Patent search ap:"John Notte" Page 1

1.

发明授权
Ion sources, systems and methods 有权
Title translation: 离子源，系统和方法

公开(公告)号：US08633451B2

公开(公告)日：2014-01-21

申请号：US12999731

申请日：2008-06-20

Applicant: Billy W. Ward , Colin A. Sanford , John Notte, IV , Alexander Groholski , Mark D. DiManna

Inventor： Billy W. Ward , Colin A. Sanford , John Notte, IV , Alexander Groholski , Mark D. DiManna

IPC: H01J37/08

CPC classification number: H01J27/26 , F25D19/006 , H01J37/067 , H01J37/08 , H01J37/265 , H01J37/28 , H01J2237/002 , H01J2237/0216 , H01J2237/024 , H01J2237/061 , H01J2237/0805 , H01J2237/0807 , H01J2237/244 , H01J2237/2487 , H01J2237/2826

Abstract: Ion sources, systems and methods are disclosed. In some embodiments, the ion sources, systems and methods can exhibit relatively little undesired vibration and/or can sufficiently dampen undesired vibration. This can enhance performance (e.g., increase reliability, stability and the like).

Abstract translation: 公开了离子源，系统和方法。在一些实施例中，离子源，系统和方法可以表现出相对较少的不期望的振动和/或可以充分地抑制不需要的振动。这可以提高性能（例如，增加可靠性，稳定性等）。

2.

发明授权
Isotope ion microscope methods and systems 有权
Title translation: 同位素离子显微镜的方法和系统

公开(公告)号：US08399834B2

公开(公告)日：2013-03-19

申请号：US12999683

申请日：2009-05-26

Applicant: John Notte, IV , Sybren Sijbrandij

Inventor： John Notte, IV , Sybren Sijbrandij

IPC: G01N23/225 , G21K5/00 , H01J37/08 , H01J1/50 , H01J3/14

CPC classification number: H01J37/285 , G01N23/2255 , H01J37/08 , H01J37/28 , H01J37/317 , H01J2237/0807 , H01J2237/2817

Abstract: Ion microscope methods and systems are disclosed. In general, the systems and methods involve relatively light isotopes, minority isotopes or both. In some embodiments, He-3 is used.

Abstract translation: 公开了离子显微镜的方法和系统。通常，系统和方法涉及相对较轻的同位素，少数同位素或两者。在一些实施方案中，使用He-3。

3.

发明申请
VARIABLE ENERGY CHARGED PARTICLE SYSTEMS 有权
Title translation: 可变能量充电粒子系统

公开(公告)号：US20120138815A1

公开(公告)日：2012-06-07

申请号：US13328326

申请日：2011-12-16

Applicant: Raymond Hill , John Notte, IV

Inventor： Raymond Hill , John Notte, IV

IPC: H01J27/02

CPC classification number: H01J37/26 , H01J37/06 , H01J37/08 , H01J37/241 , H01J37/243 , H01J2237/08 , H01J2237/24564

Abstract: Charged particle system are disclosed and include a first voltage source, a second voltage source electrically isolated from the first voltage source, a charged particle source electrically connected to the first voltage source, and an extractor electrically connected to the second voltage source. Methods relating to the charged particle systems are also disclosed.

Abstract translation: 公开了带电粒子系统，并且包括第一电压源，与第一电压源电隔离的第二电压源，电连接到第一电压源的带电粒子源，以及电连接到第二电压源的提取器。还公开了与带电粒子系统有关的方法。

4.

发明申请
SYSTEMS AND METHODS FOR A HELIUM ION PUMP 审中-公开
Title translation: 真空泵的系统和方法

公开(公告)号：US20070227883A1

公开(公告)日：2007-10-04

申请号：US11688602

申请日：2007-03-20

Applicant: Billy Ward , John Notte

Inventor： Billy Ward , John Notte

IPC: C23C14/00

CPC classification number: H01J41/12 , H01J37/28 , H01J2237/0807 , H01J2237/18

Abstract: Ion pump systems and methods are disclosed.

Abstract translation: 公开了离子泵系统和方法。

5.

