Abstract:
A method and apparatus for obtaining reference samples during the generation of a mid-infrared (MW) image without requiring that the sample being imaged be removed is disclosed. A tunable MIR laser generates a light beam that is focused onto a specimen on a specimen stage that moves the specimen in a first direction. An optical assembly includes a scanning assembly having a focusing lens and a mirror that moves in a second direction, different from the first direction, relative to the stage such that the focusing lens maintains a fixed distance between the focusing lens and the specimen stage. A light detector measures an intensity of light leaving the point on the specimen. A controller forms an image from the measured intensity. A reference stage is positioned such that the mirror moves over the reference stage in response to a command so that the controller can also make a reference measurement.
Abstract:
A method and apparatus for testing materials for testing materials using infrared spectrometry. Calibration of an infrared spectrometer for use in testing materials including the steps of: selecting variables which have the potential to influence the physical characteristics of a composite used in the aerospace industry, selecting values for each variable and inputting the variable and values into a design of experiments model, thereby obtaining a sample test matrix.
Abstract:
This invention relates to a system and method to improve the signal to noise ratio (SNR) of optical spectrometers that are limited by nonrandom or fixed pattern noise. A signal from a sample is collected using a short test exposure, a total observation time to maximize SNR is calculated, and the total observation time is achieved by averaging multiple exposures whose time is selected based on the time dependent noise structure of the detector. Moreover, with a priori knowledge of the time dependent noise structure of the spectrometer, this method is easily automatable and can maximize SNR for a spectrum of an unknown compound without any user input.
Abstract:
A printer includes a printing section that ejects an ink, and a spectrometer that disperses incident light. The spectrometer includes a window section that transmits the light, an optical filter device, and a light receiving section. The optical filter device includes a variable wavelength interference filter as a dispersing element that disperses light transmitted by the window section. The light receiving section receives the light which is dispersed by the variable wavelength interference filter. A dirtiness of the window section is detected based on measured values corresponding to each of a plurality of wavelengths obtained by spectrally measuring light from a reference object, and reference values corresponding to each of the plurality of wavelengths.
Abstract:
A method for analyzing the condition of a spectrometer is provided. In one embodiment, the method includes acquiring optical data from a spectrometer of a downhole tool during flushing of a flowline and selecting a data set from the acquired optical data. The method can also include estimating light scattering and optical drift for the spectrometer based on the selected data set and determining impacts of the estimated light scattering and optical drift for the spectrometer on measurement accuracy of a characteristic of a downhole fluid determinable through analysis of the downhole fluid using the spectrometer. Additional methods, systems, and devices are also disclosed.
Abstract:
A polarization image sensor includes: photodiodes arranged on an image capturing plane; a color mosaic filter in which color filters in multiple different colors are arranged to face the photodiodes; an optical low-pass filter which covers the color mosaic filter; and polarization optical elements located closer to a light source than the optical low-pass filter is. Each polarization optical element covers an associated one of the photodiodes and makes light which is polarized in a predetermined direction in a plane that is parallel to the image capturing plane incident onto the optical low-pass filter. The color filters are arranged so that light that has passed through polarization optical elements is transmitted through an associated one of the color filters in a single color. Each color filter covers multiple photodiodes.
Abstract:
Systems and methods are provided for calibrating spectral measurements taken of one or more targets from an aerial vehicle. Multiple photo sensors may be configured to obtain spectral measurements of one or more ambient light sources. The obtained spectral measurements of the one or more ambient light sources may be used to calibrate the obtained spectral measurements of the target.
Abstract:
A light wavelength measurement method of measuring a wavelength of target light includes: receiving target light on a second dispersion device that disperses the target light into a plurality of second beams which reach a plurality of positions corresponding to the wavelength of the target light (S106, S202); and measuring the wavelength of the target light, by using the plurality of the second beams as a vernier scale for measuring the wavelength of the target light within a wavelength range specified by a main scale (S108, S204).
Abstract:
Provided are an apparatus and method for calibrating an extreme ultraviolet (EUV) spectrometer in which a wavelength of a spectrum of EUV light used for EUV lithography and mask inspection technology can be measured accurately.
Abstract:
A handheld LIBS analyzer includes a laser source for generating a laser beam and a spectrometer subsystem for analyzing a plasma generated when the laser beam strikes a sample. A nose section includes an end plate with an aperture for the laser beam, a purge cavity behind the aperture fluidly connected to a source of purge gas, and a shield covering the purge cavity. A vent removes purge gas from the purge cavity when the end plate is placed on the sample.