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公开(公告)号:SG135934A1
公开(公告)日:2007-10-29
申请号:SG2003075587
申请日:2003-12-18
Applicant: ASML NETHERLANDS BV
Inventor: STEVENS LUCAS HENRICUS JOHANNE , LEENDERS MARTINUS HENDRIKUS AN , MEILING HANS , MOORS JOHANNES HUBERTUS JOSEPH
IPC: B08B7/00 , G03F7/20 , H01L21/027 , B08B6/00
Abstract: Various novel cleaning processes are disclosed. Previous cleaning processes are global in that they involve infusing oxygen into the whole system and switching on a single radiation source which supplies a cleaning beam of radiation to every optical element in the lithographic apparatus. This can lead to overexposure of some optical elements whilst leaving other optical elements not cleaned to a sufficient amount. This is overcome by providing a system which allows selective ones or groups of the optical elements to be cleaned and which allows a spatially varied cleaning to occur across the surface of an optical element. This can be achieved by only supplying the cleaning beam of radiation to one or some of the optical elements and/or by increasing the local oxygen density in the vicinity of certain optical elements. Spatially resolved cleaning can be achieved using gray filters, which may be dynamically adapted, or by using a steerable electron mean beam.
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公开(公告)号:SG126120A1
公开(公告)日:2006-10-30
申请号:SG200602061
申请日:2006-03-28
Applicant: ASML NETHERLANDS BV
Inventor: JACOBS JOHANNES HENRICUS WILHE , BANINE VADIM YEVGENYEVICH , BREWSTER BARRIE DUDLEY , IVANOV VLADIMIR VITALEVITCH , MERTENS BASTIAAN MATTHIAS , MOORS JOHANNES HUBERTUS JOSEPH , LIVESEY ROBERT GORDON , WOLSCHRIJN BASTIAAN THEODOOR
Abstract: A lithographic projection apparatus comprising: - a radiation system for supplying a projection beam of radiation; - a mask table provided with a mask holder for holding a mask; - a substrate table provided with a substrate holder for holding a substrate; - a projection system for imaging an irradiated portion of the mask onto a target portion of the substrate,whereby: a) the projection system is separated from the substrate table by an intervening space which can be at least partially evacuated and which is delimited at the location of the projection system by a solid surface from which the employed radiation is directed toward the substrate table; b) the intervening space contains a hollow tube located between the solid surface and the substrate table and situated around the path of the radiation, the form and size of the tube being such that radiation focused by the projection system onto the substrate table does not intercept a wall of the hollow tube; c) means are provided for continually flushing the inside of the hollow tube with a flow of gas, wherein the gas is hydrogen, helium, deuterated hydrogen, deuterium or a mixture of argon and hydrogen and the flow of the gas is opposed to the flow of contaminants from the substrate and/or the hollow tube is in fluidic communication with the intervening space.
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公开(公告)号:NL1036181A1
公开(公告)日:2009-06-04
申请号:NL1036181
申请日:2008-11-11
Applicant: ASML NETHERLANDS BV
Inventor: VIJVER YURI JOHANNES GABRIEL VAN DE , MOORS JOHANNES HUBERTUS JOSEPH , VERSTEEG WENDELIN JOHANNA MARIA , JONKERS PETER GERARDUS
IPC: G03F7/20 , H01L21/027
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公开(公告)号:DE60131203T2
公开(公告)日:2008-08-07
申请号:DE60131203
申请日:2001-08-23
Applicant: ASML NETHERLANDS BV
Inventor: VAN DER WERF JAN EVERT , KROON MARK , KEUR WILHELMUS CORNELIUS , BANINE VADIM YEVGENYEVICH , VAN DER LAAN HANS , MOORS JOHANNES HUBERTUS JOSEPH , LOOPSTRA ERIK ROELOF
Abstract: A radiation sensor for use with a lithographic apparatus is disclosed, the radiation sensor comprising a radiation-sensitive material which converts incident radiation of wavelength lambda1 into secondary radiation; and sensing means capable of detecting the secondary radiation emerging from said layer.
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公开(公告)号:DE102006054726A1
公开(公告)日:2008-05-29
申请号:DE102006054726
申请日:2006-11-21
Applicant: ZEISS CARL SMT AG , ASML NETHERLANDS BV
Inventor: EHM DIRK HEINRICH , MOORS JOHANNES HUBERTUS JOSEPH , WOLSCHRIJN BASTIAAN THEODOOR , BANINE VADIM , IVANOV VLADIMIR VITALEVITSCH
IPC: B08B7/00
Abstract: A method and an optical arrangement for removing contamination on optical surfaces (26), which are arranged in a vacuum environment in an optical arrangement, preferably in a projection exposure apparatus (1) for EUV lithography. The method includes generating a residual gas atmosphere containing molecular hydrogen (18) and at least one inert gas (17) in the vacuum environment, generating inert gas ions (21) by ionization of the inert gas (17), preferably with EUV radiation (20), and generating atomic hydrogen (27) by acceleration of the inert gas ions (21) in the residual gas atmosphere, to remove the contamination.
