Abstract:
According to an embodiment of the present invention, a semiconductor device testing apparatus comprises a first socket accommodating a package on which a semiconductor device to be tested is mounted; and a second socket coupled to the first socket. The first socket includes an upper part having a hole accommodating the package and a terminal pad formed at both side ends of the hole to hold input and output terminals of the package; and a lower part having a heating room, which accommodates a heater to heat the semiconductor device, and a temperature sensing part for measuring the temperature of the semiconductor device in the heating room. The second socket comprises a probe card with a pattern to receive a test signal from an external power source.
Abstract:
Provided is a field effect transistor. The transistor includes a capping layer provided on a substrate; source and drain ohmic electrodes spaced apart from each other on the capping layer; first and second insulating layers sequentially laminated on the capping layer to cover the source and drain ohmic electrodes; a Γ-shaped gate electrode including a leg part passing through the second insulating layer, the first insulating layer, and the capping layer and connected with the substrate between the source and drain ohmic electrodes and a head part extended to the second insulating layer; a first planarization layer provided on the second insulating layer to cover the Γ-shaped gate electrode; and a first electrode passing through the first planarization layer and the second and first insulating layers, and connected with the source and drain ohmic electrodes while the being extended to the first planarization layer.
Abstract:
The present invention relates to a GaN (gallium nitride)-based compound power semiconductor device and a manufacturing method thereof. The gallium nitride-based compound power semiconductor device comprises a gallium nitride-based compound element growing on a wafer; a contact pad including a source, a drain and a gate on the gallium nitride-based compound element; a module substrate to which the gallium nitride-based compound element is bonded with a flip chip; a bonding pad formed on the module substrate; and a bump formed on the bonding pad of the module substrate to bond the contact pad and the bonding pad with the flip chip. According to the present invention, processing costs are low by forming the bump on the substrate with a front process (wafer level). According to the present invention, heat generated in an AlGaN HEMT element is quickly discharged becuase a subsource contact pad and subdrain contact pad of the substrate is formed on the substrate. According to the present invention, the heat generated in the AlGaN HEMT element is effectively discharged by forming a via hole on the substrate and filling the via hole with conductive metal.
Abstract:
PURPOSE: A multi-channel beam scan receiver is provided to include a multi-channel antenna in a single substrate. CONSTITUTION: A switch (103) selects one of plurality of signals received through a multi-channel antenna. A first low-noise amplifier (105) firstly amplifies a signal selected in the switch. A band-pass filter (107) filters the firstly amplified signal. A second low-noise amplifier (109) secondly amplifies the filtered signal. A detector (111) converts the secondly amplified signal into voltage. [Reference numerals] (101) Multi-channel antenna; (103) Switch; (105) First low-noise amplifier; (107) Band-pass filter; (109) Second low-noise amplifier; (111) Detector; (115) DC amplifier
Abstract:
PURPOSE: A method for manufacturing a transistor is provided to reduce resistance and parasitic capacitance by controlling the height of a Y-shaped gate electrode according to the thickness of a mold oxide layer with a trench and a depressed part. CONSTITUTION: A source electrode(11) and a drain electrode(12) are formed on a substrate(10). A mold oxide layer is formed on the substrate. A depressed part is formed on the upper side of the mold oxide layer between the source electrode and the drain electrode. A trench which exposes the substrate is formed by removing the mold oxide layer in the depressed part. A recess(26) is formed by removing the substrate exposed by the trench with a preset depth. A Y shaped gate electrode(30) is connected from the recess to the depressed part.
Abstract:
PURPOSE: A method for manufacturing a pseudomorphic high electron mobility transistor device is provided to satisfy wideband characteristics and unconditionally stable conditions by including a negative feedback circuit. CONSTITUTION: In a method for manufacturing a pseudomorphic high electron mobility transistor device, an epitaxial substrate is provided(101). A source and a drain are formed on a substrate. The epitaxial substrate is processed by a gate recess etching including a dry and wet method to form a recess region. The gate(180) is formed in the recess region.
Abstract:
PURPOSE: A super high frequency amplifier and a bias circuit for the same are provided to optimize performance by adjusting a source voltage, regardless of a change in the properties of a depletion-type FET(Field Effect Transistor) due to the process change. CONSTITUTION: An amplifier circuit amplifies a high frequency signal through a depletion-type FET(30). An input matching circuit(20) matches the inputted high frequency signal in the depletion-type FET. An output matching circuit(40) matches the amplified signal, and thereby outputs the matched signal. A bias circuit(80) gives a negative value to a voltage between a gate and a source of the depletion-type FET by applying a positive voltage to the source of the depletion-type FET. The bias circuit tunes the voltage between the gate and the source by changing the positive voltage applied to the source.
Abstract:
An RF transceiver for a millimeter wave band radar senor using an MMIC(Monolithic Microwave Integrated Circuit) is provided to enable a signal isolation block to frequency-convert a signal, transmitted from a transmission block, by using an IF of a local oscillation signal and transmit the frequency-converted signal through a band pass filter, thereby improving receive sensitivity as much as 20 to 30db. An RF transceiver for a radar senor comprises the followings: a transmission block(120) which amplifies a modulation signal and radiates the amplified modulation signal through a transmission antenna(106); a signal isolation block(122) which performs frequency conversion on a signal, transmitted from the transmission block(120), by using the IF(Intermediate Frequency) of a local oscillation signal and transmits the frequency-converted signal through a band pass filter(116); a reception block(121) which mixes an external signal, received through a receiving antenna(107), with a signal transmitted from the signal isolation block(122) and transmits the mixed signal; and an IF block(123) which receives a signal transmitted from the reception block(121), mixes the received signal with the local oscillation signal, and amplifies the mixed signal to outputs a bit signal.
Abstract:
An RF electronic device and its manufacturing method are provided to obtain a uniform and precise T shaped gate electrode and to prevent the short of the T shaped gate electrode by using a T shaped insulating gate pattern. An etch stop layer(307) and an ohmic layer(308) are formed on a substrate(301). An insulating layer is formed on the ohmic layer. An insulating gate pattern is formed on the resultant structure by patterning selectively the insulating layer. A spacer is formed on the insulating gate pattern. A gate recess is formed on the etch stop layer and the ohmic layer by etching partially the etch stop layer and the ohmic layer. A first metal film is formed on the resultant structure. A photoresist pattern is formed on the first metal film. A second metal film is then formed on the photoresist pattern. The first metal film is eliminated from the resultant structure by using the second metal film as a mask.