发明申请
Ion sources, systems and methods 有权

公开(公告)号：US20070138388A1

公开(公告)日：2007-06-21

申请号：US11600250

申请日：2006-11-15

Applicant: Billy Ward , John Notte , Louis Farkas , Randall Percival , Raymond Hill

Inventor： Billy Ward , John Notte , Louis Farkas , Randall Percival , Raymond Hill

IPC: H01J49/00

CPC classification number: H01J37/08 , B82Y10/00 , B82Y40/00 , H01J27/26 , H01J37/20 , H01J37/252 , H01J37/28 , H01J37/3056 , H01J37/3174 , H01J2237/0807 , H01J2237/202 , H01J2237/20228 , H01J2237/2566 , H01J2237/2623 , H01J2237/2812 , H01J2237/30438 , H01J2237/3174 , H01J2237/31755

Abstract: Ion sources, systems and methods are disclosed.

6.

发明授权
Sample inspection methods, systems and components 有权
Title translation: 样品检验方法，系统和组件

公开(公告)号：US08669525B2

公开(公告)日：2014-03-11

申请号：US12997686

申请日：2009-05-26

Applicant: Sybren Sijbrandij , John Notte, IV , William B. Thompson

Inventor： Sybren Sijbrandij , John Notte, IV , William B. Thompson

IPC: H01J37/26

CPC classification number: G01N23/2251 , G01N23/2208 , G01N23/2258 , H01J37/244 , H01J37/28 , H01J2237/0807 , H01J2237/2441 , H01J2237/2444 , H01J2237/2445 , H01J2237/24475 , H01J2237/24485 , H01J2237/2449 , H01J2237/24585 , H01J2237/24592 , H01J2237/2803 , H01L22/12 , H01L2924/0002 , H01L2924/00

Abstract: The disclosure relates to sample inspection using an ion-beam microscope. In some embodiments, the disclosure involves the use of multiple detectors, each of which provides different information about a sample.

Abstract translation: 本公开涉及使用离子束显微镜的样品检查。在一些实施例中，本公开涉及多个检测器的使用，每个检测器提供关于样品的不同信息。

7.

发明授权
Gas delivery system with voltage gradient for an ion microscope 有权
Title translation: 带离子显微镜电压梯度的气体输送系统

公开(公告)号：US08558192B2

公开(公告)日：2013-10-15

申请号：US13276836

申请日：2011-10-19

Applicant: Billy W. Ward , John Notte, IV , Randall G. Percival

Inventor： Billy W. Ward , John Notte, IV , Randall G. Percival

IPC: H01J37/08 , H01J37/28

CPC classification number: H01J37/28 , H01J37/08 , H01J2237/006 , H01J2237/038 , H01J2237/061 , H01J2237/0807

Abstract: Disclosed are systems and methods for applying a voltage gradient to a gas delivery system, delivering a gas through a length of the gas delivery system having the voltage gradient, the gas having a pressure-distance product of less than about 1×10−2 Torr-inches or greater than about 100 Torr-inches, and delivering the gas into a housing of an ion microscope, the housing including an emitter and an extractor.

Abstract translation: 公开了用于向气体输送系统施加电压梯度的系统和方法，将气体输送通过具有电压梯度的气体输送系统的一段长度，气体的压力距离乘积小于约1×10 -2乇或大于约100托/英寸，并将气体输送到离子显微镜的壳体中，该壳体包括发射器和提取器。

8.

发明申请
METHODS AND SYSTEMS FOR HEATING A TIP APEX OF A CHARGED PARTICLE SOURCE 有权
Title translation: 用于加热充电颗粒源的提示APEX的方法和系统

公开(公告)号：US20120074318A1

公开(公告)日：2012-03-29

申请号：US13277583

申请日：2011-10-20

Applicant: John Notte, IV , Randall G. Percival , Milton Rahman , Louise Barriss , Russell Mello , Mark D. DiManna

Inventor： John Notte, IV , Randall G. Percival , Milton Rahman , Louise Barriss , Russell Mello , Mark D. DiManna

IPC: G01N23/00

CPC classification number: G05D23/27 , H01J37/08 , H01J37/22 , H01J37/242 , H01J37/243 , H01J2237/0807

Abstract: Systems and methods for heating an apex of a tip of a charged particle source are disclosed. The charged particle source can be, for example, a gas ion source. The systems can include a detector configured to detect light generated by the tip apex, and a controller coupled with the charged particle source and the detector so that the controller can control heating of the tip apex based on the light detected by the detector.

Abstract translation: 公开了用于加热带电粒子源的尖端的顶点的系统和方法。带电粒子源可以是例如气体离子源。该系统可以包括检测器，其被配置为检测由尖端尖端产生的光，以及控制器，其与带电粒子源和检测器耦合，使得控制器可以基于由检测器检测到的光来控制尖端顶点的加热。