Abstract:
Disclosed is a source for and method of generating extreme ultraviolet radiation in which spitting of molten target material is hindered through depletion of the number of hydrogen radicals available to enter deposits of molten target material and create hydrogen bubbles therein by introducing an active gas that reacts with the hydrogen radicals.
Abstract:
A droplet generator, for an EUV radiation source, comprises: a capillary in which, in use, molten material flows; an actuator configured to modulate a pressure inside the capillary; and a controller configured to drive the actuator at a driving frequency; wherein the droplet generator is arranged such that, in use, the driving frequency is equal or about equal to a main resonance frequency of the molten material in the capillary.
Abstract:
The invention relates to a method for determining a suppression factor of a suppression system. The suppression system is arranged to suppress migration of a contaminant gas out of a first system. The suppression factor is an indication of the performance of the suppression system. The method includes introducing a tracer gas in the sub-system, providing a detection system configured to detect the amount of tracer gas that has migrated out of the first system, determining a first suppression factor for the suppression system for the tracer gas. The method further includes determining a second suppression factor for the suppression system for the contaminant gas based on the first suppression factor.
Abstract:
A radiation source (SO) comprising a fuel source configured to deliver fuel to a location (12) from which the fuel emits EUV radiation. The radiation source further comprises an immobile fuel debris receiving surface (24c, d) provided with a plurality of grooves. The grooves have orientations which are arranged to direct the flow of liquid fuel under the influence of gravity in one or more desired directions.
Abstract:
A collector mirror assembly (302) includes a collector mirror (co') that includes a reflective surface (304) and a hole (306) having an edge (308). The hole extends through the reflective surface. The assembly also includes a tubular body (310) having an inner surface (312) and an outer surface (314). The tubular body is constructed and arranged to guide a gas flow (GF) in a direction substantially transverse to the reflective surface. The outer surface of the tubular body and the edge of the hole form an opening (316) arranged to guide a further gas flow (GF' ) that diverges with respect the gas flow substantially transverse to the reflective surface.
Abstract:
A lithographic apparatus arranged to project a pattern from a patterning device onto a substrate is disclosed. The lithographic apparatus includes an illumination system (IL) and an outlet connected to a pumping system (78) to pump away gas from between an inner wall (64) and outer wall (62) of the illumination system (IL) or, if a radiation source (SO) is present, between the inner wall (64) of the illumination system (IL) and an inner wall (62) of the radiation source (SO).
Abstract:
A radiation source including a chamber including a plasma formation region, a radiation collector arranged in the chamber, the radiation collector configured to collect radiation emitted at the plasma formation region and to direct the collected radiation to an intermediate focus region, a debris mitigation system configured to direct a first gas flow from the intermediate focus region towards the plasma formation region, and a guiding device arranged in the chamber such that the first gas flow is directed around the guiding device. A system and apparatus for reducing contamination of an inner vessel wall of an EUV vessel is provided. The system and apparatus include inner vessel wall supplies of gas that introduce gas via a plurality of nozzles away from the inner vessel wall. The system and apparatus also optionally include an asymmetric exhaust to exhaust gas from the EUV vessel while providing flow geometries that promote a direction of gas away from the inner vessel wall and an EUV collector within the EUV vessel.
Abstract:
Disclosed is a radiation source module, and associated method of transporting fuel debris out of a source chamber. The radiation source module generates a radiation producing plasma (2) at a plasma formation site by excitation of a fuel. The radiation source (SO) comprises: a source chamber (435); a radiation collector (400) within the source chamber for collecting and focusing said radiation; a primary buffer gas inlet (410) for admitting a primary buffer gas (415) into the source chamber; and a buffer gas outlet (420) in the vicinity of said radiation collector, for exhausting said primary buffer gas from the source chamber. Also disclosed is a multi-layer mirror, and in particular a radiation collector, comprising a substrate coated with at least one reflective layer and a plurality of perforations within the reflective layer.
Abstract:
Disclosed is a radiation source configured to generate a beam of EUV radiation by excitation of a fuel. The radiation source comprises a gas stream generation module which preconditions a droplet of the fuel by application of a high velocity gas stream to the droplet. Also disclosed is a lithographic apparatus comprising such a radiation source.
Abstract:
A radiation source for generating extreme ultraviolet radiation for a lithographic apparatus has a debris mitigation device comprising a nozzle arranged at or near an intermediate focus (IF) of the beam of radiation. The nozzle serves to direct a flow of gas (330) towards the radiation source or collector optic in order to deflect particulate debris (43) emitted by the radiation source.