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    11.
    发明专利
    未知

    公开(公告)号：DE69010634T2

    公开(公告)日：1995-01-12

    申请号：DE69010634

    申请日：1990-08-31

    Applicant: IBM

    Inventor： MARTIN YVES ,  WICKRAMASINGHE HEMANTHA KUMAR

    IPC: G01B21/30 ,  G01B11/30 ,  G01B15/00 ,  G01N21/00 ,  G01N21/31 ,  G01N23/00 ,  G01N37/00 ,  G01Q30/02 ,  G01Q60/24 ,  H01J37/26

    Abstract: An Atomic Photo-Absorption Force Microscope 1 includes an Atomic Force Microscope 10 and a radiation source 20 having an output radiation 22 wavelength selected to be preferentially absorbed by atoms or molecules associated with a sample surface 24a under investigation. Absorption of the radiation raises at least one outer shell electron to a higher energy level, resulting in an increase in radius of the atom or molecule. A tip 12 coupled through a lever 14 to the Atomic Force Microscope 10 is scanned over the surface and operates in conjunction with a laser heterodyne interferometer 18 to directly measure the resulting atomic or molecular increase of size, thereby detecting both the presence and location of the atoms or molecules under investigation. Operation in an a.c. mode by chopping the incident radiation 22 and measuring the corresponding a.c. induced tip movement beneficially increases the sensitivity of the technique, particularly if the a.c. frequency is chosen at a resonance of the tip-lever combination.

    13.
    发明专利
    未知

    公开(公告)号：DE69427522T2

    公开(公告)日：2002-03-28

    申请号：DE69427522

    申请日：1994-04-11

    Applicant: IBM

    Inventor： BAYER THOMAS ,  GRESCHNER DR ,  MARTIN YVES ,  MEISSNER KLAUS ,  WEISS HELGA

    IPC: G01N1/00 ,  G01B1/00 ,  G01B7/34 ,  G01N27/00 ,  G01N37/00 ,  G01Q40/02 ,  H01L21/20

    Abstract: To allow faithfully the quantitative interpretation of the measuring results obtained by scanning force microscopes (STM) or atomic force microscopes (AFM) the probe tips used have to be exactly characterized before and after measuring since their size and shape may change during the measuring procedure. If the tips are cone-shaped, their diameter and their cone angle have to be known accurately. Described are calibration standards for profilometers, especially for STMs and AFMs, which are of high accuracy and which allow calibration measurements without frequently removing the probe tips. Methods of producing these calibration standards are shown and examples are given for the use of the calibration standards for measuring features in the sub-nanometer range or for calibrating profilometers.

    Homogenizing light-pipe with non-planar entrance surface used in photovoltaic solar concentrators
    18.
    发明专利
    Homogenizing light-pipe with non-planar entrance surface used in photovoltaic solar concentrators 未知

    公开(公告)号：GB2490389A

    公开(公告)日：2012-10-31

    申请号：GB201204933

    申请日：2012-03-21

    Applicant: IBM

    Inventor： MARTIN YVES ,  KESSEL THEODORE GERARD VAN ,  HAIGHT RICHARD ALAN

    IPC: H01L31/052

    Abstract: A light-pipe 10 suitable for use within an solar concentrator assembly has a monotonically tapering width between two sidewalls 21 and the light-pipe is suitable to be positioned between a focussing element 132 and a photo-voltaic cell 12. Preferably such an assembly is repeatedly used in an array (figures 1a,b). The light-pipe has a non-planar surface 25 that contributes by diffraction and/or refraction to the homogenisation of light at the exit of the light-pipe at cell surface 22. The light pipe comprises a transparent material. Figure 5 show only one possibility for a non-planar surface of the light-pipe with multiple concave and convex portions; figure 4 shows multiple concave shapes for surface (24), figure 3 shows a single concave surface (23). Embodiments of Figures 3 to 5 have a de-focussing effect. Figure 6 shows a surface carrying multiple transparent particles (26). Figure 7 shows a diffraction grating or surface with randomized depressions (27) formed on or in a transparent layer (40). Embodiments of figures 8 to 10 show a non-planar interface (28, 29, 30) formed between at least second transparent material layer (50) that preferably has a different refractive index to the underlying light-pipe 10. Figure 11 shows particles (26) within such a second transparent material layer (50).

    20.
    发明专利
    未知

    公开(公告)号：DE69427522D1

    公开(公告)日：2001-07-26

    申请号：DE69427522

    申请日：1994-04-11

    Applicant: IBM

    Inventor： BAYER THOMAS ,  GRESCHNER DR ,  MARTIN YVES ,  MEISSNER KLAUS ,  WEISS HELGA

    IPC: G01N1/00 ,  G01B1/00 ,  G01B7/34 ,  G01N27/00 ,  G01N37/00 ,  G01Q40/02 ,  H01L21/20

    Abstract: To allow faithfully the quantitative interpretation of the measuring results obtained by scanning force microscopes (STM) or atomic force microscopes (AFM) the probe tips used have to be exactly characterized before and after measuring since their size and shape may change during the measuring procedure. If the tips are cone-shaped, their diameter and their cone angle have to be known accurately. Described are calibration standards for profilometers, especially for STMs and AFMs, which are of high accuracy and which allow calibration measurements without frequently removing the probe tips. Methods of producing these calibration standards are shown and examples are given for the use of the calibration standards for measuring features in the sub-nanometer range or for calibrating profilometers.

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