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公开(公告)号：US10247611B1
公开(公告)日：2019-04-02
申请号：US14757280
申请日：2015-12-14
Applicant: Martin M. Liphardt , Ping He , Duane E. Meyer
Inventor： Martin M. Liphardt , Ping He , Duane E. Meyer
Abstract: Application of detectors of electromagnetic radiation and systems for enabling the optimization thereof for application over various specific wavelength ranges, involving functional combinations of gratings and/or combination dichroic beam splitter-prisms, which themselves can be optimized as regards wavelength dispersion characteristics.
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公开(公告)号：US10228284B2
公开(公告)日：2019-03-12
申请号：US15186682
申请日：2016-06-20
Applicant: Massachusetts Institute of Technology
Inventor： Thomas H. Jeys , William D. Herzog , Brian G. Saar , Alexander M. Stolyarov , Ryan Sullenberger , David Crompton , Shawn Michael Redmond
Abstract: A device, and corresponding method, can include a pump light source configured to be modulated at a pump modulation and to irradiate a target specimen. The device can also include a probe light source arranged to generate a speckle pattern from the target specimen, as well as a sensor configured to detect changes in at least one of position and intensity of one or more speckle lobes of the speckle pattern having correlation with the pump modulation. The device and method can be used for non-contact monitoring and remote sensing of surfaces, gases, liquids, particles, and other target materials by analyzing speckle pattern changes as a function of pump light irradiation. Advantages can include much higher sensitivity than existing methods; the ability to use visible probe wavelengths for uncooled, low-cost visible detectors with high spatial resolution; and the ability to obtain target material properties without detecting infrared light.
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83.发明申请公开(公告)号：US20180372517A1
公开(公告)日：2018-12-27
申请号：US15975757
申请日：2018-05-09
Applicant: General Photonics Corporation
Inventor： Xiaotian Steve Yao , Xiaojun James Chen
Abstract: Optical polarization-based devices and techniques are provided to enable low cost construction and easy signal processing to measure the light frequency via measurements of signals associated with a delay between the two orthogonal polarizations after passing through a DGD element and the retardation value of the DGD element without directly measuring the optical frequency. The optical detection may be designed in various configurations. In particular, for example, the optical detection may split the optical output of the DGD into two optical beams with two different optical detectors so that the final frequency information can be deducted into a pair of sine and cosine functions, such as a pair of sine and cosine functions of measured optical signal levels and the retardation value of the DGD element.
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公开(公告)号：US10161797B2
公开(公告)日：2018-12-25
申请号：US15202048
申请日：2016-07-05
Applicant: Purdue Research Foundation
Inventor： Amr Shaltout , Alexander Kildishev , Vladimir Shalaev , Jingjing Liu
Abstract: A circular dichroism spectrometer which comprises a metasurface. The metasurface has a plurality of anisotropic antennas configured to simultaneously spatially separate LCP and RCP spectral components from an incoming light beam. An optical detector array is included which detects the LCP and RCP spectral components. A transparent medium is situated between the metasurface and the optical detector array.
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公开(公告)号：US20170363472A1
公开(公告)日：2017-12-21
申请号：US15527098
申请日：2015-11-11
Inventor： Ibrahim ABDULHALIM
CPC classification number: G01J3/447 , G01B2210/56 , G01J3/26 , G01J3/2823 , G01J3/4412 , G01J3/45 , G01J4/00 , G01J2003/1269 , G01J2003/2826 , G01J2003/451 , G01N21/21 , G01N21/4738 , G01N21/64 , G01N21/65 , G01N21/8422 , G02B27/286 , G02F1/13471 , G02F1/1393 , G02F2203/055 , G02F2203/12
Abstract: A system is described that combines spectropolarimetry with scatterometry. The system uses an annular mirror and liquid crystal devices to control the angle of the incident light cone, the polarization and wavelength, an imaging setup and one or more video cameras so that spectroseopic-polarimetric-scatterometric images can be grabbed rapidly. The system is also designed to incorporate additional imaging modes such as interference, phase contrast, fluorescence and Raman spectropolarimetric imaging.
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Patent Agency Ranking
公开(公告)号：US20170299435A1
公开(公告)日：2017-10-19
申请号：US15456300
申请日：2017-03-10
Applicant: Digimarc Corporation
Inventor： Geoffrey B. Rhoads , Hugh L. Brunk , John D. Lord
IPC: G01J3/28 , H04N9/04 , H04N5/235 , H04N5/225 , G06K9/62 , G06K9/48 , G06K9/46 , G01J3/447 , G01J3/36 , G01J3/10 , H04N9/69 , G01J3/02
CPC classification number: H04N5/2256 , A61B5/0075 , A61B5/6898 , G01J3/0229 , G01J3/0272 , G01J3/10 , G01J3/2823 , G01J3/36 , G01J3/447 , G01J3/51 , G01J3/513 , G06K9/4652 , G06K9/481 , G06K9/6256 , G06K9/628 , H04N5/2254 , H04N5/2354 , H04N9/045 , H04N9/69 , H04N9/73
Abstract: A spectral imaging device is configured to capture color images synchronized with controlled illumination from different color light emitting diodes. A processor in the device applies a coupling factor to sampled color images to convert sampled pixels into spectral channels corresponding to LED color and color filter. Multi-spectral spectricity vectors produced at pixel locations are used along with spatial information to classify objects, such as produce items.
