Optical Wavelength Measurement Apparatus and Method, Optical Wavelength Control Device, and Light Emitting System

    公开(公告)号:US20240295437A1

    公开(公告)日:2024-09-05

    申请号:US18647506

    申请日:2024-04-26

    Inventor: Lei Zhou

    CPC classification number: G01J3/28 G01J3/0224 G01J3/0237 H01S3/1305

    Abstract: An optical wavelength measurement apparatus and method may be used to expand a wavelength range that can be detected by using an optical wavelength measurement technology. The measurement apparatus may respectively superimpose to-be-measured light with optical components that are in an optical frequency comb and that correspond to each of a plurality of comb frequency values, to obtain a multiplexed optical signal corresponding to each optical component, and then determine a measured value of a wavelength of the to-be-measured light based on an electrical signal of a multiplexed optical signal corresponding to a target optical component obtained by an electrical beat frequency. The electrical signal corresponding to the target optical component includes a beat frequency signal.

    Sensing device and method for manufacturing the same

    公开(公告)号:US20240255351A1

    公开(公告)日:2024-08-01

    申请号:US18410338

    申请日:2024-01-11

    CPC classification number: G01J3/2803 H10N19/00

    Abstract: The present disclosure provides a sensing device and a method for manufacturing the same. The method for manufacturing the sensing device includes the following steps: providing a first temporary substrate, wherein the first temporary substrate includes: a first carrier; a first substrate disposed on the first carrier; and a plurality of sensing elements disposed on the first substrate; providing a second temporary substrate, wherein the second temporary substrate includes: a second carrier; and a second substrate disposed on the second carrier; assembling the first temporary substrate and the second temporary substrate to bond the first substrate and the second substrate; removing the first carrier and disposing the first substrate on a supporting film; and removing the second carrier, wherein the first substrate and the second substrate are respectively a flexible substrate.

    Optical sensor device
    58.
    发明授权

    公开(公告)号:US12050129B2

    公开(公告)日:2024-07-30

    申请号:US18343015

    申请日:2023-06-28

    CPC classification number: G01J3/28 G01J3/0229

    Abstract: An optical sensor device may comprise an optical sensor comprising a set of sensor elements; an optical filter comprising one or more channels, wherein each channel, of the one or more channels, is configured to pass light associated with particular wavelengths to a subset of sensor elements, of the set of sensor elements, of the optical sensor; a phase mask configured to distribute a plurality of light beams associated with a subject in an encoded pattern on an input surface of the optical filter; and one or more processors. The one or more processors may be configured to obtain, from the optical sensor, sensor data associated with the subject and determine, based on the sensor data, spectral information associated with the subject. The one or more processors may determine, based on the sensor data and information associated with the encoded pattern, spatial information associated with the subject.

    Spectroscopic analysis device and spectroscopic analysis method

    公开(公告)号:US12050128B2

    公开(公告)日:2024-07-30

    申请号:US17755550

    申请日:2020-10-20

    Abstract: A spectroscopic analysis device (1) according to the present disclosure includes a controller (40) that acquires refractive index information on a sample (S) based on information on a first spectroscopic spectrum in a first wavelength band in which only a resonance spectrum of surface plasmon occurs within a spectroscopic spectrum, determines, based on the acquired refractive index information, an incidence angle of irradiation light (L1) irradiated by an irradiator (10) with respect to a membrane (M) such that the peak wavelength of the resonance spectrum and the peak wavelength of an absorption spectrum of the sample (S) match in a second spectroscopic spectrum in a second wavelength band in which the resonance spectrum and the absorption spectrum occur within the spectroscopic spectrum, and analyzes the state of the sample (S) from information on the second spectroscopic spectrum obtained based on the determined incidence angle.

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