Imaging spectrometer utilizing immersed gratings with accessible entrance slit
    71.
    发明申请
    Imaging spectrometer utilizing immersed gratings with accessible entrance slit 失效
    成像光谱仪利用具有可进入狭缝的浸没光栅

    公开(公告)号:US20050073680A1

    公开(公告)日:2005-04-07

    申请号:US10877622

    申请日:2004-06-24

    Abstract: A compact imaging spectrometer comprises an entrance slit, a catadioptric lens with a mirrored surface, a grating, and a detector array. The entrance slit directs light to the mirrored surface of the catadioptric lens; the mirrored surface reflects the light back through the lens to the grating. The grating receives the light from the catadioptric lens and diffracts the light to the lens away from the mirrored surface. The lens transmits the light and focuses it onto the detector array.

    Abstract translation: 紧凑型成像光谱仪包括入射狭缝,具有镜面的反射折射透镜,光栅和检测器阵列。 入口狭缝将光引导到反射折射透镜的镜面; 镜面将镜头的光线反射回光栅。 光栅接收来自反射折射透镜的光,并将光衍射到镜片远离镜面。 镜头透射光并将其聚焦到探测器阵列上。

    Methods and apparatuses for calibrating a sensor

    公开(公告)号:US12066327B2

    公开(公告)日:2024-08-20

    申请号:US17886409

    申请日:2022-08-11

    CPC classification number: G01J3/0297 G01J3/42

    Abstract: A method for determining a calibration function includes: calculating a first distance, between a distribution of target spectra and a comparison distribution of spectra; calibrating the distribution of target spectra with a first preliminary calibration function to form a first distribution of calibrated target spectra; calculating a second distance, between the first distribution of calibrated target spectra and the comparison distribution of spectra; determining that the second distance is less than the first distance; and setting the calibration function equal to the first preliminary calibration function.

    Peak alignment for the wavelength calibration of a spectrometer

    公开(公告)号:US11692874B2

    公开(公告)日:2023-07-04

    申请号:US17335814

    申请日:2021-06-01

    CPC classification number: G01J3/0297 G01J3/0208 G01J3/18 G01J3/2803

    Abstract: Aspects of the present disclosure provide a method for wavelength calibration of a spectrometer. The method can include receiving a calibration light signal having first spectral components of different first wavelengths; separating and projecting the first spectral components onto pixels of a detector of the spectrometer; establishing a relation between the first wavelengths and pixel numbers of first pixels on which the first spectral components are projected; calculating first residual errors between the first wavelengths and estimated wavelengths that are associated by the relation to the pixel numbers of the first pixels; receiving an optical signal having a second spectral component of a second wavelength; projecting the optical signal onto a second pixel; and calibrating the second wavelength based on a second residual error calculated based on one of the first residual errors that corresponds to a pair of the first pixels between which the second pixel is located.

    REFERENCING SYSTEM
    80.
    发明申请
    REFERENCING SYSTEM 审中-公开

    公开(公告)号:US20190019310A1

    公开(公告)日:2019-01-17

    申请号:US16038161

    申请日:2018-07-17

    Inventor: Jian Jin

    Abstract: A reference imaging system including a planar reference piece. The reference imaging system further includes a three-axis gantry for positioning the planar reference piece at a plurality of points in a 3D coordinate system. Additionally, the reference imaging system includes a yaw actuator for adjusting the yaw angle of the object. Furthermore, the reference imaging system includes a pitch actuator for adjusting the pitch of the object. Moreover, the reference imaging system includes a computer processing unit for controlling the 3D position, pitch and yaw of the planar reference piece.

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