METHOD AND DEVICE FOR TESTING SEQUENTIAL CIRCUITS REALIZED BY MONOLITHIC INTEGRATED SEMICONDUCTOR CIRCUITS

    公开(公告)号:DE2961692D1

    公开(公告)日:1982-02-18

    申请号:DE2961692

    申请日:1979-08-07

    Applicant: IBM

    Abstract: An LSI integrated semiconductor circuit system comprised of a plurality of interconnected minimum replaceable units. The system and each minimum replaceable unit fully conforms to the Level Sensitive Scan Design (LSSD) Rules. [Level Sensitive Scan Design Rules are fully disclosed and defined in each of the following U.S. Pat. Nos. 3,783,254, 3,761,695, 3,784,907 and in the publication "A Logic Design Structure For LSI Testability" by E. B. Eichelberger and T. W. Williams, 14th Design Automation Conference Proceedings, IEEE Computer Society, June 20-22, 1977, pages 462-467, New Orleans, La.]. Each of the minimum replaceable units includes a shift register segment having more than two shift register stages. Each register stage of each shift register segment of each minimum replaceable unit includes a master flip-flop (latch) and a slave flip-flop (latch). Connection means is provided for connecting the shift register segments of said minimum replaceable units into a single shift register. Additional controllable circuit means including test combinational circuit means is provided for setting a predetermined pattern in only said first two stages of each shift register segment of said minimum replaceable units. The additional circuit means facilitates and is utilized in testing the circuit integrity (stuck faults and continuity) of each minimum replaceable unit.

    13.
    发明专利
    未知

    公开(公告)号:DE2134816A1

    公开(公告)日:1973-02-01

    申请号:DE2134816

    申请日:1971-07-13

    Abstract: In a microprogrammed processor, a pair of register means and an associative store are arranged to eliminate the need to translate, for each microinstruction, a logical address to a real address to access main storage. Translation is required only once for each program or machine level (macro) instruction. The real addresses of the first bytes of the current instruction and its operand(s) are stored in a first one of the register means and are normally incremented to access the remainder of the instruction and operands byte-by-byte. In addition, the first register means and incrementer can be used to access sequentially stored instructions in a program sequence without address translation. When a page boundary is crossed during said incrementing, the logical page address of the current instruction or operand (which is at the boundary) is read from the second register means and is incremented to form the logical address of the next sequential page. This new logical address is searched in the associative array. If a match occurs, the new logical address is stored in the second register means, and the corresponding real address is stored in the first register means. This hardware translate means significantly reduces translate time.

    14.
    发明专利
    未知

    公开(公告)号:IT7925850D0

    公开(公告)日:1979-09-20

    申请号:IT2585079

    申请日:1979-09-20

    Applicant: IBM

    Abstract: An LSI integrated semiconductor circuit system comprised of a plurality of interconnected minimum replaceable units. The system and each minimum replaceable unit fully conforms to the Level Sensitive Scan Design (LSSD) Rules. [Level Sensitive Scan Design Rules are fully disclosed and defined in each of the following U.S. Pat. Nos. 3,783,254, 3,761,695, 3,784,907 and in the publication "A Logic Design Structure For LSI Testability" by E. B. Eichelberger and T. W. Williams, 14th Design Automation Conference Proceedings, IEEE Computer Society, June 20-22, 1977, pages 462-467, New Orleans, La.]. Each of the minimum replaceable units includes a shift register segment having more than two shift register stages. Each register stage of each shift register segment of each minimum replaceable unit includes a master flip-flop (latch) and a slave flip-flop (latch). Connection means is provided for connecting the shift register segments of said minimum replaceable units into a single shift register. Additional controllable circuit means including test combinational circuit means is provided for setting a predetermined pattern in only said first two stages of each shift register segment of said minimum replaceable units. The additional circuit means facilitates and is utilized in testing the circuit integrity (stuck faults and continuity) of each minimum replaceable unit.

    16.
    发明专利
    未知

    公开(公告)号:FR2406851A1

    公开(公告)日:1979-05-18

    申请号:FR7828926

    申请日:1978-10-02

    Applicant: IBM

    Abstract: In a micro-controlled data handling system the number of lines and pins required to transfer control signals from the microprogram controls to be integrated circuit modules controlled by such signals is conserved by using two bussing paths for distributing the control signals to the modules. A first path is dedicated exclusively to pre-decoded control signal functions and a second path is shared for transferring both data and control signal functions. Each controlled module contains an additional decoding circuit for combinationally decoding control signal functions received through both paths.

    17.
    发明专利
    未知

    公开(公告)号:FR2280934A1

    公开(公告)日:1976-02-27

    申请号:FR7521458

    申请日:1975-07-01

    Applicant: IBM

    Abstract: Input/output registers integrated with logic and arithmetic circuits are combined externally of a processor nucleus having only storage registers, instruction decode logic, timing circuitry and arithmetic and logic unit for executing microinstructions whereby the use of the input/output registers is determined by microprogram code and by time control to either selectively execute all adapter and interface communication and control functions for input and output devices or to selectively be switched into the data flow of the processor nucleus.

    19.
    发明专利
    未知

    公开(公告)号:DE2150291A1

    公开(公告)日:1973-04-19

    申请号:DE2150291

    申请日:1971-10-08

    Abstract: A circuit arrangement is provided for controlling a known logical switching network for shifting data of variable widths, wherein the shift amount by which the data bits applied to the input are to be shifted is switched from the true value to the complement value and vice versa by means of a control signal influenced by control commands, and wherein the partial results thus produced are logically combined to form a further partial result or the final result.

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