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    Optical System and Method for Optically Analyzing Light from a Sample
    232.
    发明申请
    Optical System and Method for Optically Analyzing Light from a Sample 失效
    用于光学分析样品光的光学系统和方法

    公开(公告)号：US20070127023A1

    公开(公告)日：2007-06-07

    申请号：US11548210

    申请日：2006-10-10

    Applicant: Richard Reel

    Inventor： Richard Reel

    IPC: G01J3/28

    CPC classification number: G01J3/02 ,  G01J3/0208 ,  G01J3/0229 ,  G01J3/0262 ,  G01J3/0294 ,  G01J3/04 ,  G01J3/2803 ,  G01N21/05 ,  G01N21/31 ,  G01N27/44721 ,  G01N2021/0346

    Abstract: An optical system for analyzing light from a plurality of samples is provided. The optical system includes a plurality of holders adapted to have samples located therein, a collection lens, a transmission grating, and a reimaging lens. The collection lens is configured to receive and substantially collimate light from the samples. The transmission grating is configured to spectrally disperse the substantially collimated light from the collection lens. The reimaging lens is configured to receive the light from the light dispersing element and direct the light onto a light detection device. A method of optically analyzing at least one sample is also provided.

    Abstract translation: 提供了一种用于分析来自多个样品的光的光学系统。 光学系统包括多个保持器，其适于使样本位于其中，收集透镜，透射光栅和再成像透镜。 收集透镜被配置为接收并基本上准直来自样品的光。 透射光栅被配置为光谱地分散来自收集透镜的基本上准直的光。 该成像透镜被配置为接收来自光分散元件的光并将光引导到光检测装置上。 还提供了一种光学分析至少一个样品的方法。

    Optical measurement device
    233.
    发明授权
    Optical measurement device 有权
    光学测量装置

    公开(公告)号：US07212285B2

    公开(公告)日：2007-05-01

    申请号：US10992014

    申请日：2004-11-19

    Applicant: Ryosuke Goto ,  Motoyoshi Sekiya

    Inventor： Ryosuke Goto ,  Motoyoshi Sekiya

    IPC: G01J3/28

    CPC classification number: G01J3/18 ,  G01J3/027 ,  G01J3/04 ,  G01J3/1895 ,  G01J3/453

    Abstract: An optical measurement device capable of improving optical spectrum measurement accuracy without the need to structurally decrease a slit width. A diffraction grating for dispersing measurement light into respective different wavelengths is rotated in a given direction to produce diffracted light of selected wavelengths. A focusing lens converges the diffracted light to produce a converged beam. A slit control section varies the slit width at a constant scan speed to open or close the slit, thereby varying the passing bandwidth for the converged beam. A light receiving/measuring section receives the light passed through the slit, obtains a level function indicative of the power level of the received light that varies with change in optical frequency, and differentiates the level function by the scan speed to reproduce the spectrum profile of the measurement light.

    Abstract translation: 一种能够提高光谱测量精度而不需要在结构上减小狭缝宽度的光学测量装置。 用于将测量光分散到各个不同波长的衍射光栅在给定方向上旋转以产生所选波长的衍射光。 聚焦透镜会聚衍射光以产生会聚光束。 狭缝控制部分以恒定的扫描速度改变狭缝宽度以打开或关闭狭缝，从而改变会聚束的通过带宽。 光接收/测量部分接收通过狭缝的光，获得指示随着光频率的变化而变化的接收光的功率电平的电平函数，并且将电平函数除以扫描速度，以再现频谱分布 测量灯。

    Scalable imaging spectrometer
    234.
    发明授权
    Scalable imaging spectrometer 有权
    可扩展成像光谱仪

    公开(公告)号：US07199877B2

    公开(公告)日：2007-04-03

    申请号：US11187584

    申请日：2005-07-22

    Applicant: Michael R. Kehoe ,  Casey W. Smith ,  Rand C. Swanson

    Inventor： Michael R. Kehoe ,  Casey W. Smith ,  Rand C. Swanson

    IPC: G01J3/28

    CPC classification number: G01J3/02 ,  G01J3/0208 ,  G01J3/04 ,  G01J3/2823

    Abstract: A scalable imaging spectrometer, using anamorphic optical elements to form an intermediate focus in only one dimension. Light reflects off an object to form an incident beam. The beam reflects off an anamorphic objective mirror to form a line focus at a slit. At the slit, the beam is focused along the spectral dimension, but remains substantially collimated along the spatial dimension. The beam is then recollimated in the spectral dimension by a second anamorphic mirror, reflects off a diffraction grating, passes through a lens, and is brought to focus on a two dimensional detector, which produces both spectral and spatial information about the object. Because there is no intermediate focus in the spatial dimension, there are no off-axis aberrations from the anamorphic mirrors, and the field of view may be substantially increased over prior art spectrometers in the spatial dimension.

