Multi-wave-length spectrofluorometer
    262.
    发明授权
    Multi-wave-length spectrofluorometer 失效
    多波长分光荧光计

    公开(公告)号:US5422719A

    公开(公告)日:1995-06-06

    申请号:US150962

    申请日:1993-11-12

    CPC classification number: G01J3/4406 G01J3/04 G01J2003/045

    Abstract: A multi-wavelength spectrofluorometer suitable for operation in laboratory, process control environments and in the field. The unit includes a multi-source flash tube, slits, diffraction grating arrangement(s) and other optics whereby a number of different wavelengths are available for exciting the sample. Also, a slit moving along the tubular axis of a single flash tube may be used. The excitation light is directed onto a sample and the luminescent emitted light from the sample is measured for intensity and wavelength. The resulting "signature" is compared with stored "signatures" for identification purposes. A controller with storage, keyboard and display provides interactive operation for the user. Separate memory cards with stored known component signatures and other analysis programs may be inserted into the instrument. Modules for directing the analysis to remote samples and to solid, liquid or gas samples are provided.

    Abstract translation: 一种多波长分光荧光计,适用于实验室,过程控制环境和现场操作。 该单元包括多源闪光管,狭缝,衍射光栅布置和其他光学器件,由此多个不同的波长可用于激发样品。 此外,可以使用沿着单个闪光管的管状轴线移动的狭缝。 激发光被引导到样品上,并且测量来自样品的发光光的强度和波长。 将所得到的“签名”与存储的“签名”进行比较以用于识别目的。 具有存储,键盘和显示的控制器为用户提供交互式操作。 可以将具有存储的已知组件签名和其他分析程序的独立存储卡插入到仪器中。 提供了将分析指导给远程样品和固体,液体或气体样品的模块。

    Microscopic spectrometer
    263.
    发明授权
    Microscopic spectrometer 失效
    显微镜光谱仪

    公开(公告)号:US5301007A

    公开(公告)日:1994-04-05

    申请号:US607313

    申请日:1990-10-31

    Applicant: Juichiro Ukon

    Inventor: Juichiro Ukon

    Abstract: A microscopic spectrometer having a separate optical path for masking light from a sample for spectrometric measurements. In the preferred embodiment, a beam splitter is disposed behind an object lens to form two branched optical paths. One of the optical paths is provided with masks at a point of focus along the path, allowing part of the image to be masked. The second optical path allows optical throughput and observation of the entire image. These two optical paths are rejoined, and a final image is obtained for visual inspection by synthesizing the two optical paths.

    Abstract translation: 具有用于掩蔽来自样品的光的单独光路的微观光谱仪用于光谱测量。 在优选实施例中,分束器设置在物镜后面以形成两个分支的光路。 光路中的一个在沿着路径的焦点处设置有掩模,允许图像的一部分被掩蔽。 第二光路允许光学吞吐量和整个图像的观察。 这两个光路被重新连接,并通过合成两个光路获得最终的图像用于目视检查。

    Transient spectroscopic method and apparatus for in-process analysis of
molten metal
    264.
    发明授权
    Transient spectroscopic method and apparatus for in-process analysis of molten metal 失效
    用于熔融金属在线分析的瞬态光谱法和装置

    公开(公告)号:US4986658A

    公开(公告)日:1991-01-22

    申请号:US341748

    申请日:1989-04-21

    Applicant: Yong W. Kim

    Inventor: Yong W. Kim

    Abstract: A method and apparatus for in-process transient spectroscopic analysis of a molten metal, wherein a probe containing a pulsed high-power laser producing a pulsed laser beam having a substantially triangular pulse waveshape is immersed in the molten metal and irradiates a representative quantity of the molten metal. The pulsed laser beam vaporizes a portion of the molten metal to produce a plasma plume having an elemental composition representative of the elemental composition of the molten metal. Before the plasma plume reaches thermal equilibrium shortly after termination of the laser pulse, a spectroscopic detector in the probe detects spectral line reversals, as caused by absorption of radiation emitted by the hotter inner portion of the plasma plume to relatively coller outer portions of the plasma plume, during a short first time window. Thereafter, when the afterglow plasma is in thermal equilibrium, a second spectroscopic detector also in the probe performs a second short time duration spectroscopic measurement. A rangefinder measures and controls the distance between the molten metal surface and the pulsed laser.

