Abstract:
A hand-held colorimetric device (101) suitable for use by blind or colour-blind individuals to determine the colour of a surface-under-test (SUT), for example of a fabric, has an aperture (110) which, in use, is covered by the SUT (113) whose colour is to be determined. Six LEDs (115A, 115B, 116B, 117A and 117B) arranged in pairs (115A/115B, 116A/116 B, 117a/117B) emitting red/orange, green, and blue light illuminate the SUT and diffuse reflections therefrom containing red/orange, green, and blue spectrum sample values are used to determine the luminous reflectivity and chromaticity values for the colour of the SUT. The measured values are compared with colorimetric values of reference surfaces to determine the colour of the SUT. The colorimetric device may output the name of the colour aurally.
Abstract:
A disc serving as a spatial radiation modulator has dispersed radiation filters thereon. Each filter has a transmittance or reflectance modulation function of the form sin2(mθ+pπ/4), where m is a positive integer and p has one of the four values 0, 1, 2, 3. A radiation beam including selected wavelength components is diffracted into an elongated image dispersed according to wavelength. Different wavelength components are focused onto different filters on the modulator and are encoded by correspond filters. Since the modulation functions of the filters are orthogonal to one another, it is possible to extract the amplitude of each wavelength component after it has been encoded or modulated by corresponding filter from the total detected signal during one measurement.
Abstract translation:用作空间辐射调制器的盘在其上具有分散的辐射滤波器。 每个滤光器具有形式为sinθ2(mta + ppi / 4)的透射率或反射调制函数,其中m是正整数,p具有四个值0,1,2,3中的一个 包括所选择的波长分量的辐射束被衍射成根据波长分散的细长图像。 不同的波长分量聚焦在调制器上的不同滤波器上,并由相应的滤波器编码。 由于滤波器的调制功能彼此正交,因此可以在一次测量期间从总检测信号对相应的滤波器进行编码或调制之后提取每个波长分量的振幅。
Abstract:
An instrument and method for measuring light or color using modulated illumination. The system includes an LED illuminator modulated at a specific frequency for illuminating the sample, and a sensor capable of differentiating between the modulated light from the sample and unmodulated ambient light. The instrument is therefore capable of “seeing” only light from the sample, while ignoring ambient light. In a second embodiment, the system includes multiple illuminators of different colors each modulated at a unique frequency so that the sample can be measured at multiple at each of the different frequencies.
Abstract:
Method and apparatus for analyzing radiation using analyzers and encoders employing the spatial modulation of radiation dispersed by wavelength or imaged along a line.
Abstract:
A handheld, pen-like colorimeter for measuring the color of an object is provided. The invention comprising three light sensors, each of which detects a separate primary color. A microprocessor in the colorimeter calculates a single composite color value from the three separate color measurements from the light sensors and then compares the composite color value with a list of color values, wherein each value corresponds to a unique color name. The colorimeter selects the color name that matches the composite color value of the object presents the color name to a user, by means of a liquid crystal display (LCD) or an audio speaker. Another embodiment of the present invention uses lasers emitting primary colors, rather than passive light sensors. The lasers shine on an object one at a time, and the reflected laser light from the three lasers is detected by a special light sensor. The three color measurements are then combined to produce a composite value, similar to the first embodiment.
Abstract:
A disc serving as a spatial radiation modulator has dispersed radiation filters thereon. Each filter has a transmittance or reflectance modulation function of the form sin2(mnullnullpnull/4), where m is a positive integer and p has one of the four values 0, 1, 2, 3. A radiation beam including selected wavelength components is diffracted into an elongated image dispersed according to wavelength. Different wavelength components are focused onto different filters on the modulator and are encoded by correspond filters. Since the modulation functions of the filters are orthogonal to one another, it is possible to extract the amplitude of each wavelength component after it has been encoded or modulated by corresponding filter from the total detected signal during one measurement.
Abstract:
A light equipment irradiating a target with light adjusts light from a light source in a light source optical system and introduces the same into an acousto-optic device, for separating the same into its spectral components and modulating the same in the acousto-optic device. A condensing optical system condenses first order diffractive light outgoing from the acousto-optic device, so that an irradiation optical system irradiates a target with the same. A photodetection device comprises a photoreceiving part and a data processing part, so that the photoreceiving part converts a signal responsive to the fluctuation of modulated measuring light to a plurality of signals of different degrees of amplification simultaneously outputting same. The data processing part selects a non-saturated value of an amplifier or an A-D convertor while maintaining the largest degree of amplification from these signals, and lock-in processes same with a modulation frequency modulating the measuring light. A specific substance in a scattering substance can be non-invasively measured with high accuracy.
Abstract:
An optical lock-in detection technique and circuit for coherent applications employing a photo-detector having a symmetric I-V curve is presented. The detection circuit includes a photo-detector operating as an optical lock-in amplifier, and a modulation source. The technique and circuit are used for coherent detection applications such as the determination of the frequency of modulation of an optical signal or the determination of the presence of an optical signal at a specified frequency. The technique and circuit are also used with one or more charge coupled devices in imaging applications.
Abstract:
The invention describes a procedure and an arrangement for measurement of temperature and thickness of layer during a deposition or coating process. As coating or depositing processes known technologies of semi-conductor manufacturing arrangements, plasma devices, ion devices, and other dry-etching arrangements may be used. The invention can also be applied to the manufacture of optical coatings. As a consequence of interference of the thermal radiation of the substrate at the growing layer, the emissivity .epsilon. changes continuously during coating or depositing, therefore, a pyrometric measurement of temperature may not be applied. This basic problem is solved by the invention, which uses a reflectometer, which determines the reflectivity R of the wafer. According to the law of conservation of energy .epsilon.=1-R so that with said reflectometer the actual emissivity of the whole (multi-layer) system may be determined. The measurement of temperature then is effected by means of a determination equation. Concurrently the thickness is determined by a comparison of the reflectometer-curve and a theoretical dependency of thickness of layer.
Abstract:
A spectrophotometer is described, comprising a single light source, a single detector, optics for dually and alternatively reading a sample and a reference, and only one moving part. That moving part is a chopper containing multiple pass-through apertures, each filled with a unique bandpass filter to select wavelengths to specifically illuminate the sample or reference. To inform the spectrophotometer whether and when it is reading the sample or the reference, trigger means are provided in at least twice the number of the pass-through apertures.