21.
    发明专利
    未知

    公开(公告)号:DE10255117A1

    公开(公告)日:2004-06-17

    申请号:DE10255117

    申请日:2002-11-26

    Abstract: A semiconductor memory device with a phase transformation memory effect includes at least one memory element in a semiconductor substrate, and a cavity arrangement including at least one cavity in spatial proximity to the respective memory element. The cavity is in spatial arrangement with the respective memory element so as to reduce thermal coupling of the respective memory element to the areas surrounding the memory element, which also reduces the thermal conductivity between memory element and the areas surrounding the memory element.

    24.
    发明专利
    未知

    公开(公告)号:DE19750131C2

    公开(公告)日:2002-06-13

    申请号:DE19750131

    申请日:1997-11-13

    Abstract: A micromechanical differential pressure sensor device for measuring a pressure difference between two mutually separated spaces or media, in which two absolute pressure measuring devices are monolithically integrated on a single support substrate, in particular on a semiconductor chip. The absolute pressure measuring devices are preferably fabricated by surface micromachining.

    25.
    发明专利
    未知

    公开(公告)号:DE10026925C2

    公开(公告)日:2002-04-18

    申请号:DE10026925

    申请日:2000-05-30

    Inventor: WERNER WOLFGANG

    Abstract: The field effect semiconductor has a semiconductor body (1) provided with at least one inner zone (2) of one conductivity type, incorporating at least one base zone (4) of opposite conductivity type at the surface (3) of the semiconductor body, in turn incorporating a source zone (5) with the same conductivity as the inner zone. A further base zone (15) is separated from the first base zone by an intermediate zone (16) with the same conductivity as the inner zone. A source contact zone (17) provides a low-ohmic connection between the source zone, the base zone and the further base zone.

    27.
    发明专利
    未知

    公开(公告)号:DE10038177A1

    公开(公告)日:2002-02-21

    申请号:DE10038177

    申请日:2000-08-04

    Abstract: The invention relates to a semiconductor device which can be controlled by means of a field effect. Said device contains a semiconductor body (100) comprising a doped first and second contact area (20, 22, 24, 30) to which connecting electrodes (90, 92) for applying power supply potential are connected. A first control electrode (40, 42, 44; 48, 49) is insulated in relation to the semiconductor body (100; 200) and can be connected to a first control potential. A second control electrode (60, 62, 64; 66, 68; 67, 69; 61, 63) is arranged adjacently in relation to the first control electrode (40, 42, 44; 48, 49). Said second control electrode is arranged in the semiconductor body in an insulated manner and can be connected to a second control potential.

    Vertical high voltage semiconductor device

    公开(公告)号:DE10012610A1

    公开(公告)日:2001-09-27

    申请号:DE10012610

    申请日:2000-03-15

    Abstract: The device has a semiconductor substrate of a first conductivity type, on which a more lightly doped semiconductor layer of an opposite, second conductivity type or of the first conductivity type is arranged in the form of a drift segment (1) for taking up the blocking voltage of the semiconductor device. In the drift segment, laterally aligned semiconductor regions (3,4;3'4') of first and second conductivity type are alternately arranged. The semiconductor regions (3,3') of the first conductivity type are connected to the semiconductor substrate, on which a first electrode (D;S) is arranged, by an electrically conductive connection (5,5') fed through the semiconductor layer (2,2'). The semiconductor regions (4,4') of the second conductivity type are connected to a second electrode (S,D) on the semiconductor layer by a further conductive connection (6,6') fed through the semiconductor regions (3,4;3',4').

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