Abstract:
An optical wavelength dispersion device includes a first substrate; an input unit formed on the first substrate having a slit for receiving an optical signal; a grating formed on the first substrate for producing a first light beam form the optical signal for outputting; and a second substrate covered on the top of the input unit and the grating; wherein the input unit and the grating are formed from a photo-resist layer by high energy light source exposure.
Abstract:
Embodiments include devices, systems and processes for using a combined confocal Raman microscope for inspecting a photo resist film material layer formed on the top surface of a layer of a substrate package, to detect border defects between regions of light exposed (e.g., cured) and unexposed (e.g., uncured) resist film material. Use of the confocal Raman microscope may provide a 3D photo-resist chemical imaging and characterization technique based on combining (1) Raman spectroscopy to identify the borders between regions of light exposed and unexposed resist along XY planes, with (2) Confocal imaging to select a Z-height of the XY planes scanned. Such detection provides fast, high resolution, non-destructive in-line inspection, and improves technical development of polymerization profiles of the resist film material.
Abstract:
A system for performing high-speed, high-resolution imaging cytometry includes a scanning region that is illuminated by light including at least first and second wavelength bands. The system also includes a cell transport mechanism that transports a cell through the scanning region such that the cell is illuminated. The system further includes a set of at least one linear light sensor, and an optical system that selectively directs light emitted from the cell to two portions of the linear light sensor set such that emitted light in a third wavelength band is primarily directed to a first portion of the linear light sensor set, and emitted light in a fourth wavelength band is primarily directed to a second portion of the linear light sensor set. The system repeatedly takes readings of light falling on the linear light sensor set while the cell is transported through the scanning region.
Abstract:
A spectral characteristic obtaining apparatus including a light irradiation unit configured to emit light onto a reading object; a spectroscopic unit configured to separate at least a part of diffused reflected light from the light emitted onto the reading object by the light irradiation unit into a spectrum; and a light receiving unit configured to receive the diffused reflected light separated into the spectrum by the spectroscopic unit and to obtain a spectral characteristic. In at least one example embodiment, the light receiving unit is configured to be a spectroscopic sensor array including plural spectroscopic sensors arranged in a direction, and the spectroscopic sensors include a predetermined number of pixels arranged in the direction to receive lights with different spectral characteristics from each other.
Abstract:
A spectroscopic measuring apparatus with monitoring capability includes a first optical path that extends from a measuring object through an optical system and a slit of a slit-mirror block to a spectroscope main body and a second optical path that extends from the measuring object through the optical system and a mirror face of the slit-mirror block to a two-dimensional photographing unit. The slit and spectroscope main body are integrated into a spectroscopic unit.
Abstract:
A spectrometer design method that corrects aberration by using crossed optical paths and minor alignment, simplifies manufacture by applying the light entrance slit and aperture on opposite sides of a transparent input block, and creates a more compact footprint by placing a 45 degree mirror or right angle prism directly in front of the detector is disclosed.
Abstract:
An arrangement for measuring characteristic properties of a plasma beam in a thermal spray process, including a device for introducing spray materials into the plasma, a one-dimensional or two-dimensional array including first optical waveguides for receiving the light radiation emitted by the plasma, and other optical waveguides for distributing the light radiation emitted by the plasma. A device is provided for splitting the light guided in the first optical waveguides into the other optical wave guides, one optical waveguide being connected to the opening diaphragm of a particle flow arrangement, and the other optical waveguide being connected to the opening diaphragm of a spectrometer. A device is also provided for determining the current state of the spray process.
Abstract:
A light scanning type confocal microscope includes a light source unit that projects an excitation light beam, a scanning optical system that scans the excitation light beam, an objective lens that applies the excitation light beam to a sample, a separation optical element that separates the excitation light and detection light generated by the sample, a confocal detection unit that obtains a confocal effect, and a spectral detection device that spectrally detects the detection light. The spectral detection device has a spectroscopic element that spectrally separates the detection light, a light extracting unit that extracts light in a wavelength band from the light spectrally separated by the spectroscopic element, a detector that detects the light extracted by the light extracting unit, and a wavelength band shifting unit that shifts a wavelength band of light to be extracted by the light extracting unit.
Abstract:
Embodiments of the present invention relate to systems and methods for spectral imaging. In one embodiment, an image of the scene is formed on a coded aperture of a spectrometer. A coded image from the coded aperture is detected on a two-dimensional detector array of the spectrometer through a spectrally dispersive element of the spectrometer. Data from the two-dimensional detector array is collected as the coded image is varied over time. The spectral image is estimated from the data collected and the variation of the coded image over time. The data collected is varied over time through translation, rotation, and defocus.
Abstract:
A class of aperture coded spectrometer is optimized for the spectral characterization of diffuse sources. The instrument achieves high throughput and high spatial resolution by replacing the slit of conventional dispersive spectrometers with a spatial filter or mask. A number of masks can be used including Harmonic masks, Legendre masks, and Hadamard masks.