公开(公告)号：US20150241612A1

公开(公告)日：2015-08-27

申请号：US14426389

申请日：2013-09-05

Applicant: VAISALA OYJ

Inventor： Hannu Talvitie ,  Jukka Korhonen ,  Martti Blomberg

IPC: G02B5/22 ,  G01J5/10 ,  F21V7/10 ,  G01J5/08

CPC classification number: G02B5/22 ,  F21V7/10 ,  G01J3/108 ,  G01J5/024 ,  G01J5/048 ,  G01J5/0809 ,  G01J5/10 ,  G01J5/20 ,  G01J2005/103 ,  H01L51/5271 ,  H01L51/529 ,  H05B3/84 ,  H05B2203/013

Abstract: The present publication describes a heat-resistant optical layered structure, a manufacturing method for a layered structure, and the use of a layered structure as a detector, emitter, and reflecting surface. The layered structure comprises a reflecting layer, an optical structure on top of the reflecting layer, and preferably shielding layers for shielding the reflecting layer and the optical structure. According to the invention, the optical structure on top of the reflecting layer comprises at least one partially transparent layer, which is optically fitted at a distance to the reflecting layer.

Abstract translation: 本公开描述了耐热光学层叠结构，层状结构的制造方法，以及层叠结构作为检测器，发射体和反射面的用途。 层状结构包括反射层，反射层顶部的光学结构，优选用于屏蔽反射层和光学结构的屏蔽层。 根据本发明，反射层顶部的光学结构包括至少一个部分透明的层，其在与反射层一定距离的光学上被配合。

公开(公告)号：US09116116B2

公开(公告)日：2015-08-25

申请号：US12935155

申请日：2009-03-27

Applicant: Juichiro Ukon ,  Takuya Ido ,  Susumu Mimura

Inventor： Juichiro Ukon ,  Takuya Ido ,  Susumu Mimura

IPC: H01S5/024 ,  H01S5/068 ,  G01N21/39 ,  G01J3/10 ,  G01N21/3504 ,  G01N21/77 ,  H01S5/022 ,  H01S5/062 ,  H01S5/0687

CPC classification number: G01N21/39 ,  G01J3/108 ,  G01N21/3504 ,  G01N21/7703 ,  G01N2201/0231 ,  H01S5/02248 ,  H01S5/024 ,  H01S5/02415 ,  H01S5/06213 ,  H01S5/0687

Abstract: Provided is an optical analyzer which can promote enhancement of measurement sensitivity, cost reduction, size reduction, structural flexibility, disturbance resistance, and the like, at the same time. A laser device to be used in such optical analyzer is also provided. An optical analyzer comprises a laser light source (2); a wavelength selection element (3) for selecting and leading out light having a wavelength substantially equal to the absorption wavelength of an analysis object from among light outputted from the laser light source (2); an optical detection means (5) for detecting the intensity of light red out from the wavelength selection element (3); and a drive current control means (6) for increasing or decreasing the drive current of the laser light source (2) near a specified current value thereof for outputting light of the absorption wavelength, and setting the drive current at such a current value as the intensity of light detected by the optical detection means (5) has a peak value. The laser light source (2), the wavelength selection element (3), and the optical detection means (5) are mounted on a single substrate (11) which can regulate the temperature to a constant level.

Abstract translation: 提供了能够同时提高测量灵敏度，降低成本，降低尺寸，结构灵活性，抗干扰性等的光学分析仪。 还提供了用于这种光学分析仪的激光装置。 光学分析仪包括激光光源（2）; 波长选择元件（3），用于从激光源（2）输出的光中选择并引出具有与分析对象的吸收波长大致相同的波长的光; 用于检测从波长选择元件（3）发出的红光强度的光学检测装置（5）。 以及驱动电流控制装置（6），用于增加或减少靠近其规定电流值的激光光源（2）的驱动电流，用于输出吸收波长的光，并将驱动电流设定为如 由光检测装置（5）检测到的光的强度具有峰值。 激光光源（2），波长选择元件（3）和光学检测装置（5）安装在能够将温度调节到恒定水平的单个基板（11）上。

公开(公告)号：US20150192467A1

公开(公告)日：2015-07-09

申请号：US14417968

申请日：2013-08-01

Applicant: INSTITUT NATIONAL DE LA RECHERCHE SCIENTIFIQUE

Inventor： Gargi Sharma ,  Kanwarpal Singh ,  Roberto Morandotti ,  Tsuneyuki Ozaki

IPC: G01J3/45 ,  G01J3/10

CPC classification number: G01J3/45 ,  G01J3/108 ,  G01J3/453 ,  G01J11/00

Abstract: A method and system based on spectral domain interferometry for detecting intense THz electric field, allowing the use of thick crystal for spectroscopic purposes, in order to makes long temporal scans for increased spectral resolutions, and overcoming the limitation of over-rotation for presently available high power THz sources. Using this method and system the phase difference of approximately 8898π can be measured, which is 18000 times higher than the phase difference measured by electro-optic sampling (π/2).

