SPECTRAL COLORIMETRIC APPARATUS AND IMAGE FORMING APPARATUS INCLUDING THE SAME
    234.
    发明申请
    SPECTRAL COLORIMETRIC APPARATUS AND IMAGE FORMING APPARATUS INCLUDING THE SAME 有权
    光谱彩色装置和图像形成装置,包括它们

    公开(公告)号:US20130242299A1

    公开(公告)日:2013-09-19

    申请号:US13889714

    申请日:2013-05-08

    Abstract: A spectral colorimetric apparatus includes a housing which includes a side wall. An outer surface of the side wall is an adjustment surface capable of adjusting a position of a linear sensor by moving while attaching the linear sensor to the adjustment surface. The linear sensor is supported by the side wall of the housing while abutting on the adjustment surface and receives alight beam that is dispersed by a concave surface reflection type diffraction element and passes through an opening portion. The adjustment surface is parallel to a tangential line at a part of a Rowland circle of the concave surface reflection type diffraction element, through which a light beam received by the linear sensor passes.

    Abstract translation: 光谱比色装置包括包括侧壁的壳体。 侧壁的外表面是能够通过在将线性传感器附接到调节表面的同时通过移动来调节线性传感器的位置的调节表面。 线性传感器由壳体的侧壁支撑,同时抵靠调节表面并且接收由凹面反射型衍射元件分散并穿过开口部分的光束。 调整面平行于凹面反射型衍射元件的Rowland圆的一部分的切线,由线性传感器接收的光束通过该切线。

    ZERO ORDER SENSING TO INCREASE LIGHT COLLECTION IN A SPECTROMETER
    236.
    发明申请
    ZERO ORDER SENSING TO INCREASE LIGHT COLLECTION IN A SPECTROMETER 审中-公开
    零序感应增加光谱仪中的光收集

    公开(公告)号:US20130169959A1

    公开(公告)日:2013-07-04

    申请号:US13544918

    申请日:2012-07-09

    Applicant: Brett Guenther

    Inventor: Brett Guenther

    CPC classification number: G01J3/0237 G01J3/0208 G01J3/027 G01J3/28 G01J3/4412

    Abstract: A system for increasing light collection in a spectrometer includes a detector and a processor. The detector detects zero order diffraction light from a diffractive element of a spectrometer and measures an intensity of the zero order diffraction light. A processor continuously receives the intensity measurement from the detector and automatically adjusts a parameter of the spectrometer until a maximum intensity measurement is received from the detector. A parameter of the spectrometer can include an optical path between an aperture of the spectrometer and a sample, an exposure time of the spectrometer, or an intensity of a light source for the spectrometer. The optical path between an aperture of the spectrometer and a sample can be adjusted by moving an objective lens of the spectrometer with respect to the sample or moving the sample with respect to the spectrometer.

    Abstract translation: 用于增加光谱仪中的光收集的系统包括检测器和处理器。 检测器检测来自光谱仪的衍射元件的零级衍射光并测量零级衍射光的强度。 处理器从检测器连续接收强度测量值,并自动调整光谱仪的参数,直到从检测器接收到最大强度测量值。 光谱仪的参数可以包括光谱仪的孔径和样品之间的光路,光谱仪的曝光时间或光谱仪的光源的强度。 可以通过相对于样品移动光谱仪的物镜或相对于光谱仪移动样品来调节光谱仪的孔径和样品之间的光路。

    METHOD AND DEVICE FOR HIGH RESOLUTION FULL FIELD INTERFERENCE MICROSCOPY
    238.
    发明申请
    METHOD AND DEVICE FOR HIGH RESOLUTION FULL FIELD INTERFERENCE MICROSCOPY 有权
    用于高分辨率全场干涉显微镜的方法和装置

