Resin identification device
    64.
    发明授权

    公开(公告)号:US09903760B2

    公开(公告)日:2018-02-27

    申请号:US14989806

    申请日:2016-01-07

    Inventor: Toyohiko Tanaka

    Abstract: A resin identification device capable of measuring samples having various shapes is provided. The resin identification device includes a Fourier transform infrared spectrophotometer (FTIR), and sample placing plates 31 and 32 having an opening 33. The FTIR includes: an infrared light source section 10, irradiating a sample S with infrared light; an infrared light detection section 20, detecting light intensity information of the infrared light reflected from the sample S; and a control section 50, obtaining the light intensity information. By replacement of the sample S in a predetermined position so as to block off the opening 33, the infrared light source section 10 irradiates infrared light on a lower surface of the sample S, and the infrared light detection section 20 detects the light intensity information of the infrared light reflected by the lower surface of the sample S.

    Apparatus and method for measuring reference spectrum for sample analysis, and apparatus and method for analyzing sample

    公开(公告)号:US09885607B2

    公开(公告)日:2018-02-06

    申请号:US15241762

    申请日:2016-08-19

    Inventor: Kun Sun Eom

    Abstract: An apparatus for measuring a reference spectrum includes a parameter adjuster configured to adjust a parameter of a spectroscope so that an intensity of a reflection spectrum of a sample has a value in a range, a reference material spectrum measurer configured to adjust reflectance of a reference material so an intensity of a reflection spectrum of the reference material is not saturated, and measure the reflection spectrum of the reference material, using the spectroscope having the adjusted parameter, a first reference spectrum calculator configured to, in response to the adjusted reflectance of the reference material not being one hundred percent, calculate a first reference spectrum based on the measured reflection spectrum of the reference material, and a second reference spectrum measurer configured to measure a second reference spectrum of the reference material, using the spectroscope having the adjusted parameter, when a light source of the spectroscope is turned off.

    Illumination Device and Reflection Characteristic Measuring Device
    67.
    发明申请
    Illumination Device and Reflection Characteristic Measuring Device 有权
    照明装置和反射特性测量装置

    公开(公告)号:US20160109293A1

    公开(公告)日:2016-04-21

    申请号:US14894821

    申请日:2014-05-15

    Abstract: An illumination device is provided with a light source, a photodetector, and a support structure. The light source, which emits light, has light distribution in which a reference axis serves as an axis of symmetry or light distribution in which a plane including the reference axis serves as a plane of symmetry. A first light beam in the light is guided to the object to be illuminated. A second light beam in the light is guided to the photodetector. The photodetector detects intensity of the second light beam. The light source and the photodetector are supported by the support structure in positions and postures that allow the first light beam and the second light beam to be guided in an aforementioned manner. A traveling direction of the first light beam and a traveling direction of the second light beam make the same angle with the reference axis.

    Abstract translation: 照明装置设置有光源,光电检测器和支撑结构。 发光的光源具有光分布,其中参考轴用作对称轴或光分布,其中包括基准轴的平面用作对称平面。 光中的第一光束被引导到被照明的物体。 光中的第二光束被引导到光电检测器。 光检测器检测第二光束的强度。 光源和光电检测器由支撑结构支撑在允许以上述方式引导第一光束和第二光束的位置和姿势。 第一光束的行进方向和第二光束的行进方向与参考轴线成相同的角度。

    APPARATUS AND METHOD FOR SENSING PARAMETERS USING FIBER BRAGG GRATING (FBG) SENSOR AND COMPARATOR
    68.
    发明申请
    APPARATUS AND METHOD FOR SENSING PARAMETERS USING FIBER BRAGG GRATING (FBG) SENSOR AND COMPARATOR 有权
    使用光纤布拉格光栅(FBG)传感器和比较器传感参数的装置和方法