Abstract translation: 一种基于频域干涉测量的方法和系统，用于检测强烈的THz电场，允许使用厚晶体进行光谱目的，以便对增加的光谱分辨率进行长时间扫描，并克服当前可用高度的过度旋转的限制 功率太赫兹源。 使用这种方法和系统，相位差约为8898＆pgr; 可以测量，比通过电光采样（＆pgr / 2）测量的相位差高18000倍。

公开(公告)号：US20150190061A1

公开(公告)日：2015-07-09

申请号：US14590703

申请日：2015-01-06

Applicant: Anuradha Godavarty ,  Youngjin Jung

Inventor： Anuradha Godavarty ,  Youngjin Jung

IPC: A61B5/02 ,  A61B5/00 ,  A61B5/024 ,  A61B5/1455 ,  A61B5/06

CPC classification number: A61B5/02028 ,  A61B5/0059 ,  A61B5/02416 ,  A61B5/065 ,  A61B5/14551 ,  A61B5/7207 ,  A61B5/742 ,  A61B2560/0431 ,  G01J3/0264 ,  G01J3/0272 ,  G01J3/108 ,  G01J3/2823 ,  G01N2021/3155 ,  G01N2201/0221

Abstract: The present application describes techniques to image biological tissue to determine biological information of an imaged tissue sample such as changes in hemoglobin concentrations, blood flow rate (pulse), and/or spatio-temporal features. Embodiments include illuminating the tissue sample with light in the near-infrared (NIR) spectrum, which is minimally absorbed but scattered through the tissue sample. By detecting the NIR light that is attenuated through, transmitted through, and/or reflected off the tissue to be imaged, the resulting NIR intensity signals may be further analyzed to provide this data. Embodiments include using multiple NIR light sources having varying wavelengths to obtain changes in the oxy- and deoxy-hemoglobin concentrations of the imaged tissue region. The tissue sample may be imaged over a time period, and the NIR images may be viewed statically or in real time after post-processing analyses have been performed.

Abstract translation: 本申请描述了用于图像生物组织以确定成像组织样品的生物学信息的技术，例如血红蛋白浓度，血流速率（脉搏）和/或时空特征的变化。 实施例包括用近红外（NIR）光谱中的光来照射组织样本，其被最小限度地吸收但散射穿过组织样本。 通过检测被成像的组织衰减，透射和/或反射的NIR光，可以进一步分析所得的NIR强度信号以提供该数据。 实施方案包括使用具有变化波长的多个NIR光源以获得成像组织区域的氧和血红蛋白浓度的变化。 可以在一段时间内对组织样本进行成像，并且可以在执行后处理分析之后静态地或实时地观看NIR图像。

公开(公告)号：US09077146B2

公开(公告)日：2015-07-07

申请号：US14186171

申请日：2014-02-21

Applicant: OMNI MEDSCI, INC.

Inventor： Mohammed N. Islam

IPC: G02B6/00 ,  H01S5/10 ,  H01S3/30 ,  G01J3/10 ,  G01B9/02 ,  G01J3/02 ,  H01S5/00 ,  H01S5/14 ,  G02F1/35 ,  H01S3/067 ,  H01S3/094 ,  H01S3/102

CPC classification number: G01J3/108 ,  G01B9/02091 ,  G01J3/0218 ,  G01J3/0245 ,  G01J3/42 ,  G01J2003/102 ,  G01J2003/423 ,  G02B6/29349 ,  G02F1/365 ,  G02F2001/3528 ,  G02F2202/32 ,  H01S3/06725 ,  H01S3/06754 ,  H01S3/094007 ,  H01S3/094069 ,  H01S3/094076 ,  H01S3/1024 ,  H01S3/302 ,  H01S5/0064 ,  H01S5/0085 ,  H01S5/0092 ,  H01S5/1092 ,  H01S5/146 ,  H01S5/4012 ,  H01S2301/085

Abstract: An optical system for use in material processing includes a plurality of semiconductor diodes coupled to a beam combiner to generate a multiplexed optical beam. A cladding pumped fiber amplifier or laser receives the multiplexed optical beam and forms an intermediate beam having at least a first wavelength. An optical element receives the intermediate beam and forms an output beam with an output beam wavelength, wherein the output beam wavelength is at least in part longer than the first wavelength. A subsystem includes lenses or mirrors to deliver a delivered portion of the output beam to a sample. The delivered output beam has a temporal duration greater than about 30 picoseconds, a repetition rate between continuous wave and Megahertz or higher, and a time averaged intensity of less than approximately 50 MW/cm2. The output beam has a time averaged output power of 20 mW or more.

