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    PSEUDO-ELECTROPHEROGRAM CONSTRUCTION FROM PEPTIDE LEVEL MASS SPECTROMETRY DATA
    61.
    发明公开
    PSEUDO-ELECTROPHEROGRAM CONSTRUCTION FROM PEPTIDE LEVEL MASS SPECTROMETRY DATA 审中-公开

    公开(公告)号：US20240329052A1

    公开(公告)日：2024-10-03

    申请号：US18737836

    申请日：2024-06-07

    Applicant: Protein Metrics, LLC

    Inventor： Andrew NICHOLS ,  Marshall BERN ,  Yong Joo KIL ,  Eric Carlson

    IPC: G01N33/68 ,  H01J49/00

    CPC classification number: G01N33/6848 ,  H01J49/0036 ,  H01J49/004

    Abstract: Methods and apparatuses for the identification and/or characterization of properties of a macromolecule based on mass spectrometry data. Specifically, described herein are methods and apparatuses for converting peptide-level data into a pseudo-intact mass spectra. Also described herein are methods and apparatuses for converting peptide-level data into a pseudo-electropherogram. The methods may be well suited for analyzing proteins and protein complexes, including estimating properties of post-translational modifications of the proteins and protein complexes. Methods may include generating a theoretical graph or spectrum based on peptide-level mass spectrometry data. In some embodiments, the theoretical graph may be a theoretical intact mass spectrum or a theoretical charge distribution spectrum.

    Detection method of metal impurity in wafer
    62.
    发明授权
    Detection method of metal impurity in wafer 有权

    公开(公告)号：US12107016B2

    公开(公告)日：2024-10-01

    申请号：US17196116

    申请日：2021-03-09

    Applicant: Zing Semiconductor Corporation

    Inventor： Lanlin Wen ,  Tian Feng ,  Zhen Zhou

    IPC: H01L21/225 ,  H01J49/00 ,  H01J49/10 ,  H01L21/66

    CPC classification number: H01L22/10 ,  H01J49/0031 ,  H01J49/105 ,  H01L21/2252 ,  H01L22/12

    Abstract: The present application provides a detection method of metal impurity in wafer. The method comprises conducting a medium temperature thermal treatment for a first predicted time period to the wafer, cooling the wafer and conducting a low temperature thermal treatment for a second predicted time period, cooling the wafer to ambient temperature; providing a liquid of vapor phase decomposition on the wafer to collect metal impurities; atomizing the liquid containing the collected metal impurities, conducting an inductively coupled plasma mass spectrometry analysis and obtaining concentrations of the metal impurities. The present application applies the combination of various thermal treatment without an interrupt of cooling to ambient temperature to contemplate diffusions of various metal impurities to the wafer surface. Accordingly, the detection of metal impurities can be conducted with reduced time cost and enhanced efficiency.

    METHOD OF INFERRING CONTENT RATIO OF COMPONENT IN SAMPLE, COMPOSITION INFERENCE DEVICE, AND PROGRAM
    67.
    发明公开
    METHOD OF INFERRING CONTENT RATIO OF COMPONENT IN SAMPLE, COMPOSITION INFERENCE DEVICE, AND PROGRAM 审中-公开

    公开(公告)号：US20240297031A1

    公开(公告)日：2024-09-05

    申请号：US18569560

    申请日：2022-06-06

    Applicant: NATIONAL INSTITUTE FOR MATERIALS SCIENCE

    Inventor： Masanobu NAITO ,  Yusuke HIBI

    IPC: H01J49/00

    CPC classification number: H01J49/0036 ,  H01J49/0009

    Abstract: A method of the present invention is a method of inferring a content ratio of a component in a sample containing a component selected from K types, including: heating a sample set, ionizing resultant gas components sequentially, and observing mass spectra continuously; acquiring two-dimensional mass spectra of the respective samples from the mass spectra, and merging two or more of these spectra to acquire a data matrix; performing non-negative matrix factorization on the data matrix; correcting an intensity distribution matrix through analysis on canonical correlation between a base spectrum matrix and the data matrix; acquiring a feature vector from a corrected intensity distribution matrix and expressing the sample in vector space; defining a K-1 dimensional simplex and determining an end member; and inferring a content ratio of the component in the sample on the basis of the end member and the feature vector. It is possible to infer the composition of a component in an unknown mixture even from a mass spectrum acquired under an ambient condition.

    Sample support, adapter, ionization method and mass spectrometry method
    68.
    发明授权
    Sample support, adapter, ionization method and mass spectrometry method 有权

    公开(公告)号：US12080536B2

    公开(公告)日：2024-09-03

    申请号：US17623767

    申请日：2020-04-01

    Applicant: HAMAMATSU PHOTONICS K.K.

    Inventor： Akira Tashiro ,  Masahiro Kotani ,  Takayuki Ohmura

    IPC: H01J49/04 ,  H01J49/00

    CPC classification number: H01J49/0418 ,  H01J49/0031

    Abstract: A sample support is used for ionization of a sample. The sample support includes a film part having a first front surface and a first back surface, the film part being formed with a plurality of through-holes, and a support part defining a measurement region for ionizing the sample with respect to the film part and supporting the film part. The support part includes an inner portion having a second front surface and a second back surface, the film part being fixed to the inner portion, and an outer portion having a third front surface and a third back surface and extending along an outer edge of the inner portion. A difference generated between a position of the first front surface and a position of the third front surface in a thickness direction of the film part is smaller than a thickness of the film part.

    Methods for transferring ions between trapping devices of variable internal pressure
    69.
    发明授权
    Methods for transferring ions between trapping devices of variable internal pressure 有权

    公开(公告)号：US12080535B2

    公开(公告)日：2024-09-03

    申请号：US16886288

    申请日：2020-05-28

    Applicant: Thermo Finnigan LLC

    Inventor： Jesse D. Canterbury ,  Graeme C. McAlister

    IPC: H01J49/42 ,  H01J49/00 ,  H01J49/02 ,  H01J49/06 ,  H01J49/10

    CPC classification number: H01J49/022 ,  H01J49/005 ,  H01J49/065 ,  H01J49/067 ,  H01J49/10 ,  H01J49/4225

    Abstract: A mass spectrometer system, comprises: an ion source; a first and a second multipole apparatus; one or more ion gates or ion lenses between the first and second multipole apparatuses; at least one power supply configured to provide voltages to electrodes of the ion source, the mass analyzer, the first and second multipole apparatuses and the one or more ion gates or ion lenses; and a computer or electronic controller electrically coupled to the at least one power supply, wherein the computer or electronic controller comprises computer-readable instructions that are operable to cause the at least one power supply to supply voltages to the electrodes that cause transfer of ions from the first multipole apparatus to the second multipole apparatus, wherein a duration of a time allotted for completion of the transfer of the ions is dependent upon one or more properties of the ions being transferred.

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