APPARATUS FOR ILLUMINATING THE SURFACE OF A MATERIAL
    55.
    发明申请
    APPARATUS FOR ILLUMINATING THE SURFACE OF A MATERIAL 审中-公开
    用于照射材料表面的装置

    公开(公告)号:US20150285681A1

    公开(公告)日:2015-10-08

    申请号:US14438183

    申请日:2013-10-23

    Abstract: An apparatus for illuminating the surface of a material, comprising an illuminating device for illuminating the surface of the material with a calibrating light, a recording device for recording a measuring light, emitted by the surface of the material in response to the calibrating light, and a processor device for recording the spectral characteristic of the measuring light that characterizes a diffuse spectral reflectance of the surface of the material, wherein the illuminating device is configured to generate an illuminating light for illuminating the surface of the material that has a spectral characteristic that corresponds to the spectral characteristic of the measuring light.

    Abstract translation: 一种用于照射材料表面的装置,包括用校准光照射材料表面的照明装置,用于记录由材料的表面响应于校准光发射的测量光的记录装置,以及 用于记录表征材料表面的漫反射光谱反射率的测量光的光谱特性的处理器装置,其中所述照明装置被配置为产生用于照射具有对应于所述材料的光谱特性的材料的表面的照明光 到测量光的光谱特性。

    ACQUIRING A RAMAN SPECTRUM WITH MULTIPLE LASERS
    56.
    发明申请
    ACQUIRING A RAMAN SPECTRUM WITH MULTIPLE LASERS 有权
    获得具有多个激光的拉曼光谱

    公开(公告)号:US20150226607A1

    公开(公告)日:2015-08-13

    申请号:US14179200

    申请日:2014-02-12

    CPC classification number: G01J3/10 G01J3/027 G01J3/44 G01N21/65

    Abstract: A spectrometer is provided for acquiring a Raman spectrum from a sample. The spectrometer includes a first laser, a second laser, a detector and a processing device. The first laser is adapted to produce a first laser beam for generating first Raman spectra from the sample. The second laser is adapted to produce a second laser beam for generating second Raman spectra from the sample. The detector is adapted to collect the first Raman spectra and the second Raman spectra. The processing device is adapted to process the collected first and second Raman spectra to provide the Raman spectrum.

    Abstract translation: 提供了一种用于从样品中获取拉曼光谱的光谱仪。 光谱仪包括第一激光器,第二激光器,检测器和处理装置。 第一激光器适于产生用于从样品产生第一拉曼光谱的第一激光束。 第二激光器适于产生用于从样品产生第二拉曼光谱的第二激光束。 检测器适于收集第一拉曼光谱和第二拉曼光谱。 处理装置适于处理所收集的第一和第二拉曼光谱以提供拉曼光谱。

    Terahertz spectrometry device and method, and nonlinear optical crystal inspection device and method
    57.
    发明授权
    Terahertz spectrometry device and method, and nonlinear optical crystal inspection device and method 有权
    太赫兹光谱仪器及方法,以及非线性光学晶体检测装置及方法

    公开(公告)号:US09091665B2

    公开(公告)日:2015-07-28

    申请号:US13975502

    申请日:2013-08-26

    Applicant: ARKRAY, Inc.

    Inventor: Shigeru Kitamura

    Abstract: When light beams of two different wavelengths applied from an excitation light source are made incident on a nonlinear optical crystal having a unique nonlinear coefficient, the nonlinear optical crystal generates THz waves resulting from difference frequency generation according to the nonlinear coefficient that the crystal itself has and SHG waves in which the light beams of two different wavelengths have been wavelength converted in accordance with the nonlinear coefficient. The generated THz waves pass through or are reflected from a sample and are detected by a THz detector. The SHG waves are detected by a SHG detector. A control unit acquires THz measurement values T from the THz detector, acquires SHG measurement values S from the SHG detector, and uses baseline THz measurement values TB and baseline SHG measurement values SB acquired without the sample to perform baseline correction using (T/S)/(TB/SB).

    Abstract translation: 当从激发光源施加的两种不同波长的光束入射到具有独特非线性系数的非线性光学晶体上时,非线性光学晶体根据晶体本身具有的非线性系数产生由差频产生产生的太赫兹波, 两个不同波长的光束根据非线性系数进行波长转换的SHG波。 所产生的太赫兹波通过或被从样本反射并被THz检测器检测。 SHG波检测器由SHG检测器检测。 控制单元从THz检测器获取THz测量值T,从SHG检测器获取SHG测量值S,并且使用基准THz测量值TB和没有样本获取的基线SHG测量值SB来执行基线校正(T / S) /(TB / SB)。

    STANDARDIZING FLUORESCENCE MICROSCOPY SYSTEMS
    58.
    发明申请
    STANDARDIZING FLUORESCENCE MICROSCOPY SYSTEMS 有权
    标准化荧光显微系统

    公开(公告)号:US20150204784A1

    公开(公告)日:2015-07-23

    申请号:US14586337

    申请日:2014-12-30

    Abstract: Systems and methods for standardizing one or more fluorescence scanning instruments to a reference system by separating the effects of drift and normalization. In an embodiment, a drift image comprising an image of a drift reference slide is captured by a system to be standardized. A drift measurement is calculated using the drift image. A first normalization image comprising an image of a normalization slide is also captured by the system to be standardized. A reference normalization image, also comprising an image of the normalization slide, is captured by a reference system. The first normalization image is compared to the reference normalization image to determine a gamma value and offset value for the system to be standardized.

    Abstract translation: 通过分离漂移和归一化的影响将一个或多个荧光扫描仪器标准化到参考系统的系统和方法。 在一个实施例中,包括漂移参考滑块的图像的漂移图像由待标准化的系统捕获。 使用漂移图像计算漂移测量。 包括标准化幻灯片的图像的第一标准化图像也被要标准化的系统捕获。 还包括归一化幻灯片的图像的参考归一化图像由参考系统捕获。 将第一归一化图像与参考归一化图像进行比较,以确定要标准化的系统的伽马值和偏移值。

    MICROSCOPE SYSTEM
    60.
    发明申请
    MICROSCOPE SYSTEM 有权
    微观系统

    公开(公告)号:US20150145982A1

    公开(公告)日:2015-05-28

    申请号:US14539005

    申请日:2014-11-12

    Inventor: Masashi OKABE

    Abstract: Provided is a microscope system including a microscope provided with a multi-channel image-acquisition unit that acquires images of a specimen at respective wavelengths; an adjustment-method storage portion that stores, for respective channels, contrast adjusting methods for the images acquired by the image-acquisition unit; and a contrast adjusting portion that adjusts, for the respective channels, contrasts of the images acquired by the image-acquisition unit based on the contrast adjusting methods stored in the adjustment-method storage portion.

    Abstract translation: 本发明提供一种显微镜系统,其具备:显微镜,其具备拍摄各波长的试样的图像的多通道图像获取部; 调整方法存储部分,针对各个通道存储由图像获取单元获取的图像的对比度调整方法; 以及对比度调整部,其基于存储在调整方法存储部中的对比度调整方法,对各个声道调整由图像获取部获取的图像的对比度。

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