INSTRUMENT FOR HIGH THROUGHPUT MEASUREMENT OF MATERIAL PHYSICAL PROPERTIES AND METHOD OF USING SAME

    公开(公告)号:CA2344755A1

    公开(公告)日:2001-11-26

    申请号:CA2344755

    申请日:2001-04-18

    Abstract: An apparatus and method for screening combinatorial libraries of materials by measuring the response of individual library members to mechanical perturbations is described. The apparatus generally includes a sample holder for containing t he library members, an array of probes for mechanically perturbing individual library members, and an array of sensors for measuring the response of each of the library members t o the mechanical perturbations. Library members undergoing screening make up a sample array, and individual library members constitute elements of the sample array that are confined to specific locations on the sample holder. During screening, the apparatus mechanically perturbs individual library members by displacing the sample array (sample holder) and the array of probes. Typically, all of the elements of the sample array are perturbed simultaneously, but the apparatus also can also perturb individual or groups of sample array elements sequentially. The flexible apparatus and method can screen librarie s of materials based on many different bulk physical properties, including Young's modulus (flexure, uniaxial extension, biaxial compression, and shear); hardness (indentation), failure (stress and strain at failure, toughness), adhesion (tack, loop tack), and flow (viscosity, meltflow indexing, and rheology), among others.

    SENSOR ARRAY-BASED SYSTEM AND METHOD FOR RAPID MATERIALS CHARACTERIZATION

    公开(公告)号:CA2317743A1

    公开(公告)日:2000-06-22

    申请号:CA2317743

    申请日:1999-12-10

    Abstract: A modular materials characterization apparatus includes a sensor array (10) disposed on a substrate (16), with a standardized array and contact pad (14) format; electronic test and measurement apparatus (54) for sending electrical signals to and receiving electrical signals from the sensor array (10); an apparatus for making electrical contact (50) to the sensors in the standardized array format; an apparatus for routing signals (129) between one or more selected sensors and the electronic test and measurement apparatus and a computer (52) with a computer program recorded therein for controlling the operation of the apparatus. The sensor array (10) is preferably arranged in a standardized format used in combinatorial chemistry applications for rapid deposition of sample materials on the sensor array. An interconnection apparatus (40) and sensor array (10) and contact pad (32) allow measurement of many different material properties by using substrates carrying different sensor types.

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