    Abstract translation: 一种用于熔融金属的在线瞬态光谱分析的方法和装置,其中包含产生具有基本三角形脉冲波形的脉冲激光束的脉冲大功率激光的探针被浸入熔融金属中并照射代表量的 熔融金属。 脉冲激光束蒸发熔融金属的一部分以产生具有代表熔融金属的元素组成的元素组成的等离子体羽流。 在等离子体羽毛在激光脉冲终止之后不久达到热平衡之前,探针中的光谱检测器检测光谱线反转,这是由等离子体羽流的较热的内部部分的辐射吸收到等离子体的相对较冷的外部部分引起的 羽毛,在短暂的第一时间窗口。 此后,当余辉等离子体处于热平衡时,也在探针中的第二光谱检测器进行第二短时间光谱测量。 测距仪可测量和控制熔融金属表面与脉冲激光之间的距离。

    Spectrometer apparatus for self-calibrating color imaging apparatus
    265.
    发明授权
    Spectrometer apparatus for self-calibrating color imaging apparatus 失效
    用于自校准彩色成像装置的光谱仪装置

    公开(公告)号:US4898467A

    公开(公告)日:1990-02-06

    申请号:US267596

    申请日:1988-11-07

    Applicant: James R. Milch

    Inventor: James R. Milch

    Abstract: Spectrometer apparatus, for self-calibrating a color image scanner of the line scanner or area scanner type, comprises a member, having an optical slit, movable into position on an optical axis of the scanner between its polychromatic light source and its focusable lens in a plane occupied by a color image when it is scanned. A diffraction grating is similarly movable onto the optical axis, a given distance from an image sensor of the scanner. The light source illuminates the slit and the diffraction grating disperses transmitted polychromatic light according to its wavelength, forming duplicate spectra off-axis across respective halves of the image sensor, with longer wavelengths being diverted to respectively higher angles.

    Abstract translation: 用于自动校准行扫描仪或区域扫描器类型的彩色图像扫描仪的光谱仪装置包括具有光学狭缝的构件,可在其多色光源和可聚焦透镜之间移动到扫描仪的光轴上的位置 扫描时由彩色图像占据的平面。 衍射光栅类似地可以在距离扫描仪的图像传感器一定距离的光轴上移动。 光源照亮狭缝,衍射光栅根据其波长分散透射的多色光,在图像传感器的相应半部分之外离轴形成重复的光谱,其中较长的波长分别转向较高的角度。

    Optical system for spectral analysis devices
    266.
    发明授权
    Optical system for spectral analysis devices 失效
    用于光谱分析装置的光学系统

    公开(公告)号:US4690559A

    公开(公告)日:1987-09-01

    申请号:US744861

    申请日:1985-06-14

    Abstract: The invention relates to an optical system for spectral analysis devices particularly for use in atomic emission spectroscopy in which the aberrations, astigmatis and coma are compensated separately, comprising two concave spherical reflectors adjacently arranged and having their vertices equidistantly located relative to a center of a dispersing member. The latter has a dispersion plane at right angles to the dispersing structure of the dispersing member and to its surface, the vertices are located in said dispersion plane. The center beams originating from an excitation light source are reflected at the reflectors in reflection planes which are at right angles to the dispersion plane. The light entrance of the optical system comprises two slits the images of which coincide in a focal plane. The center of the focal plane and the light entrance have a same distance to the dispersion plane and are located on different sides of the latter.

    Abstract translation: 本发明涉及一种用于光谱分析装置的光学系统,其特别用于原子发射光谱法,其中像差,散光和昏迷被单独补偿,其包括相邻布置的两个凹球形反射器,并且其顶点相对于分散的中心等距定位 会员。 后者具有与分散构件的分散结构成直角且与其表面成直角的分散平面,顶点位于所述分散平面中。 源自激发光源的中心光束在与分散平面成直角的反射面中的反射器处反射。 光学系统的光入射包括两个狭缝,其图像在焦平面上重合。 焦平面和光入口的中心具有与分散平面相同的距离并且位于后者的不同侧。

    Automatic monochromator-testing system
    267.
    发明授权
    Automatic monochromator-testing system 失效
    自动单色仪测试系统

    公开(公告)号:US4669878A

    公开(公告)日:1987-06-02

    申请号:US876658

    申请日:1986-06-18

    Inventor: Daniel J. Meier

    Abstract: An automated chemistry-testing system for analyzing serum samples in which a controlled intensity, monochromatic light beam of substantially any desired wavelength can be selectively directed through any one of a plurality of test solutions in a spectrophotometer. The system operates at very high speed, permitting serum test solutions to be scanned with a multiplicity of wavelengths of light to provide extensive data on the characteristics of the serum. The invention also provides substantial flexibility and permits a wide variety of test to be more reliably performed.

