film filter stacks of the order sorting filter zones, wherein the thicknesses of the optically-transparent layers are adjusted such that the total optical lengths traversed by light at a zone joint are substantially equal in zones adjacent the zone joint. A method for wavelength to detector array pixel location calibration of spectrometers is also disclosed, capable of accurately representing the highly localized nonlinearities of the calibration curve in the vicinity of zone joints of an order sorting filter.

Abstract translation: 公开了一种用于半导体测量系统中的光谱仪的分区排序分选过滤器，其中在区域关节处的光散射减小。 订单分选过滤器包括沉积在下面的光学透明层，或者在分级过滤器区域的薄膜过滤器堆叠的顶部，其中调整光学透明层的厚度，使得在光 区域接头在邻近区域接头的区域中基本相等。 还公开了一种用于波长到检测器阵列像素位置校准的光谱仪的方法，其能够精确地表示在订单分选滤波器的区域接头附近的校准曲线的高度局部化的非线性。

公开(公告)号：US07911606B2

公开(公告)日：2011-03-22

申请号：US11814051

申请日：2005-11-04

Applicant: Heinz-Gerd Joosten

Inventor： Heinz-Gerd Joosten

IPC: G01J3/30

CPC classification number: G01J3/28 ,  G01J3/20 ,  G01J3/443 ,  G01N21/67

Abstract: The invention relates to a method for the spectral analysis of metal samples with the following steps: a. Recording of a spectrum of an unknown sample with a number of preset excitation parameters, b. Comparison of the spectrum with stored spectra of a number of control samples, c. Determination of the control sample with the best concordance of spectra, d. Setting of the excitation parameters, which are stored for the best and closest control sample determined in step c, e. Recording of the spectrum of the unknown sample with the excitation parameters set in step d, f. Calculation of the intensity ratios of the analysis lines stored for the control sample and the internal standards of the spectrum recorded in step e.

Abstract translation: 本发明涉及金属样品的光谱分析方法，具体步骤如下：a。 用多个预设的激励参数记录未知样品的光谱，b。 将光谱与多个对照样品的储存光谱进行比较，c。 用最好的光谱一致性测定对照样品，d。 为在步骤c中确定的最佳和最接近的对照样品存储的激发参数的设定， 用步骤d，f中设定的激发参数记录未知样品的光谱。 计算存储在对照样品中的分析线和步骤e记录的光谱的内部标准的强度比。

公开(公告)号：US20110063614A1

公开(公告)日：2011-03-17

申请号：US12812853

申请日：2009-01-19

Applicant: Daniel Van Niewenhove ,  Ward Van Der Tempel ,  Maarten Kuijk

Inventor： Daniel Van Niewenhove ,  Ward Van Der Tempel ,  Maarten Kuijk

IPC: G01J3/28

CPC classification number: G01J3/00 ,  G01J3/28 ,  H01L27/14643 ,  H01L31/1013

Abstract: Impinging electromagnetic radiation generates pairs of majority and minority carriers in a substrate. A spectrometer device for detection of electromagnetic radiation impinging on a substrate comprises means for generating, in the substrate, a majority carrier current; at least one detection region for collecting generated minority carriers, the minority carriers being directed under influence of the majority carrier current; and means for determining spectral information based on minority carriers collected at the at least one detection region.

Abstract translation: 发射电磁辐射在衬底中产生成对的多数和少数载流子。 用于检测照射在衬底上的电磁辐射的光谱仪装置包括用于在衬底中产生多数载流子电流的装置; 用于收集所生成的少数载体的至少一个检测区域，所述少数载体受多数载波电流的影响; 以及用于基于在所述至少一个检测区域收集的少数载波来确定频谱信息的装置。

公开(公告)号：US07881892B2

公开(公告)日：2011-02-01

申请号：US11337912

申请日：2006-01-23

Applicant: Olusola O. Soyemi ,  Babs R. Soller

Inventor： Olusola O. Soyemi ,  Babs R. Soller

IPC: G06F19/00 ,  G01D18/00 ,  G01J3/28

CPC classification number: A61B5/0059 ,  A61B5/14532 ,  A61B5/14551 ,  A61B5/1495 ,  G01J3/02 ,  G01J3/0218 ,  G01J3/0232 ,  G01J3/0264 ,  G01J3/0272 ,  G01J3/0278 ,  G01J3/10 ,  G01J3/28 ,  G01J2003/2866 ,  G01N21/274 ,  G01N21/31

Abstract: The invention relates to systems and methods for measuring properties of samples with standardized spectroscopic systems. The methods can include (i) measuring, with a first spectroscopic system, spectra of at least three different reference targets; (ii) calibrating the first spectroscopic system; (iii) measuring, with the first spectroscopic system, a spectrum of a known reference specimen having a known value of the property; (iv) generating a model for the measured property using the spectrum of the known reference specimen; (v) measuring, with a second spectroscopic system, the spectra of at least three different reference targets; (vi) calibrating the second spectroscopic system; (vii) applying the model to the second spectroscopic system; (viii) measuring a spectrum of the sample using the second spectroscopic system; and (ix) determining a value of the property using the model.

Abstract translation: 本发明涉及用标准化光谱系统测量样品性质的系统和方法。 所述方法可以包括（i）用第一光谱系统测量至少三个不同参考目标的光谱; （ii）校准第一光谱系统; （iii）用第一光谱系统测量具有该性质的已知值的已知参考样品的光谱; （iv）使用已知参考样本的光谱产生测量属性的模型; （v）用第二光谱系统测量至少三个不同参考目标的光谱; （vi）校准第二光谱系统; （vii）将模型应用于第二光谱系统; （viii）使用第二光谱系统测量样品的光谱; 和（ix）使用模型确定属性的值。