Abstract:
Methods and apparatus for accessing a high speed signal routed on a conductive trace on an internal layer of a printed circuit board (PCB) using high density interconnect (HDI technology) are provided. The conductive trace may be coupled to a microvia (μVia) having a conductive dome disposed above the outer layer pad of the μVia. In-circuit test (ICT) fixtures or high speed test probes may interface with the conductive dome to test the high speed signal with decreased reflection loss and other parasitic effects when compared to conventional test points utilizing plated through-hole (PTH) technology.
Abstract:
A wiring board including a plated through hole formed in the wiring board; a test plated through hole or a test via hole provided in the surrounding area of the plated through hole to check a processing state related to the plated through hole; and a conductive pattern used to electrically connect the plated through hole to the test through hole or the test via hole.
Abstract:
A memory module includes a memory chip MC1 disposed at a position opposite to a memory buffer via a module substrate, a memory chip MC3 disposed at a position not opposite to the memory buffer via the module substrate, and a memory chip MC11 disposed at a position opposite to the memory chip MC3 via the module substrate. A branch point at which a wiring part connected to the memory chip MC1 and a wiring part connected to the memory chips MC3 and MC11 are branched is positioned at the memory buffer side from the viewpoint of the intermediate point between the planar mounting position of the memory buffer and the planar mounting position of the memory chips MC3 and MC11. Accordingly, the wiring length of the wiring part can be made sufficiently short.
Abstract:
The interposer includes a glass substrate 46 with first through-electrodes 47 buried in; a plurality of resin layers 68, 20, 32 supported by the glass substrate; thin film capacitors 18a, 18b buried between a first resin layer 68 of the plural resin layers and a second resin layer 20 of the plural resin layers and including the first capacitor electrodes 12a, 12b, the second capacitor electrodes 16 opposed to the first capacitor electrodes 12a, 12b, and a dielectric thin film 14 of a relative dielectric constant of 200 or above formed between the first capacitor electrode 12a, 12b and the second capacitor electrode 16, and the second through-electrodes 77a, 77b penetrating the plural resin layers 68, 20, 32, electrically connected to the first through-electrode 47 and electrically connected to the first capacitor electrode 12a, 12b or the second capacitor electrode 16.
Abstract:
A multi-layer printed wiring board has a core substrate, a throughhole structure, a first interlayer insulation layer, a first via, a second interlayer insulation layer and a second via. The core substrate has a throughhole opening, and the throughhole structure is formed in the throughhole opening. The first interlayer insulation layer is formed over the core substrate. The first via is formed in the first interlayer insulation layer and has a bottom portion having a first radius. The second interlayer insulation layer is formed over the first interlayer insulation layer and the first via. The second via is formed in the second interlayer insulation layer and has a bottom portion having a second radius greater than the first radius. The first via is positioned inside a circle having a radius (D1) from a gravity center of the throughhole opening, and the radius (D1) of the circle satisfies a formula, (D1)=(R)+(r)/3, where (R) represents a radius of the throughhole opening and (r) represents the first radius of the first via.
Abstract:
In the preferred embodiment, there is disclosed a printed circuit board having a surface providing a mating interface to which is electrically connected an electrical connector having signal conductors and ground conductors. The printed circuit board includes a plurality of stacked dielectric layers, with a conductor disposed on at least one of the plurality of dielectric layers. The mating interface includes a plurality of conductive vias aligned in a plurality of rows, with the plurality of conductive vias extending through at least a portion of the plurality of dielectric layers, at least one of the plurality of conductive vias intersecting the conductor. The plurality of conductive vias includes signal conductor connecting conductive vias and ground conductor connecting conductive vias. For each of the plurality of rows of the conductive vias, there are at least twice as many ground conductor connecting conductive vias as signal conductor connecting conductive vias and the conductive vias are positioned relative to one another so that for each signal conductor connecting conductive via, there are ground conductor connecting conductive vias adjacent either side of the signal conductor connecting conductive via.
Abstract:
A method for routing vias in a multilayer substrate is disclosed. One embodiment of a method may comprise providing a multilayer substrate with an internal bond surface having a plurality of internal bond pads and an external bond surface with a plurality of external bond pads. A plurality of power vias and ground vias may be routed from a first redistribution layer between the internal bond surface and the external bond surface to a second redistribution layer between the first redistribution layer and the external bond surface based on a via pattern. The via pattern may comprise routing a power via and a ground via adjacent one another spaced apart at a distance that is substantially equal to a minimum routing pitch associated with the multilayer substrate.
Abstract:
A multilayer substrate having a bonding surface is disclosed. One embodiment of the substrate may comprise a bypass capacitor connection pad disposed on the bonding surface. The bypass capacitor connection pad may have a bypass capacitor power pad and a bypass capacitor ground pad. The substrate may also comprise a plurality of power vias routed from the bypass capacitor power pad to a first redistribution layer spaced apart from the bonding surface and a plurality of ground vias routed from the bypass capacitor ground pad to the first redistribution layer. The substrate may further comprise a plurality of power and ground vias routed from the first redistribution layer to a second redistribution layer according to a power and ground via pattern array, wherein the plurality of ground vias are jogged at the first redistribution layer to the plurality of power vias to form the power and ground via pattern array.
Abstract:
A high-speed signal transmission structure having parallel disposed and serially connected vias is disclosed. The structure is applicable to a multi-layered circuit board such as a high-speed digital circuit board for forming a high-speed signal transmission circuit on the high-speed digital circuit board. The structure includes a pair of parallel disposed and serially connected vias for connecting an upper conductive circuit installed on an upper layer of the multi-layered circuit board and a lower conductive circuit installed on a lower layer of the multi-layered circuit board. Compared with the prior art, an open stub formed by the remaining portion of the vias has become shorter, thereby reducing a resonance effect affecting the quality of signal transmission.
Abstract:
An apparatus and associated method for analyzing a communications link between two components on a common PCB. The communications link has a pair of through-board conductors connected by a first conductive etching on one side of the PCB. The communications link further has second etchings on an opposite side of the PCB respectively connecting each of the through-board conductors to one of the components.