Abstract:
The present invention creates a spectrometer (1; 1′) for measuring the concentration of at least one analyte in a fluid sample (2; 2′), with a light source (3; 3′) to generate a light beam (4; 4′), with a photosensor (5; 5′) to receive the light beam (4; 4′), and with a measurement length (6; 6′), in which the fluid sample (2; 2′) can be placed, in the beam path of the light beam (4; 4′), the measurement length (6; 6′) being provided in changeable form.
Abstract:
An automated adaptive optics and laser projection system is described. The automated adaptive optics and laser projection system includes an adaptive optics system and a compact laser projection system with related laser guidance programming used to correct atmospheric distortion induced on light received by a telescope. Control of the automated adaptive optics and laser projection system is designed in a modular manner in order to facilitate replication of the system to be used with a variety of different telescopes. Related methods are also described.
Abstract:
A spectral colorimetric apparatus includes a housing which includes a side wall. An outer surface of the side wall is an adjustment surface capable of adjusting a position of a linear sensor by moving while attaching the linear sensor to the adjustment surface. The linear sensor is supported by the side wall of the housing while abutting on the adjustment surface and receives alight beam that is dispersed by a concave surface reflection type diffraction element and passes through an opening portion. The adjustment surface is parallel to a tangential line at a part of a Rowland circle of the concave surface reflection type diffraction element, through which a light beam received by the linear sensor passes.
Abstract:
The invention relates to a device and a method for optical 3D measurement, wherein said device can be switched between a first mode for optical 3D measurement using a chromatic confocal measurement method or the triangulation measurement method and a second mode for colorimetric measurement. In the first mode, a broad-band illuminating beam is focused onto a first plane and in the second mode the broad-band illuminating beam is focused onto a second plane other than the first plane at a distance d from the surface of the object to be measured.
Abstract:
A system for increasing light collection in a spectrometer includes a detector and a processor. The detector detects zero order diffraction light from a diffractive element of a spectrometer and measures an intensity of the zero order diffraction light. A processor continuously receives the intensity measurement from the detector and automatically adjusts a parameter of the spectrometer until a maximum intensity measurement is received from the detector. A parameter of the spectrometer can include an optical path between an aperture of the spectrometer and a sample, an exposure time of the spectrometer, or an intensity of a light source for the spectrometer. The optical path between an aperture of the spectrometer and a sample can be adjusted by moving an objective lens of the spectrometer with respect to the sample or moving the sample with respect to the spectrometer.
Abstract:
An image capturing unit includes a sensor unit that image-captures a predetermined area including a subject; and a reference chart unit that is arranged in the predetermined area and captured with the subject by the sensor unit.
Abstract:
According to one aspect, the invention relates to a device (20) for three-dimensional imaging by full-field interferential microscopy of a volumic and scattering sample (1) comprising an emission source (201) for emitting an incident wave with low temporal coherence, an imaging interferometer (200) of variable magnification, allowing for the acquisition of at least one first and one second interferometric images resulting from the interference of a reference wave obtained by reflection of the incident wave on a reference mirror (205) and an object wave obtained by backscattering of the incident wave by a slice of the sample at a given depth of the sample, the at least two interferometric images having a phase difference obtained by varying the relative path difference between the object and reference arms of the interferometer, a processing unit (206) for processing said interferometric images making it possible to obtain a tomographic image of said slice of the sample, means for axially displacing the interferometer relative to the sample allowing for the acquisition of tomographic images for slices at different depths of the sample and means for varying the magnification of the imaging interferometer allowing for the acquisition of interferometric images of a slice of the sample for different magnification values.
Abstract:
An apparatus for detecting gas concentrations includes a coded filter to oscillate proximate a resonant frequency. A photo detector is positioned below the coded filter such that the coded filter selectively blocks light that is directed at the photo detector. Optics are positioned to project spectral information on to the coded filter. A processor analyzes a signal received from the photo detector. The processor is adapted to weight a harmonic attic signal.
Abstract:
An inclined-slit spectrograph includes a light source, an inlet slit, a grating and a detector including window through which the light beam diffracted by the grating is transmitted with part of the diffracted light beam generating reflections on the window or between the window and the sensitive surface of the detector. A rectangular inclined inlet slit compensates for spectral resolution losses.