    Abstract translation: 用于分析血清样品的自动化学测试系统,其中基本上任何所需波长的受控强度的单色光束可以选择性地导向通过分光光度计中的多个测试溶液中的任何一个。 该系统以非常高的速度运行,允许用多种波长的光扫描血清测试溶液,以提供关于血清特征的广泛数据。 本发明还提供了实质的灵活性,并且允许更可靠地执行各种各样的测试。

    Optical device for an emission spectrometer
    268.
    发明授权
    Optical device for an emission spectrometer 失效
    用于发射光谱仪的光学装置

    公开(公告)号:US4645344A

    公开(公告)日:1987-02-24

    申请号:US759927

    申请日:1985-07-26

    Applicant: Alain Thevenon

    Inventor: Alain Thevenon

    CPC classification number: G01J3/04 G01J3/20 G01J3/443

    Abstract: An optical device having a Paschen-Runge mounting arrangement, suitable for splitting up the polychromatic light emitted when the sample to be analyzed is being excited, comprising a frame (1) having the shape of a circle sector, an inlet slit (21) illuminated by polychromatic light, a concave diffraction grating (4) which diffracts the bundle of polychromatic light coming from the inlet slit, outlet slits (51) worked into a slit-carrier (5) and selecting the monochromatic bundles coming from the grating, and detectors for measuring the light fluxes of the monochromatic bundles. The slit-carrier (5) consists of a flexible continuous metal ribbon, and the cylindrical support bearings (122), which serve as supports for the slit-carrier, form part of the frame and are situated on either side of an aperture for the passage of monochromatic bundles, the ends of this ribbon being fixed to the frame (1). The device is intended to be mounted in a direct reading emission spectrometer.

    Abstract translation: 一种具有Paschen-Runge安装装置的光学装置,适用于在被分析的样品被激发时分离发射的多色光,包括具有圆形扇形的框架(1),照明的入口狭缝(21) 通过多色光,衍射来自入口狭缝的多色光束的凹面衍射光栅(4),加工成狭缝载体(5)并选择来自光栅的单色光束的出口狭缝(51)和检测器 用于测量单色束的光通量。 狭缝载体(5)由柔性连续金属带构成,并且用作狭缝载体的支撑件的圆柱形支撑轴承(122)形成框架的一部分,并且位于用于 通过单色束,该色带的端部固定在框架(1)上。 该装置旨在安装在直读式发射光谱仪中。

    Slit changing device for monochromator
    269.
    发明授权
    Slit changing device for monochromator 失效
    单色仪切割装置

    公开(公告)号:US4618260A

    公开(公告)日:1986-10-21

    申请号:US546527

    申请日:1983-10-28

    Applicant: Kunihiko Okubo

    Inventor: Kunihiko Okubo

    CPC classification number: G05B19/23 G01J3/04 G05B2219/34052 G05B2219/41081

    Abstract: A slit changing device for a monochrometer comprises a slit disc forming a plurality of pairs of slits each having different widths, a pulse motor for rotating the slit disc, a control circuit for activating the pulse motor, so that any pair of the pairs of slits can be selected, and a keyboard operated to enter target slit information into the control circuit. The coupling between the slit disc and the pulse motor is slipless and backlashless. The control circuit comprises a present slit pulse counter for storing the pulse number of a presently selected slit pair and a target pulse counter for storing the pulse number of a target slit pair.

    Abstract translation: 用于单色仪的狭缝改变装置包括形成具有不同宽度的多对狭缝的狭缝盘,用于旋转狭缝盘的脉冲电机,用于启动脉冲电机的控制电路,使得任何一对狭缝 并且键盘操作以将目标狭缝信息输入到控制电路中。 狭缝盘和脉冲电机之间的耦合是无光滑和无间隙的。 控制电路包括用于存储当前选择的狭缝对的脉冲数的当前狭缝脉冲计数器和用于存储目标狭缝对的脉冲数的目标脉冲计数器。

    Calibrating apparatus in a monochromator
    270.
    发明授权
    Calibrating apparatus in a monochromator 失效
    单色仪中的校准装置

    公开(公告)号:US4352561A

    公开(公告)日:1982-10-05

    申请号:US192530

    申请日:1980-02-25

    CPC classification number: G01J3/04 G01J2003/2866

    Abstract: This invention relates to an apparatus for calibrating a slit width among calibrating apparatuses in a monochromator.There has been the problem that, although the slit width precision of the monochromator has been an important performance item, the calibration of the slit width has not hitherto been performed.This invention employs a bright-line spectrum or zero-order light for the slit width calibration. A peak is found out from among output signals of a lightdetector (20) by means of a peak decision unit (26). The peak value is stored into a memory (28). This peak value and the output of the lightdetector (20) are compared by a comparator (32). The slit width is calibrated on the basis of the quantity of wavelength scanning till the coincidence of both the values.

    Abstract translation: PCT No.PCT / JP79 / 00158 Sec。 371日期1980年2月25日 102(e)1980年2月25日PCT申请1979年6月20日PCT公布。 公开号WO80 / 00189 日本1980年2月7日。本发明涉及一种用于校准单色仪中的校准装置之间的狭缝宽度的装置。 存在这样的问题,虽然单色器的狭缝宽度精度是重要的性能项目,但是迄今为止尚未进行狭缝宽度的校准。 本发明采用亮线光谱或零级光进行狭缝宽度校准。 通过峰值判定单元(26)从光检测器(20)的输出信号中发现峰值。 峰值存储到存储器(28)中。 通过比较器(32)比较该峰值和光检测器(20)的输出。 基于波长扫描的量来校正狭缝宽度,直到两者的一致。

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