Abstract translation: 用于材料处理的光学系统包括耦合到光束组合器的多个半导体二极管以产生多路复用的光束。 包层泵浦光纤放大器或激光器接收复用的光束并形成具有至少第一波长的中间光束。 光学元件接收中间光束并形成具有输出光束波长的输出光束，其中输出光束波长至少部分地长于第一波长。 子系统包括透镜或反射镜，用于将输出光束的传送部分传送到样品。 所输出的输出光束具有大于约30皮秒的时间持续时间，连续波和兆赫兹或更高之间的重复频率以及小于约50MW / cm 2的时间平均强度。 输出光束的时间平均输出功率为20mW以上。

公开(公告)号：US09074930B2

公开(公告)日：2015-07-07

申请号：US14220313

申请日：2014-03-20

Applicant: SICK AG

Inventor： Jurgen Kaufmann ,  Thomas Beyer ,  Julian Edler

IPC: G01J3/10 ,  G01J1/42 ,  G01J3/42 ,  G01J3/02

CPC classification number: G01J3/108 ,  G01J1/4257 ,  G01J3/0229 ,  G01J3/42

Abstract: A spectrometer has a first and second light sources (12, 14) which generate light radiation (24) in a first and second wavelength ranges, and a mirror unit (16) for deflecting the light radiation (24, 26) into a measurement path (18), arranged so that the radiation of both wavelength ranges (24, 26) runs through on the same optical path. A detector (20) detects radiation (24, 26) running through the measurement path (18) and an evaluation unit (22) evaluates the radiation (24, 26) incident at the detector (20) and for determining a concentration of a measurement gas component present in the measurement path (18). The mirror unit (16) is configured as a micromirror array (32) and that a single micromirror (34) only deflects a portion of the radiation (24, 26).

Abstract translation: 光谱仪具有在第一和第二波长范围内产生光辐射（24）的第一和第二光源（12,14）和用于将光辐射（24,26）偏转成测量路径的反射镜单元（16） （18），布置成使得两个波长范围（24,26）的辐射在相同的光路上延伸。 检测器（20）检测穿过测量路径（18）的辐射（24,26），并且评估单元（22）评估入射在检测器（20）处的辐射（24,26），并且用于确定测量的浓度 存在于测量路径（18）中的气体成分。 镜单元（16）被配置为微镜阵列（32），并且单个微反射镜（34）仅偏转一部分辐射（24,26）。

公开(公告)号：US09052274B2

公开(公告)日：2015-06-09

申请号：US14282842

申请日：2014-05-20

Applicant: Siemens Aktiengesellschaft

Inventor： Daniel Depenheuer

IPC: G01N21/25 ,  G01J3/26 ,  G01J3/42 ,  G01N21/39 ,  G01J3/28 ,  G01N21/85

CPC classification number: G01N21/255 ,  G01J3/0286 ,  G01J3/10 ,  G01J3/108 ,  G01J3/26 ,  G01J3/28 ,  G01J3/42 ,  G01N21/39 ,  G01N21/85

Abstract: A method for operating a laser spectrometer includes passing light of a semiconductor laser through a gas mixture containing a gas component and through an etalon structure onto a detector. The method also includes varying an injection current of the laser based on a predefined current-time function in order to tune the wavelength of the laser in a tuning range using a specific absorption line of the gas component. The method further includes modulating the function with a modulation signal having a frequency and alternately a first modulation amplitude and a second modulation amplitude. The method also includes evaluating a detector signal generated by the detector for determining (1) the concentration of the gas component upon the modulation with the first modulation amplitude and (2) the wavelength stabilization of the laser upon the modulation with the second modulation amplitude at the second harmonic of the frequency.

