Abstract:
The integrated electronic device (1) comprises a protection structure (31) of metal, extending vertically and laterally to and along a predominant part of the periphery of an electronic component (3) integrated underneath the pad region (28). The protection structure (31) comprises a substantially annular region (21; 21b; 21c) formed from the second metal layer (20) and absorbing the stresses exerted on the pad during wire bonding. The annular region may be floating or form part of the path connecting the pad to the electronic component (3).
Abstract:
The integrated inductor (40) comprises a coil (21b) of metal which is formed in the second metal level (21). The coil is supported by a bracket (20a) extending above spaced from a semiconductor material body (3) by an air gap (28) obtained by removing a sacrificial region formed in the first metal level (16). The bracket (20a) is carried by the semiconductor material body (3) through support regions (20b) which are arranged peripherally on the bracket (20a) and are separated from one another by through apertures (36) which are connected to the air gap (28). A thick oxide region (4) extends above the semiconductor material body (3), below the air gap (28), to reduce the capacitive coupling between the inductor and the semiconductor material body (3). The inductor thus has a high quality factor, and is produced by a process compatible with present microelectronics processes.
Abstract:
The process comprises forming a buried sacrificial layer (5) of porous silicon in the starting substrate (2) and then a single-crystal epitaxial layer (7) intended to accommodate both the sensitive element and the integrated circuit. After forming electronic components (12, 18) in the epitaxial layer, the epitaxial layer (7) is anisotropically etched over the buried sacrificial layer (5) to form trenches (27) through which the buried sacrificial layer is then etched and removed. The suspended mass (30) thus obtained has high mechanical properties, high thickness, the process is wholly compatible with standard microelectronics techniques and can be implemented at low cost.
Abstract:
A suspension arm (125) for a head (120) of a disk storage device comprises at least one wall (225, 230) substantially perpendicular to the disk (105) and having a portion (238, 239) which is deformable parallel to a plane extending through a longitudinal axis (235) of the suspension arm (125) and perpendicular to the at least one wall (225, 230), and piezoelectric means (240, 255) which can deform the portion (238, 239) in order correspondingly to move the head (120), the piezoelectric means (240-255) being fixed to the deformable portion (238, 239) of the at least one wall (225, 230).
Abstract:
A sensor (100) with a movable microstructure comprises a sensitive element (105), formed in a first chip (110) of semiconductor material, for producing an electrical signal dependent on a movement of at least one movable microstructure relative to a surface of the first chip (110), the sensitive element (105) being enclosed in a hollow hermetic structure (115), and a circuitry (130) for processing said electrical signal, formed in a second chip (125) of semiconductor material, the hollow hermetic structure (115) including a metal wall (120) disposed on the surface of the first chip (110) around the sensitive element (105), and the second chip (125) being fixed to said wall (120).
Abstract:
The bi-dimensional position sensor (1) can be advantageously used in the turn system controlled from the steering wheel of a vehicle and comprises a permanent magnet (3) fixed to a control lever (4) so as to move in a plane along a first (X) and a second (Y) direction and rotate about a third direction (W) orthogonal to the preceding ones. The permanent magnet is movable with respect to an integrated device comprising a first group of sensor elements (10 1 -10 3 ) arranged spaced along the first direction, a second group of sensor elements (10 4 -10 7 ) arranged spaced along the second direction and a third group of sensor elements (10 8 -10 9 ) detecting the angular position of the permanent magnet. Electronics integrated with the sensor elements generate a code associated with each position which the permanent magnet (3) may assume and a control signal (S) corresponding to the desired function.
Abstract:
In a micro-electromechanical structure (1; 30; 60; 70) of semiconductor material, a detection structure (19; 31) is formed by a stator (5; 35; 61) and by a rotor (4; 34), which are mobile with respect to one another in presence of an external stress and are subject to thermal stress; a compensation structure (24; 46) of a micro-electromechanical type, subject to thermal stress and invariant with respect to the external stress, is connected to the detection structure (19; 31) thereby the micro-electromechanical structure (1; 30; 60; 70) supplies an output signal (ΔC, V OUT ) correlated to the external stress and compensated in temperature.
Abstract:
A planar inertial sensor (1), comprising a first region and a second region (3, 2) of semiconductor material, the second region (2) being capacitively coupled and being mobile with respect to the first region (3), which is fixed. The second region (2) extends in a plane and has second portions (4), which face respective first portions (11) of the first region (3) and are mobile with respect to these so as to modify the distance between them the second region (2) translate with respect to the first region (3) in any direction belonging to the plane of the second region (2).