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    Terahertz spectrometer
    22.
    发明授权
    Terahertz spectrometer 有权
    太赫兹光谱仪

    公开(公告)号：US07898668B2

    公开(公告)日：2011-03-01

    申请号：US12396803

    申请日：2009-03-03

    Applicant: Tomoyuki Umetsu

    Inventor： Tomoyuki Umetsu

    IPC: G01N21/55

    CPC classification number: G01N21/3581 ,  G01J3/02 ,  G01J3/0278 ,  G01J3/42

    Abstract: A terahertz spectrometer includes: a terahertz-wave generating element; an elliptical mirror; an optical lens configured to apply a terahertz wave generated by the terahertz-wave generating element, obliquely to a focusing plane of a first focus of the elliptical mirror; and a terahertz-wave detecting element arranged at a second focus of the elliptical mirror.

    Abstract translation: 太赫兹光谱仪包括：太赫兹波发生元件; 椭圆镜 光学透镜，被配置为将由所述太赫兹波产生元件产生的太赫兹波倾斜地施加到所述椭圆镜的第一焦点的聚焦平面; 以及布置在椭圆镜的第二焦点处的太赫兹波检测元件。

    KNOWLEDGE BASED SPECTROMETER
    23.
    发明申请
    KNOWLEDGE BASED SPECTROMETER 有权
    基于知识的光谱仪

    公开(公告)号：US20100290053A1

    公开(公告)日：2010-11-18

    申请号：US12466161

    申请日：2009-05-14

    Applicant: Ian S. Robinson

    Inventor： Ian S. Robinson

    IPC: G01J3/45 ,  G01B9/02

    CPC classification number: G01J3/45 ,  G01J3/02 ,  G01J3/0278 ,  G01J3/28 ,  G01J3/4535

    Abstract: A sensor and method for remotely determining a presence of a particular substance based on spectral data of the particular substance is disclosed. The sensor includes a sampling module configured to detect radiation from a particular substance using an interferometer, wherein the sampling module includes a control module that is configured to guide and measure spacing of samples taken by the sampling module; a focal plane module configured to detect and convert an interference pattern produced by the interferometer into a series of digital samples; a reference spectra modification module configured to modify reference spectra by modifying according to the measured spacing of samples and an instrument line shape of the sampling module; an estimation module configured to receive the converted series of digital samples and transform the non-uniformly spaced digital samples into frequency space using band centers determined from reference spectra as modified by the instrument line shape of the sampling module; a comparison module configured to compare the transformed digital samples against a database of known chemical signatures; and a determination module configured to determine the presence of the particular substance based on the results of the comparison.

    Abstract translation: 公开了一种用于基于特定物质的光谱数据远程确定特定物质的存在的传感器和方法。 所述传感器包括被配置为使用干涉仪来检测来自特定物质的辐射的采样模块，其中所述采样模块包括控制模块，所述控制模块被配置为引导并测量由所述采样模块采集的采样的间隔; 焦平面模块，其被配置为检测并将由所述干涉仪产生的干涉图案转换成一系列数字样本; 参考光谱修改模块，被配置为通过根据样本的测量间距和采样模块的仪器线形状修改来修改参考光谱; 估计模块，被配置为接收经转换的一系列数字样本，并且使用由采样模块的仪器线形修改的参考光谱确定的频带中心将非均匀间隔的数字样本转换成频率空间; 比较模块，被配置为将经转换的数字样本与已知化学特征数据库进行比较; 以及确定模块，其被配置为基于所述比较的结果来确定所述特定物质的存在。

    WAVELENGTH DETECTING APPARATUS AND FOCUS DETECTING APPARATUS HAVING THE SAME
    25.
    发明申请
    WAVELENGTH DETECTING APPARATUS AND FOCUS DETECTING APPARATUS HAVING THE SAME 失效
    波长检测装置和聚焦检测装置

    公开(公告)号：US20100182494A1

    公开(公告)日：2010-07-22

    申请号：US12604958

    申请日：2009-10-23

    Applicant: Kyong-Tae PARK ,  Shitao DENG

    Inventor： Kyong-Tae PARK ,  Shitao DENG

    IPC: H04N5/232 ,  G02B27/40 ,  G01D18/00

    CPC classification number: H04N5/23212 ,  G01J3/02 ,  G01J3/0237 ,  G01J3/0278 ,  G01J3/0291 ,  G01J3/1804 ,  G02B7/38 ,  G02B27/0068

