Image processing apparatus and control method therefor

    公开(公告)号:US11983901B2

    公开(公告)日:2024-05-14

    申请号:US17882484

    申请日:2022-08-05

    Inventor: Naoya Takesue

    CPC classification number: G06T7/90 B41J2/21 G01J3/40 H04N1/6008 G01J2003/425

    Abstract: An image processing apparatus comprises: an image forming unit configured to form an image on a recording medium using a plurality of color materials on the basis of first image data showing an image; and an estimating unit configured to estimate a characteristic of each one of the plurality of color materials in a target region on the formed image on the basis of second image data obtained by reading the formed image. The estimating unit selects an estimation processing unit to use from among a plurality of estimation processing units used for different estimation methods on the basis of a combination of the color materials in the target region.

    Optical multi-pass cells
    42.
    发明授权

    公开(公告)号:US11781911B2

    公开(公告)日:2023-10-10

    申请号:US17264436

    申请日:2019-07-01

    Abstract: The disclosure relates to an infrared spectrometer comprising first and second opposing reflectors spaced apart by a spacing length, and a plurality of discrete concave reflecting facets, the reflecting facets being facets of at least one of the opposing reflectors. An infrared laser source is arranged to form a laser beam. The opposing reflectors are arranged such that the laser beam is reflected alternately from each of the opposing reflectors, including being reflected at least once by each of the reflecting facets. A detector is arranged to detect spectral properties of the laser beam after reflection from each of the plurality of reflecting facets, and an analyser then determines properties of a sample disposed between the first and second opposing reflectors from the detected spectral properties.

    Measurements using systems having multiple spectrometers

    公开(公告)号:US11714004B2

    公开(公告)日:2023-08-01

    申请号:US17289299

    申请日:2019-11-13

    CPC classification number: G01J3/42 G01J3/0272 G01J2003/425

    Abstract: An example system includes a first spectrometer, a second spectrometer, and an electronic control device communicatively coupled to the first spectrometer and the second spectrometer. The first spectrometer is operable to emit first light using a first light source towards a sample region between the first spectrometer and the second spectrometer. The first spectrometer is also operable to measure first reflected light reflected using a first photodetector from an object in the sample region. The second spectrometer is operable to measure first transmitted light transmitted through the object using a second photodetector. The electronic control device is operable to determine, based on at least one of the measured first reflected light or the measured first transmitted light, a spectral distribution of light corresponding to the object.

    SPECTROSCOPIC EVALUATION OF EDIBLE OIL USING PROFILES

    公开(公告)号:US20230168234A1

    公开(公告)日:2023-06-01

    申请号:US18153665

    申请日:2023-01-12

    Abstract: A characteristic of edible oil may be evaluated using a spectrometer. For example, optical reflectance data may be obtained from edible oil in situ in a frying apparatus housing the edible oil, the reflectance data corresponding to a specified range of infra-red wavelengths. A model profile corresponding to the characteristic being assessed may be obtained, such as from a repository housing a secured library of such profiles. The model profile may define a regression vector for use in transforming the reflectance data to generate a value corresponding to the characteristic being assessed. A criterion may be applied to the value to establish a simplified representation of the characteristic for presentation to a user for assessment of oil quality.

    Mid-infrared scanning system that differentiates between specular and diffuse scattering
    49.
    发明授权
    Mid-infrared scanning system that differentiates between specular and diffuse scattering 有权
    中红外扫描系统,区分镜面和漫反射

    公开(公告)号:US09546905B1

    公开(公告)日:2017-01-17

    申请号:US14683841

    申请日:2015-04-10

    Abstract: A method and apparatus for measuring diffuse and specularly reflected light from a sample to provide a reflection spectrum as a function of wavelength and as a function of position on a sample is disclosed. The apparatus includes a MIR light source that generates an illumination beam of linearly polarized light. An illumination system illuminates a location on a specimen with part of the illumination beam. A linear polarization filter characterized by a polarization axis that defines a direction of polarization of linearly polarized light that is reflected by the linear polarization filter, a first detector that measures an intensity of light leaving the linear polarization filter and a light collection system collects light reflected from the location on the specimen and directs that light to the linear polarization filter. A controller measures an output from the first detector for each of a plurality of different polarization axis positions.

    Abstract translation: 公开了一种用于测量来自样品的漫反射和反射光的方法和装置,以提供作为波长的函数的反射光谱和作为样品上位置的函数的函数。 该装置包括产生线性偏振光的照明光束的MIR光源。 照明系统用部分照明光束照射样本上的位置。 线性偏振滤光器,其特征在于限定由线偏振滤光器反射的线偏振光的偏振方向的偏振轴,测量离开线偏振滤光器的光的强度的第一检测器,以及光收集系统收集反射的光 从样品上的位置引导光线到线偏振滤光片。 控制器针对多个不同的偏振轴位置中的每一个测量来自第一检测器的输出。

    Optical Metrology With Reduced Focus Error Sensitivity
    50.
    发明申请
    Optical Metrology With Reduced Focus Error Sensitivity 有权
    光学测量与聚焦误差灵敏度降低

    公开(公告)号:US20160245741A1

    公开(公告)日:2016-08-25

    申请号:US14833370

    申请日:2015-08-24

    Abstract: Methods and systems for performing broadband spectroscopic metrology with reduced sensitivity to focus errors are presented herein. Significant reductions in sensitivity to focus position error are achieved by imaging the measurement spot onto the detector such that the direction aligned with the plane of incidence on the wafer surface is oriented perpendicular to the direction of wavelength dispersion on the detector surface. This reduction in focus error sensitivity enables reduced focus accuracy and repeatability requirements, faster focus times, and reduced sensitivity to wavelength errors without compromising measurement accuracy. In a further aspect, the dimension of illumination field projected on the wafer plane in the direction perpendicular to the plane of incidence is adjusted to optimize the resulting measurement accuracy and speed based on the nature of target under measurement.

    Abstract translation: 本文介绍了对聚焦误差灵敏度降低的宽带光谱测量方法和系统。 通过将测量点成像到检测器上来实现对聚焦位置误差的敏感性的显着降低,使得与晶片表面上的入射平面对准的方向定向为垂直于检测器表面上的波长色散的方向。 聚焦误差灵敏度的降低可以降低聚焦精度和重复性要求,更快的聚焦时间,降低对波长误差的灵敏度,而不会影响测量精度。 在另一方面,调整在垂直于入射平面的方向上投射在晶片平面上的照明场的尺寸,以根据测量目标的性质优化所得到的测量精度和速度。

Patent Agency Ranking