    Abstract translation: 可扩展的成像光谱仪，使用变形光学元件在一个维度上形成中间焦点。 光反射物体形成入射光束。 光束从一个变形物镜反射出来，在狭缝处形成线对焦。 在狭缝处，光束沿着光谱尺寸被聚焦，但沿着空间维度基本准直。 光束然后通过第二变形反射镜在光谱尺寸上重新进行聚焦，从衍射光栅反射，穿过透镜，并被聚焦在二维检测器上，二维检测器产生关于物体的光谱和空间信息。 因为在空间维度上没有中间焦点，所以不存在来自变形反射镜的离轴像差，并且视野在现有技术的光谱仪中可以在空间维度上显着增加。

    Catoptric imaging systems comprising pellicle and/or aperture-array beam-splitters and non-adaptive and/or adaptive catoptric surfaces
    237.
    发明申请
    Catoptric imaging systems comprising pellicle and/or aperture-array beam-splitters and non-adaptive and/or adaptive catoptric surfaces 失效
    包括防护薄膜组件和/或孔径阵列束分离器和非自适应和/或自适应反射表面的层析成像系统

    公开(公告)号：US20060066873A1

    公开(公告)日：2006-03-30

    申请号：US11229314

    申请日：2005-09-16

    Applicant: Henry Hill

    Inventor： Henry Hill

    IPC: G01B11/02

    CPC classification number: G01B9/02028 ,  G01B9/02022 ,  G01B9/02056 ,  G01J1/58 ,  G01J3/04 ,  G01J3/2823 ,  G01N21/45 ,  G01N21/9501

    Abstract: An interferometry system including: a first imaging system that directs a measurement beam at an object to produce a return measurement beam from the object, that directs the return measurement beam onto an image plane, and that delivers a reference beam to the image plane; and a beam combining element in the image plane, said beam combining element comprising a first layer containing an array of sagittal slits and a second layer containing an array of tangential slits, wherein each slit of the array of sagittal slits is aligned with a corresponding different slit of the array of tangential slits, wherein the beam combining element combines the return measurement beam with the reference beam to produce an array of interference beams.

    Abstract translation: 一种干涉测量系统，包括：第一成像系统，其将物体处的测量光束引导以产生来自所述物体的返回测量光束，所述光束将所述返回测量光束引导到图像平面上，并将参考光束传送到所述像面; 以及所述图像平面中的光束组合元件，所述光束组合元件包括含有矢状狭缝阵列的第一层和包含切向狭缝阵列的第二层，其中所述矢状狭缝阵列的每个狭缝与相应的不同的 切割狭缝阵列的狭缝，其中光束组合元件将返回测量光束与参考光束组合以产生干涉光束阵列。

    Multi-channel, multi-spectrum imaging spectrometer
    238.
    发明申请
    Multi-channel, multi-spectrum imaging spectrometer 有权

    公开(公告)号：US20060038997A1

    公开(公告)日：2006-02-23

    申请号：US11208443

    申请日：2005-08-19

    Applicant: Jason Julian ,  Kevin Didona ,  Darrin Milner ,  Thomas Mikes ,  Scott Milligan ,  David Bannon

    Inventor： Jason Julian ,  Kevin Didona ,  Darrin Milner ,  Thomas Mikes ,  Scott Milligan ,  David Bannon

    IPC: G01J3/28

    CPC classification number: G01J3/02 ,  G01J3/0202 ,  G01J3/0205 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0218 ,  G01J3/0237 ,  G01J3/0291 ,  G01J3/0294 ,  G01J3/0297 ,  G01J3/04 ,  G01J3/18 ,  G01J3/2823

    Abstract: A multi-spectrum, multi-channel imaging spectrometer includes two or more input slits or other light input devices, one for each of two or more input channels. The input slits are vertically and horizontally displaced, with respect to each other. The vertical displacements cause spectra from the two channels to be vertically displaced, with respect to each other, on a single image sensor on a stationary image plane. The horizontal displacements cause incident light beams from the respective input channels to strike a convex grating at different respective incidence angles and produce separate spectra having different respective spectral ranges. A retroflective spectrometer includes a convex grating that, by diffraction, disperses wavelengths of light at different angles and orders approximately back along an incident light beam. A single concave mirror reflects both the input channel and the dispersed spectrum. A prism, set of mirrors, beam splitters or other optical element(s) folds the input channel(s) of a spectrometer to enable the input(s) to be moved away from the plane of the image sensor, thereby enabling a large camera or other device to be attached to the spectrometer without blocking the input(s). A mounting mechanism enables a curved optical element to be adjusted through lateral and transverse translations, without requiring a gimbal mount.

    Variable width optical slit mechanism
    240.
    发明授权
    Variable width optical slit mechanism 失效
    可变宽光学狭缝机构

    公开(公告)号：US06956688B2

    公开(公告)日：2005-10-18

    申请号：US10470451

    申请日：2002-02-19

    Applicant: Sakae Hoshino

    Inventor： Sakae Hoshino

    IPC: G01J3/04 ,  G02B5/00 ,  G02B7/00 ,  G02B26/02

    CPC classification number: G01J3/04 ,  G02B5/005

    Abstract: There is provided a variable width optical slit mechanism capable of controlling the width of a slit with high accuracy in wide range of temperatures. A pair of conductive carriages is movably mounted on a conductive guide rail in the state that the carriages are not in contact with the guide rail by use of insulative rolling elements, or alternatively, a pair of conductive carriages is movably mounted on an insulative guide rail by use of conductive rolling elements. A pair of slit forming members is mounted to the pair of carriages, respectively. An elastic force is given to the carriages for energizing them such that they move toward each other, thereby to always bring the slit forming members into contact with each other to make the width of a slit zero. When a slit is formed, the carriages move away from each other against the elastic force.

    Abstract translation: 提供了一种可变宽度的光学狭缝机构，其能够在宽的温度范围内以高精度控制狭缝的宽度。 一对导电滑架可移动地安装在导电导轨上，在托架不通过使用绝缘滚动元件与导轨接触的状态下，或者，一对导电滑架可移动地安装在绝缘导轨 通过使用导电滚动元件。 一对狭缝形成部件分别安装在该对滑架上。 向支架施加弹性力使它们通电，使得它们彼此相对移动，从而总是使狭缝形成构件彼此接触以使狭缝的宽度为零。 当形成狭缝时，托架抵抗弹性力彼此远离。

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