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    Microparticle measuring apparatus
    65.
    发明授权
    Microparticle measuring apparatus 有权
    微粒测量仪

    公开(公告)号：US09429508B2

    公开(公告)日：2016-08-30

    申请号：US14434404

    申请日：2013-08-30

    Applicant: SONY CORPORATION

    Inventor： Taichi Takeuchi ,  Shingo Imanishi

    IPC: G01N15/14 ,  G01N21/53 ,  G01N21/21 ,  G01N21/49 ,  G01N21/47 ,  G01N15/10

    CPC classification number: G01N15/1436 ,  G01N15/1429 ,  G01N15/1434 ,  G01N15/1459 ,  G01N21/21 ,  G01N21/47 ,  G01N21/49 ,  G01N21/53 ,  G01N21/645 ,  G01N2015/0065 ,  G01N2015/1006 ,  G01N2021/6478 ,  G01N2201/06113 ,  G01N2201/0638 ,  G01N2201/0683

    Abstract: A microparticle measuring apparatus for highly accurately detecting the position of a microparticle flowing through a flow channel includes a light irradiation unit for irradiating a microparticle flowing through a flow channel with light, and a scattered light detection unit for detecting scattered light from the microparticle, including an objective lens for collecting light from the microparticle, a light splitting element for dividing the scattered light from the light collected by the objective lens, into first and second scattered light, a first scattered light detector for receiving an S-polarized light component, and an astigmatic element disposed between the light splitting element and the first scattered light detector, and making the first scattered light astigmatic. A relationship between a length L from a rear principal point of the objective lens to a front principal point of the astigmatic element, and a focal length f of the astigmatic element satisfies the following formula I. 1.5f≦L≦2.5f  (I)

    Abstract translation: 用于高精度地检测流过流路的微粒的位置的微粒测量装置包括：用于照射流过流路的微粒的光照射单元，以及用于检测来自微粒的散射光的散射光检测单元，包括 用于收集来自微粒的光的物镜，将从物镜收集的光中散射的光分成第一和第二散射光的分光元件，用于接收S偏振光分量的第一散射光检测器，以及 设置在所述分光元件和所述第一散射光检测器之间的散光元件，以及使所述第一散射光散光。 从物镜的后方主点到散光元件的前方主点的长度L与散光元件的焦距f的关系满足下式I1.5f≤L≤2.5f（I）

    SYSTEM AND METHOD OF EDGE-ILLUMINATION MICROSCOPY
    66.
    发明申请
    SYSTEM AND METHOD OF EDGE-ILLUMINATION MICROSCOPY 审中-公开
    EDGE-ILLUMINATION MICROSCOPY的系统和方法

    公开(公告)号：US20160202462A1

    公开(公告)日：2016-07-14

    申请号：US14914844

    申请日：2014-08-27

    Applicant: IMAGINE OPTIC ,  CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE-CNRS ,  UNIVERSITÉ DE BORDEAUX SEGALEN

    Inventor： Xavier Levecq ,  Virgile Viasnoff ,  Jean-Baptiste Sibarita ,  Vincent Studer ,  Rémi Galland

    IPC: G02B21/06 ,  G01N21/64 ,  G02B27/00 ,  G02B21/16 ,  G02B21/36 ,  G02B21/24

    CPC classification number: G02B21/06 ,  G01N21/6428 ,  G01N21/6458 ,  G01N2201/06113 ,  G01N2201/0638 ,  G01N2201/10 ,  G02B21/16 ,  G02B21/241 ,  G02B21/361 ,  G02B27/0068

    Abstract: According to one aspect, the invention concerns a method for microscopy of a thick sample arranged on a sample support, with edge-illumination of the sample. The method comprises, in particular, emitting at least one illumination beam (1), forming, from the illumination beam, an illumination surface, focusing the illumination surface in the sample by means of a microscope lens (120) and deflecting the illumination surface originating from the microscope lens, in order to form a transverse illumination surface, located in a plane substantially perpendicular to the optical axis of the microscope lens. The method further comprises forming, by means of said microscope lens (120), the image of an area of the sample illuminated by the transverse illumination surface on a detection surface (131) of a detection device (130), scanning the illumination beam, allowing the transverse illumination surface to move along the optical axis of the microscope lens, and superimposing the object imaging surface and the transverse illumination surface, by focusing means comprising means separate from the means for the relative axial movement of the microscope lens and the sample.

