-
21.
公开(公告)号:DE10031207A1
公开(公告)日:2002-01-10
申请号:DE10031207
申请日:2000-06-27
Applicant: INFINEON TECHNOLOGIES AG
Inventor: KEYSERLINGK ALBERT , KLEHN BERND , LINDOLF JUERGEN
IPC: G11C5/14 , H01L27/108 , H02M3/07 , H01L23/58
Abstract: The power supply to the integrated circuit (1) consists of a controller (4), control circuit (3) and voltage pump circuit (2). Controlled switching of a first (C1) and second (C22) capacitors using switching transistors (T11,T12,T21,T22) pumps the supply voltage (V1) to a higher level (VPP) required to operate the integrated circuit. When the integrated circuit is in a stand-by mode the second capacitor is rendered inoperative to reduce the output voltage.
-
公开(公告)号:DE10026276B4
公开(公告)日:2006-02-16
申请号:DE10026276
申请日:2000-05-26
Applicant: INFINEON TECHNOLOGIES AG
Inventor: KAISER ROBERT , LINDOLF JUERGEN , SCHNEIDER HELMUT , SCHAMBERGER FLORIAN , SCHAFFROTH THILO
Abstract: The explicit high voltage source (1) and internal low voltage source (2) are selectively connected to respective connection areas (4,5) of a programmable fuse (3) by respective connectors (6,7). The switches (8,9) connect the connectors to the connection areas, when a control signal is applied to the switches from a controller (16), to apply required voltage.
-
公开(公告)号:DE19842852B4
公开(公告)日:2005-05-19
申请号:DE19842852
申请日:1998-09-18
Applicant: INFINEON TECHNOLOGIES AG
Inventor: LE THOAI-THAI , LINDOLF JUERGEN , SCHNEIDER HELMUT
IPC: G11C7/06 , G11C7/08 , G11C8/08 , G11C8/18 , G11C11/409 , G11C11/4091 , H01L27/105 , H01L27/108 , G11C11/407
-
公开(公告)号:DE10344872A1
公开(公告)日:2005-05-19
申请号:DE10344872
申请日:2003-09-26
Applicant: INFINEON TECHNOLOGIES AG
Inventor: FISCHER HELMUT , LINDOLF JUERGEN , SOMMER MICHAEL BERNHARD
IPC: H01L27/02 , H03K19/003 , H01L23/60 , H01L27/085 , H02H9/04
Abstract: An integrated circuit with electrostatic discharge protection includes a first transistor with a source terminal, a drain terminal and a gate terminal, and a second transistor with a source terminal, a drain terminal and a gate terminal. The gate terminal for each of the first and second transistors is connected to the drain terminal. The first transistor is connected in series with the second transistor by one of the drain and source terminals of the first transistor being connected to one of the drain and source terminals of the second transistor. The series circuit formed by the transistors is connected to an input terminal of the integrated circuit or to a supply terminal and a terminal that applies the reference potential of the integrated circuit. The series circuit of the transistors is dimensioned by the number of transistors and the setting of the channel length and channel width ratios of the transistors.
-
公开(公告)号:DE10254160A1
公开(公告)日:2004-06-09
申请号:DE10254160
申请日:2002-11-20
Applicant: INFINEON TECHNOLOGIES AG
Inventor: KOWALSKI BERNHARD , FELBER ANDREAS , ROSSKOPF VALENTIN , SCHLOESSER TILL , LINDOLF JUERGEN
IPC: H01L21/8242 , H01L27/02 , H01L27/108 , H01L29/94 , G11C11/40
Abstract: A transistor array has vertical FET transistors each connected to a storage capacitor of a memory cell array. Gate electrode strips, which form word lines, of the transistors are located on both sides of active webs running parallel to one another and are connected to a superimposed metal plane by word line or CS contacts. To insulate these word line contacts from the other elements of the transistor array and of the cell array, the word line contacts are located in deep trenches that are introduced into the webs.
-
公开(公告)号:DE10261457B3
公开(公告)日:2004-03-25
申请号:DE10261457
申请日:2002-12-31
Applicant: INFINEON TECHNOLOGIES AG
Inventor: KOWALSKI BERNHARD , FELBER ANDREAS , ROSSKOPF VALENTIN , SCHLOESSER TILL , LINDOLF JUERGEN
IPC: G11C29/02 , H01L21/8242 , H01L23/544 , H01L27/02 , H01L27/108 , H01L23/528 , G11C7/24
Abstract: The integrated circuit has a transistor array of vertical FET selection transistors and storage capacitors in deep trenches for an array of semiconducting cells associated with the transistor array, word lines and intersecting parallel bit lines. An array diagnosis test structure has first and second offset word line combs alternately connecting different word lines and first and second bit line combs alternately connecting different bit lines. The integrated circuit has a transistor array (11) of vertical FET selection transistors formed by active elements (121-12k) in the form of parallel vertical trenches in a substrate and storage capacitors in deep trenches for an array of semiconducting cells associated with the transistor array, word lines (131-13k) along the active elements and intersecting parallel bit lines (141-14m). An array diagnosis test structure contains first and second offset word line combs (20,21) alternately connecting different word lines and first and second bit line combs (30,31) alternately connecting different bit lines.