    Abstract: A wavelength detecting apparatus capable of detecting the main wavelength of the light coming into an image capture apparatus and a focus detecting apparatus using the same are disclosed. The wavelength detecting apparatus may include a spectral unit which separates the incoming light according to the respective wavelengths, and may focus the separated light onto a sensor. The main wavelength can be determined based on the wavelength distribution sensed by the sensor. The determined wavelength can be used to further determine amount of adjustment to be made to the defocus amount to compensate for the chromatic aberration associated with the wavelength of the light illuminating the source.

    Abstract translation: 公开了一种能够检测进入图像捕获装置的光的主波长的波长检测装置和使用该波长检测装置的聚焦检测装置。 波长检测装置可以包括根据各个波长分离入射光的光谱单元，并且可以将分离的光聚焦到传感器上。 主波长可以根据传感器感测到的波长分布来确定。 可以使用所确定的波长来进一步确定对散焦量进行的调整量，以补偿与照亮源的光的波长相关联的色像差。

    Scanner device
    26.
    发明授权
    Scanner device 有权
    扫描仪设备

    公开(公告)号：US07755773B2

    公开(公告)日：2010-07-13

    申请号：US11961507

    申请日：2007-12-20

    Applicant: Peter Ehbets ,  Adrian Kohlbrenner

    Inventor： Peter Ehbets ,  Adrian Kohlbrenner

    IPC: G01B11/14

    CPC classification number: H04N1/04 ,  G01J3/02 ,  G01J3/027 ,  G01J3/0278 ,  G01J3/50 ,  G01J3/502 ,  H04N1/00002 ,  H04N2201/0436 ,  H04N2201/0456

    Abstract: A scanner device for measuring the color properties of a measured object pixel by pixel has a support surface for the measured object, a color measuring head, a drive unit for moving the color measuring head above the support surface in at least one dimension thereof and for adjusting the height of the color measuring head in the direction perpendicular to the support surface, as well as a measurement and drive control unit which activates the drive unit and co-operates with the color measuring head. It is also equipped with an electronic distance control system which adjusts the distance of the color measuring head above the measurement point in the direction perpendicular to the support surface to a desired measuring distance for every measurement point by means of the drive unit. The electronic distance control system works with measurement values generated by the color measuring head and distance values computed from them. The scanner device is suitable for running high-precision measurements on even the smallest measurement fields without contact and no separate measurement sensor is needed for the distance control system.

    Abstract translation: 用于逐像素地测量被测物体的颜色属性的扫描仪装置具有用于测量对象的支撑表面，颜色测量头，用于在至少一个维度上将颜色测量头移动到支撑表面上方的驱动单元，并用于 在垂直于支撑表面的方向上调节彩色测量头的高度，以及测量和驱动控制单元，其激活驱动单元并与测色头配合。 还配备有电子距离控制系统，其通过驱动单元将测量点在与支撑表面垂直的方向上的距离调整到每个测量点的所需测量距离。 电子距离控制系统使用由测量头产生的测量值和从它们计算的距离值。 扫描仪装置适用于即使在最小测量领域也不接触地进行高精度测量，距离控制系统也不需要单独的测量传感器。

    Distance adjusting apparatus and method, and object examining apparatus and method
    27.
    发明授权
    Distance adjusting apparatus and method, and object examining apparatus and method 失效
    距离调整装置和方法以及对象检查装置和方法

    公开(公告)号：US07737402B2

    公开(公告)日：2010-06-15

    申请号：US12201745

    申请日：2008-08-29

    Applicant: Yasushi Koyama

    Inventor： Yasushi Koyama

    IPC: G01N21/17

    CPC classification number: G01J3/02 ,  G01J3/0278 ,  G01S17/10

    Abstract: In apparatuses and methods for adjusting a distance to an object, or examining an object, by using terahertz radiation, a sensor portion and a distance changing portion are used. The sensor portion includes a generator for generating terahertz radiation, a transmission line for transmitting the terahertz radiation, and a detector for detecting the terahertz radiation transmitted through the transmission line. The distance changing portion is configured to change the distance between the object and the sensor portion. The distance is adjusted based on information of the terahertz radiation detected by the detector. The object is examined based on the information of the terahertz radiation detected by the detector, after the distance is adjusted based on the information of the terahertz radiation detected by the detector. Under a condition of the adjusted distance, leaking electromagnetic field of the terahertz radiation transmitted through the transmission line interacts with the object.