Abstract translation: 用于操作激光光谱仪的方法包括将半导体激光器的光通过含有气体成分的气体混合物并通过标准具结构传递到检测器上。 该方法还包括基于预定的电流 - 时间函数来改变激光器的注入电流，以便使用气体成分的特定吸收线在调谐范围内调节激光器的波长。 该方法还包括利用具有频率和交替地第一调制幅度和第二调制幅度的调制信号调制该功能。 该方法还包括评估由检测器产生的检测器信号，用于确定（1）在具有第一调制幅度的调制时气体成分的浓度，以及（2）在具有第二调制幅度的调制时激光器的波长稳定 频率的二次谐波。

公开(公告)号：US20150138629A1

公开(公告)日：2015-05-21

申请号：US14506278

申请日：2014-10-03

Applicant: SPECTRAL MOLECULAR IMAGING, INC.

Inventor： Andreas G. NOWAZYK

IPC: G02F1/39

CPC classification number: G02F1/39 ,  G01J3/0264 ,  G01J3/108 ,  G01N21/27 ,  G01N21/64 ,  G01N21/645 ,  G01N2201/123 ,  G02B21/0096 ,  G02F2001/392 ,  H03F3/08 ,  H03F7/00

Abstract: A solid state detection system includes a degenerate photo-parametric amplifier (PPA), wherein the PPA comprises a photo diode, and a periodically pulsed light source, wherein the photo-parametric, amplifier (PPA) is synchronized to the pulsed light source with a phase locked loop that generates a pump waveform for the PPA at twice the frequency of the excitation pulse rate.

Abstract translation: 固态检测系统包括退化光参数放大器（PPA），其中PPA包括光电二极管和周期性脉冲光源，其中光参量放大器（PPA）与脉冲光源同步 锁相环，以激励脉冲频率的两倍产生PPA的泵浦波形。

公开(公告)号：US09029816B2

公开(公告)日：2015-05-12

申请号：US14362948

申请日：2012-12-14

Applicant: Koninklijke Philips N.V.

Inventor： James Torrance Russell

IPC: G21G4/00 ,  A61N5/06 ,  G01J3/10 ,  H05G2/00 ,  G01N21/3504 ,  G01J3/02 ,  A61M16/10

CPC classification number: G01J3/108 ,  A61M2016/102 ,  G01J3/0216 ,  G01N21/3504

Abstract: A source assembly (48) configured to generate infrared electromagnetic radiation includes an emitter (60) that emits electromagnetic radiation over an emission solid angle. A portion of the emitted electromagnetic radiation is used in a detection. The portion of the user electromagnetic radiation surrounds the optical path in a usable solid angle. Electromagnetic radiation outside of the usable solid angle is focused back by a reflection assembly (64) onto the emitter to enhance the efficiency of the emitter.

Abstract translation: 被配置为产生红外电磁辐射的源组件（48）包括发射器（60），其发射在发射立体角上的电磁辐射。 发射的电磁辐射的一部分用于检测。 用户电磁辐射的部分以可用的立体角度围绕光路。 可用立体角之外的电磁辐射由反射组件（64）聚焦到发射器上以提高发射器的效率。

公开(公告)号：US20150123016A1

公开(公告)日：2015-05-07

申请号：US14398205

申请日：2013-03-12

Applicant: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.

Inventor： Yoshiharu Nagatani ,  Yoshifumi Watabe ,  Koji Tsuji ,  Masao Kirihara ,  Takaaki Yoshihara ,  Hirotaka Matsunami

IPC: G21K5/02

CPC classification number: G21K5/02 ,  G01J3/10 ,  G01J3/108 ,  H05B3/143 ,  H05B3/265 ,  H05B2203/016 ,  H05B2203/032

Abstract: An infrared radiation element includes: a first insulating layer having heat insulating properties and electrically insulating properties; a heating element layer provided on the first insulating layer and configured to radiate infrared radiation when energized; and a second insulating layer provided on an opposite side of the heating element layer from the first insulating layer and having heat insulating properties and electrically insulating properties. The second insulating layer transmits the infrared radiation radiated from the heating element layer. The heating element layer has such a sheet resistance that impedance of the heating element layer matches impedance of space which is in contact with the second insulating layer.

Abstract translation: 红外辐射元件包括：具有隔热性能和电绝缘性能的第一绝缘层; 加热元件层，设置在所述第一绝缘层上并且被配置为在通电时辐射红外辐射; 以及第二绝缘层，其设置在所述加热元件层的与所述第一绝缘层相反的一侧，并具有隔热性能和电绝缘性能。 第二绝缘层透射从加热元件层辐射的红外线辐射。 加热元件层具有这样的薄层电阻，即加热元件层的阻抗与与第二绝缘层接触的空间的阻抗匹配。