    Abstract translation: 根据一个方面，本发明涉及一种用于显微镜检查样品的边缘照明的布置在样品载体上的厚样品的方法。 该方法特别地包括发射至少一个照明光束（1），从照明光束形成照明表面，借助于显微镜（120）将照明表面聚焦在样品中，并使得照明表面发生偏转 从显微镜透镜，以形成横向照明表面，位于基本上垂直于显微镜镜片的光轴的平面内。 该方法还包括通过所述显微镜（120）形成由检测装置（130）的检测表面（131）上的横向照明表面照射的样品的区域的图像，扫描照明光束， 允许横向照明表面沿着显微镜透镜的光轴移动，并且通过聚焦装置叠加物体成像表面和横向照明表面，聚焦装置包括与用于显微镜镜片和样品的相对轴向运动的装置分离的装置。

    High Numerical Aperture Objective Lens System
    67.
    发明申请
    High Numerical Aperture Objective Lens System 有权
    高数值孔径物镜系统

    公开(公告)号：US20160091797A1

    公开(公告)日：2016-03-31

    申请号：US14819335

    申请日：2015-08-05

    Applicant: ASML Holding N.V.

    Inventor： Lev RYZHIKOV

    IPC: G03F7/20 ,  G01N21/95 ,  G01N21/88 ,  G02B13/14

    CPC classification number: G01N21/474 ,  G01N21/8806 ,  G01N21/9501 ,  G01N2201/0638 ,  G02B9/64 ,  G02B13/143 ,  G02B13/16 ,  G02B13/18 ,  G02B21/02 ,  G02B27/0025 ,  G03F7/70 ,  G03F7/70058

    Abstract: An objective lens system having a high numerical aperture, a large working distance, and low optical aberrations over a wide spectral band of wavelengths is disclosed. The objective lens system includes a first lens group, a second lens group, and a third lens group. The first lens group includes first and second positive meniscus lenses that are positioned at a distance from each other along an optical axis of the objective lens system. The distance may be dependent on a focal length of the objective lens system. The second lens group includes first and second meniscus lenses and a bi-convex lens. The third lens group includes a bi-concave lens and a doublet lens.

    Abstract translation: 公开了一种具有高数值孔径，大工作距离以及宽波段波长频带下的低光学像差的物镜系统。 物镜系统包括第一透镜组，第二透镜组和第三透镜组。 第一透镜组包括沿着物镜系统的光轴相互间隔一定距离的第一和第二正弯月透镜。 距离可以取决于物镜系统的焦距。 第二透镜组包括第一和第二弯月透镜和双凸透镜。 第三透镜组包括双凹透镜和双透镜。

    SURFACE PLASMON RESONANCE SENSOR CELL AND SURFACE PLASMON RESONANCE SENSOR
    68.
    发明申请
    SURFACE PLASMON RESONANCE SENSOR CELL AND SURFACE PLASMON RESONANCE SENSOR 有权
    表面等离子体共振传感器单元和表面等离子体共振传感器

    公开(公告)号：US20160047745A1

    公开(公告)日：2016-02-18

    申请号：US14778978

    申请日：2014-02-26

    Applicant: NITTO DENKO CORPORATION

    Inventor： Mayu Ozaki ,  Kazuto Yamagata ,  Naoki Nagaoka ,  Tomohiro Kontani

    IPC: G01N21/552

    CPC classification number: G01N21/553 ,  G01N21/7703 ,  G01N2021/7776 ,  G01N2201/0638 ,  G01N2201/08

    Abstract: The present invention provides an SPR sensor cell having very excellent detection sensitivity, the SPR sensor cell including: an under-cladding layer; a core layer formed so that at least a part of the core layer is adjacent to the under-cladding layer; and a metal layer covering the core layer. In the SPR sensor cell, the core layer includes a uniform refractive index layer and a graded refractive index layer. The graded refractive index layer is arranged between the uniform refractive index layer and the metal layer. A refractive index of the graded refractive index layer is equal to or more than a refractive index of the uniform refractive index layer, and the refractive index of the graded refractive index layer increases continuously from a surface thereof on a uniform refractive index layer side to the metal layer side in a thickness direction of the graded refractive index layer.

    Abstract translation: 本发明提供了具有非常优异的检测灵敏度的SPR传感器单元，SPR传感器单元包括：下包层; 芯层，其形成为使得芯层的至少一部分与下敷层相邻; 以及覆盖芯层的金属层。 在SPR传感器单元中，芯层包括均匀的折射率层和渐变折射率层。 分级折射率层布置在均匀折射率层和金属层之间。 渐变折射率层的折射率等于或大于均匀折射率层的折射率，并且渐变折射率层的折射率从均匀的折射率层侧的表面连续地增加到 金属层侧在渐变折射率层的厚度方向上。