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公开(公告)号:SG139554A1
公开(公告)日:2008-02-29
申请号:SG2006026827
申请日:2003-12-18
Applicant: ASML NETHERLANDS BV
Inventor: STEVENS LUCAS HENRICUS JOHANNE , LEENDERS MARTINUS HENDRIKUS AN , MEILING HANS , MOORS JOHANNES HUBERTUS JOSEPH
IPC: B08B7/00 , G03F7/20 , H01L21/027
Abstract: Lithographic Apparatus, Device Manufacturing Method, and Device Manufactured Thereby. Various novel cleaning processes are disclosed. Previous cleaning processes are global in that they involve infusing oxygen into the whole system and switching on a single radiation source which supplies a cleaning beam of radiation to every optical element in the lithographic apparatus. This can lead to overexposure of some optical elements whilst leaving other optical elements not cleaned to a sufficient amount. This is overcome by providing a system which allows selective ones or groups of the optical elements to be cleaned and which allows a spatially varied cleaning to occur across the surface of an optical element. This can be achieved by only supplying the cleaning beam of radiation to one or some of the optical elements and/or by increasing the local oxygen density in the vicinity of certain optical elements. Spatially resolved cleaning can be achieved using gray filters, which may be dynamically adapted, or by using a steerable electron mean beam.
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公开(公告)号:SG134991A1
公开(公告)日:2007-09-28
申请号:SG2003057098
申请日:2003-09-26
Applicant: ASML NETHERLANDS BV
Inventor: VAN DER LAAN HANS , BASELMANS JOHANNES JACOBUS MAT , VAN DIJSSELDONK ANTONIUS JOHAN , LEENDERS MARTINUS HENDRIKUS AN , MOORS JOHANNES HUBERTUS JOSEPH
IPC: G01M11/02 , G03F7/20 , H01L21/027
Abstract: The apparatus has a measurement system with a grating module (3) and a structure to increase pupil filling of radiation in a pupil of a projection system. The module (3) and the structure are movable into a projection beam of the radiation between the projection system and a radiation system. A sensor module senses the radiation traversing the projection system for measuring wave front aberrations of the projection system.
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38.
公开(公告)号:SG115621A1
公开(公告)日:2005-10-28
申请号:SG200400813
申请日:2004-02-20
Applicant: ASML NETHERLANDS BV , ZEISS CARL SMT AG
Inventor: KURT RALPH , VAN BEEK MICHAEL CORNELIS , DUISTERWINKEL ANTONIE ELLERT , KIEFT ERIK RENE , MEILING HANS , MERTENS BASTIAAN MATTHIAS , MOORS JOHANNES HUBERTUS JOSEPH , STEVENS LUCAS HENRICUS JOHANNE , WOLSCHRIJN BASTIAAN THEODOOR
IPC: G01N21/94 , G01N21/27 , G01N21/33 , G01N21/35 , G01N21/956 , G03F7/20 , G21K5/00 , G21K5/02 , H01L21/027 , G01N21/15 , G01M11/00
Abstract: A measuring device for determining contamination of a surface of a component in an lithographic projection apparatus. The measuring device includes a radiation transmitter for transmitting radiation on at least a part of the surface and a radiation receiver for receiving radiation from the component. A processor is communicatively connected to the receiver, for deriving a property of received radiation and deriving a property of the contamination from the property of received radiation.
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公开(公告)号:DE60223630D1
公开(公告)日:2008-01-03
申请号:DE60223630
申请日:2002-07-12
Applicant: ZEISS CARL SMT AG , ASML NETHERLANDS BV
Inventor: LOOPSTRA ERIK ROELOF , FRANKEN DOMINICUS JACOBUS PETR , SMITS JOSEPHUS JACOBUS , VAN DIJSSELDONK ANTONIUS JOHAN , MOORS JOHANNES HUBERTUS JOSEPH , HOF ALBRECHT , MAUL GUENTER , MUHLBEYER MICHAEL , MEHLKOPP KLAUS
Abstract: A lithographic projection apparatus in which the projection system comprises a plurality of optical elements or sensors mounted on a frame. The frame is made of a glass ceramic material with a coefficient of thermal expansion of less than or approximately equal to 0.1 x 10 K thereby avoiding the need for expensive cooling systems and/or predictive temperature compensation.
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公开(公告)号:DE60131203D1
公开(公告)日:2007-12-13
申请号:DE60131203
申请日:2001-08-23
Applicant: ASML NETHERLANDS BV
Inventor: VAN DER WERF JAN EVERT , KROON MARK , KEUR WILHELMUS CORNELIUS , BANINE VADIM YEVGENYEVICH , VAN DER LAAN HANS , MOORS JOHANNES HUBERTUS JOSEPH , LOOPSTRA ERIK ROELOF
Abstract: A radiation sensor for use with a lithographic apparatus is disclosed, the radiation sensor comprising a radiation-sensitive material which converts incident radiation of wavelength lambda1 into secondary radiation; and sensing means capable of detecting the secondary radiation emerging from said layer.
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