Abstract:
본 발명은 다이오드 구조체 및 이를 포함하는 메모리 소자에 관한 것이다. 다이오드 구조체에 있어서, 제 1전극 상기 제 1 전극 상에 형성된 p형 Cu 산화층 상기 p형 Cu 산화층 상에 형성된 n형 InZn 산화층 및 상기 n형 InZn 산화층 상에 형성된 제 2전극을 포함하는 다이오드 구조체 및 이를 포함하는 메모리 소자를 제공한다.
Abstract:
PURPOSE: A light touch screen device capable of supporting remote sensing and touch sensing is provided to use an oxide semiconductor transistor of which the photosensitive property is excellent as a light sensing device, thereby easily manufacturing a large size light touch screen device. CONSTITUTION: Sensing pixels are arranged in rows and columns. The sensing pixels include a light sensing pixel(210p) and a touch sensing pixel(210t). The light sensing pixel senses the light of an external light source. The touch sensing pixel senses reflected display light when a screen is touched. The light sensing pixel includes a first light sensor transistor(112) and a first switch transistor(111), which are serially connected. The touch sensing pixel includes a second light sensor transistor and a second switch transistor, which are serially connected. The light sensing pixel and the touch sensing pixel are alternately arranged in a row.
Abstract:
PURPOSE: An optical touch screen device and a driving method thereof are provided to reduce a time delay caused by a parasitic capacitance, thereby easily implementing enlargement. CONSTITUTION: A gate driving unit(120) provides a gate voltage and a reset signal to an optical sensing pixel(110). A signal outputting unit(130) receives an optical sensing signal from the optical sensing pixel and outputs a data signal. The gate driving unit provides the reset signal to the optical sensing pixel and gate lines providing the gate voltage to the optical sensing pixel. The gate driving unit includes a reset line connected to the optical sensing pixels. An array of the optical sensing pixels includes the optical sensing pixels arranged by row/columns. [Reference numerals] (120) Gate driving unit; (130) Signal outputting unit
Abstract:
PURPOSE: An optical sensing device and a driving method thereof are provided to improve the operation reliability of the optical sensing device by simply preventing a shift phenomenon of a threshold voltage generated in an oxide semiconductor transistor. CONSTITUTION: A switch transistor(130) and an optical sensor transistor(140) are formed on a substrate(101). The switch transistor and the optical sensor transistor have one common source and drain electrode(109). A first gate electrode(102) and a second gate electrode(103) are partially formed on the substrate. A gate insulation layer(104) is formed on the substrate, the first gate electrode, and the second gate electrode. A first source and drain electrode(108) and a second source and drain electrode(109) are formed on both sides of a first channel layer(106) and a second channel layer(107).
Abstract:
PURPOSE: A resistance random access memory is provided to stably improve a switching characteristic by including a simple switch. CONSTITUTION: A switch region(12) is made of the material having a bipolar characteristic. A memory register(14) is made of the material having the unipolar characteristic. A bottom electrode is formed in the lower part of the switch region. An upper electrode is formed on the top of the memory register. A middle electrode(13) is formed between the switch region and the memory register.
Abstract:
A memory device is provided to obtain stabilized switching current without having an effect on the degree of integration by arbitrarily controlling the aspect ratio of a memory area and switch region. A memory device comprises a first electrode(11) and a second electrode(14), a memory register(13), and a switch fabric(12). The memory register is formed between the first electrode and the second electrode. The switch fabric controls the current applied to the memory register. The memory area of the memory register and switch region of the switch fabric are different.
Abstract:
A resistivity memory device is provided to lower the manufacturing cost and increase the adhesion property with other films. A resistivity memory device comprises the first electrode(E1), the second electrode(E2), the first structure(S1), and the first switching device. The first electrode is at least one. The second electrode is arranged apart from the first electrode. The first structure is equipped between the first and the second electrode. The second structure comprises the first resistance alteration layer(R1). The first switching device is electrically connected to the first resistance alteration layer. At least one of the first and the second electrode comprises the alloy layer of the non-precious metals and noble metals.
Abstract:
A threshold switching operation method of a nonvolatile memory device applying a pulse voltage is provided to enable low current operation with a low voltage. A nonvolatile memory device includes a substrate(20), a bottom electrode(22) on the substrate, a metal oxide(24) on the bottom electrode and a top electrode(26) on the metal oxide. According to a threshold switching operation method of the nonvolatile memory device, a pulse voltage is applied to the metal oxide. The metal oxide has a thickness of 10-100nm. The amplitude of the pulse voltage is 0.1-50V. Pulse duration of the pulse voltage is 10-20microseconds.
Abstract:
A nonvolatile memory device and its manufacturing method are provided to realize stable memory switching characteristics by using contact layers for improving interface characteristics. A storage node(128) is connected to a switching device. The storage node includes a first electrode(123) and a second electrode(127). A data storing layer(125) is disposed between the first and the second electrodes and made of a transition metal oxide layer and an aluminum oxide layer. Contact layers(124,126) are formed on at least one surface of un upper surface and a lower surface of the data storing layer and made of a transition metal oxide layer. The contact layers increase interface characteristics between the first and the second electrodes.
Abstract:
인가 전압에 따라 저항이 변하는 저항체를 메모리 노드 사용하는 불휘발성 메모리 소자와 그 제조 및 동작 방법에 관해 개시되어 있다. 개시된 본 발명의 불휘발성 메모리 소자는 표면에 버퍼층이 구비된 기판, 상기 버퍼층 상에 이격되게 형성된 소오스 및 드레인, 상기 소오스 및 드레인사이에 구비된 핀 채널, 상기 핀 채널과 상기 버퍼층사이에 구비되어 있고 상기 소오스 및 드레인에 연결된 메모리 노드, 상기 핀 채널과 상기 메모리 노드를 덮는 게이트 절연막 및 상기 소오스 및 드레인과 이격되어 있고 상기 게이트 절연막을 덮는 게이트 전극을 포함하는 것을 특징으로 한다. 상기 메모리 노드는 전이금속 산화막일 수 있고, 상기 게이트 전극과 상기 소오스 및 드레인사이에 스페이서가 구비될 수 있다.