    METHOD AND SYSTEM FOR OPTICALLY INSPECTING A MANUFACTURED PART AT A SINGLE INSPECTION STATION HAVING A MEASUREMENT AXIS
    69.
    发明申请
    METHOD AND SYSTEM FOR OPTICALLY INSPECTING A MANUFACTURED PART AT A SINGLE INSPECTION STATION HAVING A MEASUREMENT AXIS 有权
    在具有测量轴的单个检查站中对制造部件进行光学检查的方法和系统

    公开(公告)号：US20160025644A1

    公开(公告)日：2016-01-28

    申请号：US14876187

    申请日：2015-10-06

    Applicant: GII ACQUISITION, LLC dba GENERAL INSPECTION, LLC

    Inventor： Michael G. Nygaard ,  Laura L. Poletti

    IPC: G01N21/88 ,  G01B11/02

    CPC classification number: G01N21/952 ,  B07C5/342 ,  F42B35/00 ,  G01B11/2425 ,  G01B11/2433 ,  G01N21/909 ,  G01N21/9515 ,  G01N2201/02 ,  G01N2201/0621 ,  G01N2201/0638 ,  G01N2201/103 ,  G01N2201/12

    Abstract: A method and system for optically inspecting a manufactured part at a single inspection station having a measurement axis are provided. The system comprises a fixture assembly which includes a rotatable first fixturing component to support a part in a generally vertical orientation and a rotatable second fixturing component mating with and removably connected to the first fixturing component to transmit torque from the first fixturing component to the second fixturing component. The second fixturing component includes a device for holding the part in a generally horizontal orientation and to permit rotation of the horizontally held part about the measurement axis between first and second predetermined angular positions about the axis. The system also comprises an actuator assembly, a backside illumination assembly, a frontside illumination device, a lens and detector assembly and at least one processor to process electrical signals generated by the lens and detector assembly.

    Abstract translation: 提供了在具有测量轴的单个检查站上光学检查制造部件的方法和系统。 该系统包括夹具组件，其包括可旋转的第一夹持部件以支撑大致垂直的方向的部件，以及可旋转的第二夹紧部件，其与第一夹持部件配合并可拆卸地连接，以将转矩从第一夹持部件传递到第二夹持 零件。 第二固定部件包括用于将部件保持在大体上水平的方向并且允许水平保持部分围绕测量轴线围绕轴线在第一和第二预定角度位置之间旋转的装置。 该系统还包括致动器组件，背面照明组件，前侧照明装置，透镜和检测器组件以及用于处理由透镜和检测器组件产生的电信号的至少一个处理器。

    OBSERVATION DEVICE, OBSERVATION PROGRAM, AND OBSERVATION SYSTEM
    70.
    发明申请
    OBSERVATION DEVICE, OBSERVATION PROGRAM, AND OBSERVATION SYSTEM 有权
    观察设备，观察计划和观察系统

    公开(公告)号：US20150264235A1

    公开(公告)日：2015-09-17

    申请号：US14713755

    申请日：2015-05-15

    Applicant: PANASONIC HEALTHCARE HOLDINGS CO., LTD.

    Inventor： Mikio HOUJOU ,  Atsushi ODA

    IPC: H04N5/225 ,  G02B21/36 ,  G01N21/01

    CPC classification number: H04N5/2254 ,  A61B5/0033 ,  C12M41/36 ,  G01N21/01 ,  G01N21/13 ,  G01N2201/022 ,  G01N2201/062 ,  G01N2201/0638 ,  G02B21/0088 ,  G02B21/361 ,  G02B21/365 ,  H04N5/2256

    Abstract: An observation device (1) is provided with: a general observation unit (10) for observing sample cells by observing an entire container (C) containing the cells and a culture solution; and a magnification observation unit (20) for magnifying a region within the container (C) and observing the cells, the general observation unit (10) and the magnification observation unit (20) each individually having lighting for illuminating the cells with light, and an optical system for observing the cells. The general observation unit (10) and the magnification observation unit (20) are thereby each provided with an individual optical system and lighting, making it possible to configure an appropriate observation unit for use both when the cells are observed by observing the entire container (C) and when a part within the container (C) is magnified and the cells are observed.

    Abstract translation: 观察装置（1）具备：通过观察包含细胞的整个容器（C）和培养液观察样品池的一般观察单元（10） 以及用于放大容器（C）内的区域并观察细胞的放大观察单元（20），一般观察单元（10）和放大观察单元（20）各自具有用光照亮细胞的照明，以及 用于观察细胞的光学系统。 一般观察单元（10）和放大率观察单元（20）各自设置有单独的光学系统和照明，使得可以配置在通过观察整个容器观察细胞时使用的适当的观察单元（ C），并且当容器（C）中的一部分被放大并观察细胞时。

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