Mounting substrate and manufacturing method thereof
    222.
    发明授权
    Mounting substrate and manufacturing method thereof 有权
    安装基板及其制造方法

    公开(公告)号:US08022553B2

    公开(公告)日:2011-09-20

    申请号:US12155555

    申请日:2008-06-05

    Abstract: A mounting substrate and a method of manufacturing the mounting substrate. The mounting substrate can include an insulation layer, a bonding pad buried in one side of the insulation layer in correspondence with a mounting position of a chip, and a circuit pattern electrically connected to the bonding pad. By utilizing certain embodiments of the invention, the process for stacking a solder resist layer can be omitted, as the bonding pads can be implemented in a form recessed from the surface of the insulation layer. In this way, the manufacturing process can be simplified and manufacturing costs can be reduced. Since the surface of the mounting-substrate on which to mount a chip can be kept flat without any protuberances, the occurrence of voids in the underfill can be minimized. This is correlated to obtaining a high degree of reliability, and leads to a greater likelihood of successful mounting.

    Abstract translation: 一种安装基板及其制造方法。 安装基板可以包括绝缘层,与绝缘层的一侧相对应于芯片的安装位置的接合焊盘以及电连接到焊盘的电路图案。 通过利用本发明的某些实施例,可以省略堆叠阻焊层的工艺,因为焊盘可以以从绝缘层的表面凹陷的形式来实施。 以这种方式,可以简化制造过程,并且可以降低制造成本。 由于安装芯片的安装基板的表面可以保持平坦而没有任何突起,所以可以使底部填充物中的空隙的发生最小化。 这与获得高可靠性相关,并且导致成功安装的可能性更大。

    PROBER UNIT
    223.
    发明申请
    PROBER UNIT 失效
    探索单位

    公开(公告)号:US20110204911A1

    公开(公告)日:2011-08-25

    申请号:US12712734

    申请日:2010-02-25

    Applicant: Gunsei KIMOTO

    Inventor: Gunsei KIMOTO

    Abstract: To facilitate connection between a narrow-pitched probe assembly and a coarse-pitched printed circuit board. A prober unit in which probes are brought into contact with to-be-tested semiconductor chips to establish electrical connection between the semiconductor chips and a test unit via the probes, in which: a probe assembly and a plurality of wiring boards are prepared, the probe assembly including output terminals to be connected directly to the probes, the probe assembly being constituted by integrated regularly-arranged multiple probe groups including the output terminals, and each of the wiring boards including wiring adhering to a surface of a non-conductive film; and an n-th row of an output terminal group of the probe assembly is brought into contact with a land group provided at an end of an n-th wiring board, and a wiring terminal provided at the other end of the n-th wiring board is connected to one of a wiring board of the test unit and a connector to establish electrical connection between the to-be-tested semiconductor chips and the test unit.

    Abstract translation: 为了便于窄间距探针组件和粗调印刷电路板之间的连接。 探针单元,其中探针与待测试的半导体芯片接触,以通过探针在半导体芯片和测试单元之间建立电连接,其中:准备探针组件和多个布线板, 探针组件,其包括要直接连接到探针的输出端子,探针组件由包括输出端的集成的规则排列的多个探针组构成,并且每个布线板包括附着在非导电膜表面上的布线; 并且探针组件的输出端子组的第n行与设置在第n布线板的端部的平台组接触,并且设置在第n布线的另一端的布线端子 板连接到测试单元的布线板之一和连接器,以在待测半导体芯片和测试单元之间建立电连接。

    Electrical connection structure, liquid ejection head, method of manufacturing same, and image forming apparatus
    224.
    发明授权
    Electrical connection structure, liquid ejection head, method of manufacturing same, and image forming apparatus 失效
    电气连接结构,液体喷射头,其制造方法和图像形成装置

    公开(公告)号:US07971973B2

    公开(公告)日:2011-07-05

    申请号:US11520582

    申请日:2006-09-14

    Applicant: Yasuhiko Maeda

    Inventor: Yasuhiko Maeda

    Abstract: The electrical connection structure includes: a first substrate which has a first electrode part; a second substrate which has a second electrode part opposing the first electrode part, and a wiring pattern connected to the second electrode part; an insulating cavity substrate which is disposed between the first substrate and the second substrate and has a through hole in a position corresponding to the first electrode part, the through hole being deeper that a sum of a height of the first electrode part and a height of the second electrode part and having an opening surface area not smaller that an area of the first electrode part; and conductive material which is filled in the through hole.

    Abstract translation: 电连接结构包括:具有第一电极部分的第一基板; 具有与所述第一电极部相对的第二电极部的第二基板和与所述第二电极部连接的布线图案。 绝缘腔基板,设置在所述第一基板和所述第二基板之间,并且在与所述第一电极部对应的位置具有通孔,所述通孔比所述第一电极部的高度和所述第一电极部的高度 所述第二电极部分具有不小于所述第一电极部分的面积的开口表面积; 以及填充在通孔中的导电材料。

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