    公开(公告)号:US20160103017A1

    公开(公告)日:2016-04-14

    申请号:US14513458

    申请日:2014-10-14

    Applicant: Henry H. Hung

    Inventor: Henry H. Hung

    Abstract: Various implementations of an apparatus for sensing one or more parameters are disclosed herein. The apparatus includes a sweeping wavelength laser configured to generate a sweeping wavelength optical signal; an optical fiber including a Fiber Bragg Grating (FBG) structure configured to sense a parameter, wherein the optical fiber is configured to receive the sweeping wavelength optical signal, wherein the FBG structure is configured to produce a reflected optical signal with a particular wavelength in response to the sweeping wavelength optical signal, and wherein the particular wavelength varies as a function of the parameter; a photo detector configured to generate an electrical signal based on the reflected optical signal; a comparator configured to generate a pulse based on a comparison of the electrical signal to a threshold; and a processor configured to generate an indication of the parameter based on the pulse. The comparator may be configured as a Schmitt trigger.

    Abstract translation: 本文公开了用于感测一个或多个参数的装置的各种实施方式。 该装置包括:扫描波长激光器,被配置为产生扫描波长光信号; 包括被配置为感测参数的光纤布拉格光栅(FBG)结构的光纤,其中所述光纤被配置为接收扫描波长光信号,其中所述FBG结构被配置为产生具有特定波长的反射光信号以作出响应 到所述扫描波长光信号,并且其中所述特定波长作为所述参数的函数而变化; 光检测器,被配置为基于所反射的光信号产生电信号; 比较器,被配置为基于电信号与阈值的比较来产生脉冲; 以及处理器,被配置为基于所述脉冲生成所述参数的指示。 比较器可以配置为施密特触发器。

    System and method for compensating for second order diffraction in spectrometer measurements
    69.
    发明授权
    System and method for compensating for second order diffraction in spectrometer measurements 有权
    用于补偿光谱仪测量中二次衍射的系统和方法

    公开(公告)号:US09188486B1

    公开(公告)日:2015-11-17

    申请号:US14456687

    申请日:2014-08-11

    CPC classification number: G01J3/28 G01J3/18 G01J3/42 G01J2003/425

    Abstract: The present invention concerns a system and method for identifying and implementing a correction to spectrometer measurements in order to compensate for errors in the measurement values due to second order diffracted light. The present invention in one configuration, measures light reflectance percentages across the same wavelength range for at least one calibration target. From these measurements the portion of the reflectance values resulting from second order diffracted light is identified and corrected for, thereby generating a compensated measurement of the reflectance values of a sample. These compensated values are then provided to a user.

    Abstract translation: 本发明涉及用于识别和实现对光谱仪测量的校正的系统和方法,以补偿由于二阶衍射光引起的测量值中的误​​差。 本发明在一个结构中,测量至少一个校准目标的相同波长范围的光反射率百分比。 从这些测量中,识别并校正由二级衍射光产生的反射率值的部分,从而产生样品的反射率值的补偿测量。 然后将这些补偿值提供给用户。

    Localized Surface Plasmon Resonance Mercury Detection System and Methods
    70.
    发明申请
    Localized Surface Plasmon Resonance Mercury Detection System and Methods 有权
    局部表面等离子体共振汞检测系统及方法

    公开(公告)号:US20140333933A1

    公开(公告)日:2014-11-13

    申请号:US14368499

    申请日:2013-01-10

    Abstract: A mercury detection system that includes a flow cell having a mercury sensor, a light source and a light detector is provided. The mercury sensor includes a transparent substrate and a submonolayer of mercury absorbing nanoparticles, e.g., gold nanoparticles, on a surface of the substrate. Methods of determining whether mercury is present in a sample using the mercury sensors are also provided. The subject mercury detection systems and methods find use in a variety of different applications, including mercury detecting applications.

    Abstract translation: 提供一种汞检测系统,其包括具有汞传感器,光源和光检测器的流通池。 汞传感器包括透明衬底和在衬底的表面上的汞吸收纳米颗粒例如金纳米颗粒的亚单层。 还提供了使用汞传感器确定汞是否存在于样品中的方法。 主题汞检测系统和方法可用于各种不同的应用,包括汞检测应用。

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