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公开(公告)号：US20170211977A1
公开(公告)日：2017-07-27
申请号：US15186682
申请日：2016-06-20
Applicant: Massachusetts Institute of Technology
Inventor： Thomas H. Jeys , William D. Herzog , Brian G. Saar , Alexander M. Stolyarov , Ryan Sullenberger , David Crompton , Shawn Michael Redmond
CPC classification number: G01J3/433 , G01J3/108 , G01J3/2823 , G01J3/447 , G01N21/1717 , G01N21/636 , G01N2021/1725
Abstract: A device, and corresponding method, can include a pump light source configured to be modulated at a pump modulation and to irradiate a target specimen. The device can also include a probe light source arranged to generate a speckle pattern from the target specimen, as well as a sensor configured to detect changes in at least one of position and intensity of one or more speckle lobes of the speckle pattern having correlation with the pump modulation. The device and method can be used for non-contact monitoring and remote sensing of surfaces, gases, liquids, particles, and other target materials by analyzing speckle pattern changes as a function of pump light irradiation. Advantages can include much higher sensitivity than existing methods; the ability to use visible probe wavelengths for uncooled, low-cost visible detectors with high spatial resolution; and the ability to obtain target material properties without detecting infrared light.
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公开(公告)号：US09638635B2
公开(公告)日：2017-05-02
申请号：US14649096
申请日：2013-11-29
Applicant: HORIBA JOBIN YVON SAS
Inventor： Olivier Acher , Simon Richard , Christian Brach , Viviane Millet , Sebastien Corde , Daphne Heran
CPC classification number: G01N21/645 , G01J3/021 , G01J3/0224 , G01J3/18 , G01J3/447 , G01N2201/063 , G01N2201/0633 , G02B5/1866 , G02B27/283
Abstract: A spectrometer (100) for analyzing the spectrum of an upstream light beam (1), includes an entrance slit (101) and collimating elements (110) suitable for generating, from the upstream light beam, a collimated light beam (10), characterized in that it also includes: a polarization-dependent diffraction grating (120) suitable for diffracting, at each wavelength (11, 12) of the spectrum of the upstream light beam, the collimated light beam into a first diffracted light beam (11, 12) and a second diffracted light beam (21, 22); optical recombining elements (130) including a planar optical reflecting surface (130) perpendicular to the grating and suitable for deviating at least the second diffracted light beam; and focussing elements (140) suitable for focussing, at each wavelength, the first diffracted light beam and the second diffracted light beam onto one and the same focussing area (141).
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89.发明授权Rotating-element spectroscopic ellipsometer and method for measurement precision prediction of rotating-element spectroscopic ellipsometer, recording medium storing program for executing the same, and computer program stored in medium for executing the same 有权旋转元件分光椭偏仪和旋转元件分光椭偏仪的测量精度预测方法，用于执行旋转元件分光椭偏仪的记录介质存储程序和存储在用于执行该程序的介质中的计算机程序公开(公告)号：US09581498B2
公开(公告)日：2017-02-28
申请号：US14969096
申请日：2015-12-15
Inventor： Yong Jai Cho , Won Chegal , Hyun Mo Cho
CPC classification number: G01J3/447 , G01J4/04 , G01N21/211 , G01N2021/213
Abstract: Provided are a rotating-element spectroscopic ellipsometer and a method for measurement precision prediction of a rotating-element spectroscopic ellipsometer, a recording medium storing program for executing the same, and a computer program stored in a medium for executing the same, and more particularly, a rotating-element spectroscopic ellipsometer and a method for measurement precision prediction of a rotating-element spectroscopic ellipsometer capable of calculating the measurement precision of the rotating-element spectroscopic ellipsometer based on a theoretical equation on standard deviations of ellipsometric parameters for a sample, a recording medium storing program for executing the same, and a computer program stored in a medium for executing the same.
Abstract translation: 本发明提供了一种旋转元件分光椭偏仪和旋转元件分光椭偏仪的精度预测方法，用于执行旋转元件分光椭偏仪的记录介质存储程序以及存储在其执行介质的计算机程序， 旋转元件分光椭偏仪和用于测量旋转元件分光椭偏仪的精度预测的方法，其能够基于关于样品的椭偏参数的标准偏差的理论等式计算旋转元件分光椭偏仪的测量精度，记录 用于执行该存储程序的介质存储程序和存储在用于执行该程序的介质中的计算机程序。
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90.发明授权Multi-functioned optical measurement device and method for optically measuring a plurality of parameters 有权多功能光学测量装置和用于光学测量多个参数的方法公开(公告)号：US09395173B2
公开(公告)日：2016-07-19
申请号：US14521440
申请日：2014-10-22
Applicant: NATIONAL APPLIED RESEARCH LABORATORIES
Inventor： Ming-Hsing Shen , Wei-Chung Wang , Chi-Hung Huang , Jyh-Rou Sze , Chun-Li Chang
CPC classification number: G01B9/02042 , G01B9/02044 , G01B9/0209 , G01J3/447 , G01J3/45 , G02B21/0024
Abstract: The conventional white-light interferometer, confocal microscope, and ellipsometer are integrated as one device set in a functional sense, and the geometrical parameters conventionally measured may be deduced on the integrated device. Thus, the advantages and efficacies of equipment cost saving, on-line measuring, rapid monitoring, reduced manufacturing time, and reduced possibility of object damage during the manufacturing process may be secured, compared with the prior art.
Abstract translation: 传统的白光干涉仪，共聚焦显微镜和椭偏仪被集成为功能意义上的一个装置，并且可以在集成装置上推导传统测量的几何参数。 因此，与现有技术相比，可以确保设备成本节省，在线测量，快速监测，缩短制造时间以及减少制造过程中物体损坏可能性的优点和功效。
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