WIDE FIELD ATOMOSPHERIC SCANNING ELECTRON MICROSCOPE

    公开(公告)号:US20180226221A1

    公开(公告)日:2018-08-09

    申请号:US15749900

    申请日:2016-08-16

    Abstract: Atmospheric scanning electron microscope achieves a wide field of view at low magnifications in a broad range of gaseous pressure, acceleration voltage and image resolution. This is based on the use of a reduced size pressure limiting aperture together with a scanning beam pivot point located at the small aperture at the end of electron optics column. A second aperture is located at the principal plane of the objective lens. Double deflection elements scan and rock the beam at a pivot point first at or near the principal plane of the lens while post-lens deflection means scan and rock the beam at a second pivot point at or near aperture at the end of the optics column. The aperture at the first pivot may act also as beam limiting aperture. In the alternative, with no beam limiting aperture at the principal plane, maximum amount of beam rays passes through the lens and with no post-lens deflection means, the beam is formed (limited) by a very small aperture at or near-and-below the final lens while the aperture skims a shifting portion of the wide beam, which is physically rocked with a pivot on the principal plane but with an apparent pivot point close and above the aperture, all of which result in a wide field of view on the examined specimen.

    Holder assembly for cooperating with a nanoreactor and an electron microscope

    公开(公告)号:US09812285B2

    公开(公告)日:2017-11-07

    申请号:US15218512

    申请日:2016-07-25

    Applicant: FEI Company

    Abstract: Presented is a holder assembly for cooperating with a nanoreactor and an electron microscope. The holder assembly has a distal end for holding the nanoreactor. The volume has a fluid inlet and outlet. The holder assembly has fluid supply and outlet tubes which in working are connected to the fluid inlet and outlet of the nanoreactor. In working, the connection between the fluid inlet and outlet and the respective supply and outlet tubes are sealed by sealing elements. The holder assembly has a recess which, when the nanoreactor is attached and the holder is inserted into the evacuated portion of an electron microscope, forms a sealed pre-vacuum volume between the holder and the nanoreactor, with the pre-vacuum volume being evacuated via a pre-vacuum channel such that any fluid leakage is pumped away and does not enter the evacuated part of the electron microscope.

    THIN-ICE GRID ASSEMBLY FOR CRYO-ELECTRON MICROSCOPY
    40.
    发明申请
    THIN-ICE GRID ASSEMBLY FOR CRYO-ELECTRON MICROSCOPY 有权
    用于电子显微镜的薄冰组件

    公开(公告)号:US20160351374A1

    公开(公告)日:2016-12-01

    申请号:US15233176

    申请日:2016-08-10

    Inventor: Liguo Wang

    Abstract: A grid assembly for cryo-electron microscopy may be fabricated using standard nanofabrication processes. The grid assembly may comprise two support members, each support member comprising a silicon substrate coated with an electron-transparent silicon nitride layer. These two support members are positioned together with the silicon nitride layers facing each other with a rigid spacer layer disposed therebetween. The rigid spacer layer defines one or more chambers in which a biological sample may be provided and fast frozen with a high degree of control of the ice thickness.

    Abstract translation: 用于低温电子显微镜的栅格组件可以使用标准的纳米制造工艺制造。 栅格组件可以包括两个支撑构件,每个支撑构件包括涂覆有电子透明氮化硅层的硅衬底。 这两个支撑构件与氮化硅层一起定位,其间设置有刚性间隔层。 刚性间隔层限定一个或多个室,其中可以提供生物样品并以高度控制冰厚度快速冷冻。

Patent Agency Ranking