Abstract:
Provided is an apparatus for acquiring and projecting a broadband image, the apparatus including: a probe unit provided, on a probe housing of the probe unit, with a white light source unit configured to emit white light for acquiring a visible light image to a subject, a fluorescence excitation light source unit configured to emit fluorescence excitation light for acquiring an invisible light fluorescence image, and an image acquisition unit configured to receive an invisible light fluorescence image signal for the subject, and an image projection unit configured to project an image onto the subject; and an image processing unit configured to process an image received from the image acquisition unit. According to the apparatus for acquiring and projecting a broadband image, the visible light image and the invisible light fluorescence image may be simultaneously acquired and then displayed, and the acquired fluorescence image is projected onto a position where a fluorescence signal may be revealed, thus visually providing a position and shape in which the fluorescence signal is generated.
Abstract:
Systems and methods for measuring spectra and other optical characteristics such as colors, translucence, gloss, and other characteristics of objects and materials such as skin. Instruments and methods for measuring spectra and other optical characteristics of skin or other translucent or opaque objects utilize an abridged spectrophotometer and improved calibration/normalization methods. Improved linearization methods also are provided, as are improved classifier-based algorithms. User control is provided via a graphical user interface. Product or product formulations to match the measured skin or other object or to transform the skin or other object are provided to lighten, darken, make more uniform and the like.
Abstract:
An X-ray analyzer includes a sample stage, an X-ray source that irradiates a sample with primary X-rays, a detector that detects secondary X-rays generated from the sample, a position adjustment mechanism that adjusts relative positions of the sample stage and the primary X-rays, an observation mechanism that obtains an observation image of the sample, and a computer having a display unit and an input unit. The computer has a function of, in response to a pointer being moved from a central region of the observation screen to a certain position by dragging the input unit with keeping a holding state, moving the sample stage in a movement direction and at a movement speed corresponding to a direction and a distance of the certain position relative to the central region.
Abstract:
Methods and systems for determining one or more parameters of a wafer inspection process are provided. One method includes acquiring metrology data for a wafer generated by a wafer metrology system. The method also includes determining one or more parameters of a wafer inspection process for the wafer or another wafer based on the metrology data.
Abstract:
Systems and methods for measuring spectra and other optical characteristics such as colors, translucence, gloss, and other characteristics of objects and materials such as skin. Instruments and methods for measuring spectra and other optical characteristics of skin or other translucent or opaque objects utilize an abridged spectrophotometer and improved calibration/normalization methods. Improved linearization methods also are provided, as are improved classifier-based algorithms. User control is provided via a graphical user interface. Product or product formulations to match the measured skin or other object or to transform the skin or other object are provided to lighten, darken, make more uniform and the like.
Abstract:
The invention features a method including: (i) providing spectrally resolved information about light coming from different spatial locations in a sample comprising deep tissue in response to an illumination of the sample, wherein the light includes contributions from different components in the sample; (ii) decomposing the spectrally resolved information for each of at least some of the different spatial locations into contributions from spectral estimates associated with at least some of the components in the sample; and (iii) constructing a deep tissue image of the sample based on the decomposition to preferentially show a selected one of the components.
Abstract:
Disclosed are apparatus, kits, methods, and systems that include a radiation source configured to direct radiation to a sample; a detector configured to measure radiation from the sample; an electronic processor configured to determine information about the sample based on the measured radiation; a housing enclosing the source, the detector, and the electronic processor, the housing having a hand-held form factor; an arm configured to maintain a separation between the sample and the housing, the arm including a first end configured to connect to the housing and a second end configured to contact the sample; and a layer positioned on the second end of the arm, the layer being configured to contact the sample and to transmit at least a portion of the radiation from the sample to the detector.
Abstract:
A device comprising an illumination means and a light sensing means, that can examine and memorize a discrete color of an object based on the magnitude of the reflected light bouncing off of the colored surface in at least three areas of the electromagnetic spectrum. The device also provides output as a visually and/or audibly perceptible signal for deciphering the color. The color range identified by the device is not limited to the visible spectrum and may include infra-red and ultra-violet light. A storage means for memorizing colors may also be included in the device. Applications of ColorStick technology may include children's toys, aids for the visually handicapped (e.g. blind or color blind individuals), designers, internet shoppers, gardeners, etc.
Abstract:
A repair welding inspection device includes a memory that stores instructions and a processor that executes the instructions. The instructions cause the processor to perform acquiring a second threshold, which is different from a first threshold which is a determination threshold for inspection of welding performed before performing repair welding, and the second threshold being a determination threshold for inspection of the repair welding, and performing inspection after the repair welding by using the second threshold.
Abstract:
Aspects of the present disclosure include reconfigurable integrated circuits for characterizing particles of a sample in a flow stream. Reconfigurable integrated circuits according to certain embodiments are programmed to calculate parameters of a particle in a flow stream from detected light; compare the calculated parameters of the particle with parameters of one or more particle classifications; classify the particle based on the comparison between the parameters of the particle classifications and the calculated parameters of the particle; and adjust one or more parameters of the particle classifications based on the calculated parameters of the particle. Methods for characterizing particles in a flow stream with the subject integrated circuits are also described. Systems and integrated circuit devices programmed for practicing the subject methods, such as on a flow cytometer, are also provided.