-
公开(公告)号:DE10146163A1
公开(公告)日:2003-04-03
申请号:DE10146163
申请日:2001-09-19
Applicant: INFINEON TECHNOLOGIES AG
Inventor: LE THOAI-THAI , LINDOLF JUERGEN
Abstract: The scanning head (1) has a first transistor (2) for charging a tested structure, and a second transistor (3) for discharging it, which are sequentially operated. A measuring tip (6) contacts the structure. The scanning head is coupled to an evaluating unit computing the capacitance of the structure from the current flow adjusted between the head idle state and its applied state. The transistors are integrated components in the head. Independent claim is included for a raster or tunnel microscope, containing the scanning head.
-
公开(公告)号:DE10032236C2
公开(公告)日:2002-05-16
申请号:DE10032236
申请日:2000-07-03
Applicant: INFINEON TECHNOLOGIES AG
Inventor: BRASS ECKHARD , LE THOAI-THAI , LINDOLF JUERGEN , SCHNABEL JOACHIM
IPC: G11C11/409 , G11C5/14 , G11C7/06 , G11C7/22 , G11C11/403 , G11C11/406 , G11C11/407 , G11C11/4074 , H03K19/0175 , G06F1/32
Abstract: The circuit generates a control voltage derived from a reference current per differential amplifier acting as a receiver to set the correct operating point. Switching elements for each receiver in a line carrying a current for generating the control voltage are permanently closed in working mode by a trigger signal (EN) to continuously deliver the current and are closed periodically or at discrete times in standby mode by a refresh signal. The circuit generates a control voltage derived from a reference current (IREF) for each differential amplifier (6,7) functioning as a receiver to set the correct operating point. It has switching elements (10-12) for each receiver in a line (13) carrying a current for generating the control voltage and that are permanently closed in working mode by a trigger signal (EN) to continuously deliver the current and that are closed periodically or at discrete times in standby mode by a refresh signal (SRF). Independent claims are also included for the following: a DRAM memory.
-
公开(公告)号:DE10043731A1
公开(公告)日:2002-03-21
申请号:DE10043731
申请日:2000-09-05
Applicant: INFINEON TECHNOLOGIES AG
Inventor: KLEHN BERND , LINDOLF JUERGEN
Abstract: The measuring probe has a lever arm provided with a probe point at its free end and made of a high conductivity material (14), e.g. doped crystalline silicon, covered by an extremely thin insulation layer (15), e.g. of silicon oxide, with a window (16) in the insulation layer at the apex of the probe point. The lever arm is contacted via a metal layer (17) applied over an opening in the insulation layer. Also included are Independent claims for the following: (a) a manufacturing method for a measuring probe; (b) a measuring system using a measuring probe
-
公开(公告)号:DE10032236A1
公开(公告)日:2002-01-31
申请号:DE10032236
申请日:2000-07-03
Applicant: INFINEON TECHNOLOGIES AG
Inventor: BRASS ECKHARD , LE THOAI-THAI , LINDOLF JUERGEN , SCHNABEL JOACHIM
IPC: G11C11/409 , G11C5/14 , G11C7/06 , G11C7/22 , G11C11/403 , G11C11/406 , G11C11/407 , G11C11/4074 , H03K19/0175 , G06F1/32
Abstract: The circuit generates a control voltage derived from a reference current per differential amplifier acting as a receiver to set the correct operating point. Switching elements for each receiver in a line carrying a current for generating the control voltage are permanently closed in working mode by a trigger signal (EN) to continuously deliver the current and are closed periodically or at discrete times in standby mode by a refresh signal. The circuit generates a control voltage derived from a reference current (IREF) for each differential amplifier (6,7) functioning as a receiver to set the correct operating point. It has switching elements (10-12) for each receiver in a line (13) carrying a current for generating the control voltage and that are permanently closed in working mode by a trigger signal (EN) to continuously deliver the current and that are closed periodically or at discrete times in standby mode by a refresh signal (SRF). Independent claims are also included for the following: a DRAM memory.
-
-
-
-
-
-
-
-
-