    Abstract translation: 在通过使用太赫兹辐射来调整到物体的距离或检查物体的装置和方法中，使用传感器部分和距离变化部分。 传感器部分包括用于产生太赫兹辐射的发生器，用于传输太赫兹辐射的传输线，以及用于检测通过传输线传输的太赫兹辐射的检测器。 距离变化部构成为改变物体与传感器部之间的距离。 基于由检测器检测到的太赫兹辐射的信息来调整距离。 基于由检测器检测到的太赫兹辐射的信息来调整距离之后，基于由检测器检测的太赫兹辐射的信息来检查物体。 在调整距离的条件下，通过传输线传输的太赫兹辐射的泄漏电磁场与物体相互作用。

    Optical microscope and spectrum measuring method
    28.
    发明申请
    Optical microscope and spectrum measuring method 有权
    光学显微镜和光谱测量方法

    公开(公告)号：US20100128263A1

    公开(公告)日：2010-05-27

    申请号：US12591584

    申请日：2009-11-24

    Applicant: Minoru Kobayashi ,  Taisuke Ota ,  Takahiro Ode

    Inventor： Minoru Kobayashi ,  Taisuke Ota ,  Takahiro Ode

    IPC: G01J3/28 ,  G02B21/00

    CPC classification number: G01J3/44 ,  G01J3/0278 ,  G01J3/06 ,  G02B7/36 ,  G02B21/241

    Abstract: An optical microscope applies laser light to a sample through the an objective lens, detects reflected light reflected by the sample through the objective lens, changes a focal position of the laser light in an optical axis direction, extracts a focal position for spectrum measurement based on a detection result of the reflected light when the focal position of the laser light is changed, adjusts the focal position to coincide with the extracted focal position, separates outgoing light exiting from the sample by application of the laser light with the adjusted focal position from the laser light, and measures a spectrum of the outgoing light separated from the laser light with a spectroscope.

    Abstract translation: 光学显微镜通过物镜对样品施加激光，通过物镜检测由样品反射的反射光，在光轴方向上改变激光的焦点位置，提取用于光谱测量的焦点位置，基于 当激光的焦点位置改变时反射光的检测结果调整焦点位置与提取的焦点位置一致，通过从调色剂焦点位置施加具有激光的出射光， 激光，并用分光镜测量与激光分离的出射光谱。

    Optical characteristic measuring apparatus
    30.
    发明申请
    Optical characteristic measuring apparatus 有权
    光学特性测量仪器

    公开(公告)号：US20090079984A1

    公开(公告)日：2009-03-26

    申请号：US12284432

    申请日：2008-09-22

    Applicant: Tomohiro Fukamizu ,  Yoshiyuki Nagashima ,  Katsutoshi Tsurutani ,  Shinji Shimizu

    Inventor： Tomohiro Fukamizu ,  Yoshiyuki Nagashima ,  Katsutoshi Tsurutani ,  Shinji Shimizu

    IPC: G01J3/46

    CPC classification number: G01J3/50 ,  G01J3/02 ,  G01J3/0278 ,  G01J3/504 ,  G01N21/57 ,  G01N2021/575 ,  G01N2021/8427

    Abstract: An optical characteristic measuring apparatus of the invention is configured in such a manner that a specular reflection light component in reflection light from an object to be measured is received, and shake of the apparatus is detected based on the amount of the received light. The optical characteristic measuring apparatus having the above arrangement enables to precisely measure an optical characteristic of the object to be measured, without the need of providing a mechanical switch or a like device, and without depending on the shape of the object to be measured.

    Abstract translation: 本发明的光学特性测量装置被配置成使得来自待测物体的反射光中的镜面反射光分量被接收，并且基于所接收的光量检测装置的抖动。 具有上述结构的光学特性测量装置能够精确地测量被测量物体的光学特性，而不需要提供机械开关等装置，而不依赖于被测量物体的形状。

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