    公开(公告)号:US20130107275A1

    公开(公告)日:2013-05-02

    申请号:US13808739

    申请日:2011-07-08

    Abstract: According to one aspect, the invention relates to a device (20) for three-dimensional imaging by full-field interferential microscopy of a volumic and scattering sample (1) comprising an emission source (201) for emitting an incident wave with low temporal coherence, an imaging interferometer (200) of variable magnification, allowing for the acquisition of at least one first and one second interferometric images resulting from the interference of a reference wave obtained by reflection of the incident wave on a reference mirror (205) and an object wave obtained by backscattering of the incident wave by a slice of the sample at a given depth of the sample, the at least two interferometric images having a phase difference obtained by varying the relative path difference between the object and reference arms of the interferometer, a processing unit (206) for processing said interferometric images making it possible to obtain a tomographic image of said slice of the sample, means for axially displacing the interferometer relative to the sample allowing for the acquisition of tomographic images for slices at different depths of the sample and means for varying the magnification of the imaging interferometer allowing for the acquisition of interferometric images of a slice of the sample for different magnification values.

    Abstract translation: 根据一个方面,本发明涉及一种用于通过全场干涉显微镜对体积和散射样品(1)进行三维成像的装置(20),其包括用于发射具有低时间相干性的入射波的发射源(201) ,可变放大率的成像干涉仪(200),允许获取由参考反射镜(205)和对象物体(205)上的入射波的反射获得的参考波的干涉所产生的至少一个第一和第二干涉图像 所述至少两个干涉图像具有通过改变所述干涉仪的对象和参考臂之间的相对路径差异而获得的相位差,所述相位差通过在所述样本的给定深度处的样本的切片获得, 处理单元(206),用于处理所述干涉图像,使得可以获得所述样本的所述切片的断层图像,用于轴向的装置 相对于样品移位干涉仪,允许采集用于在样本的不同深度处的切片的断层图像,以及用于改变成像干涉仪的放大倍率的装置,允许采集不同放大倍率值的样本片的干涉图像 。

    TUNED DYNAMIC EIGEN SPECTROSCOPY SYSTEMS
    239.
    发明申请
    TUNED DYNAMIC EIGEN SPECTROSCOPY SYSTEMS 有权
    调谐动态特征光谱系统

    公开(公告)号:US20130027700A1

    公开(公告)日:2013-01-31

    申请号:US13560220

    申请日:2012-07-27

    Abstract: An apparatus for detecting gas concentrations includes a coded filter to oscillate proximate a resonant frequency. A photo detector is positioned below the coded filter such that the coded filter selectively blocks light that is directed at the photo detector. Optics are positioned to project spectral information on to the coded filter. A processor analyzes a signal received from the photo detector. The processor is adapted to weight a harmonic attic signal.

    Abstract translation: 用于检测气体浓度的装置包括在谐振频率附近振荡的编码滤波器。 光检测器位于编码滤波器的下方,使得编码滤波器选择性地阻挡指向光检测器的光。 定位光学器件将光谱信息投影到编码滤波器上。 处理器分析从光电检测器接收的信号。 处理器适用于加重谐波阁楼信号。

    Inclined-slit spectrograph
    240.
    发明授权
    Inclined-slit spectrograph 有权
    倾斜狭缝光谱仪

    公开(公告)号:US08284397B2

    公开(公告)日:2012-10-09

    申请号:US12527943

    申请日:2008-02-27

    CPC classification number: G01J3/02 G01J3/0237 G01J3/04 G01J3/2803

    Abstract: An inclined-slit spectrograph includes a light source, an inlet slit, a grating and a detector including window through which the light beam diffracted by the grating is transmitted with part of the diffracted light beam generating reflections on the window or between the window and the sensitive surface of the detector. A rectangular inclined inlet slit compensates for spectral resolution losses.

    Abstract translation: 倾斜狭缝光谱仪包括光源,入口狭缝,光栅和包括窗口的检测器,由光栅衍射的光束通过该窗口传播,部分衍射光束在窗口上或窗口与窗口之间产生反射 检测器的敏感表面。 矩形倾斜入口狭缝补偿光谱分辨率损失。

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