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公开(公告)号:KR20180039671A
公开(公告)日:2018-04-18
申请号:KR20187006615
申请日:2016-08-31
Applicant: FUJIFILM CORP
Inventor: NIHASHI WATARU , TSUBAKI HIDEAKI , TSUCHIHASHI TORU , YAMAMOTO KEI
Abstract: 특히극미세의잔류패턴의형성에있어서, 막감소가적어, 높은해상력을얻을수 있는패턴형성방법, 상기패턴형성방법을포함하는전자디바이스의제조방법, 및상기패턴을형성하기위한적층체를제공한다. 패턴형성방법으로서, (a) 감활성광선성또는감방사선성조성물에의하여감활성광선성또는감방사선성막을형성하는공정, (b) 감활성광선성또는감방사선성막상에상층막형성용조성물에의하여상층막을형성하는공정, (c) 상층막이형성된감활성광선성또는감방사선성막을노광하는공정, 및 (d) 노광된감활성광선성또는감방사선성막을, 현상액으로현상하는공정을포함하고, 상층막형성용조성물이, 가교제를포함한다. 전자디바이스의제조방법은, 상기패턴형성방법을포함한다. 적층체는, 감활성광선성또는감방사선성막과, 가교제를포함하는상층막을갖는다.
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公开(公告)号:AT551633T
公开(公告)日:2012-04-15
申请号:AT08011701
申请日:2008-06-27
Applicant: FUJIFILM CORP
Inventor: TARUTANI SHINJI , TSUBAKI HIDEAKI , WADA KENJI
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公开(公告)号:AT533086T
公开(公告)日:2011-11-15
申请号:AT07017721
申请日:2007-09-11
Applicant: FUJIFILM CORP
Inventor: TSUBAKI HIDEAKI
Abstract: A photosensitive composition contains: a compound capable of generating an acid upon irradiation with actinic rays or radiation; a basic compound represented by the formula (I-a) as defined herein; a basic compound represented by the formula (I-b) as defined herein; and a surfactant represented by the formula (II) as defined herein.
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4.PATTERN FORMING METHOD, ELECTRON BEAM-SENSITIVE OR EXTREME ULTRAVIOLET-SENSITIVE COMPOSITION, RESIST FILM, METHOD FOR MANUFACTURING ELECTRONIC DEVICE USING THE SAME, AND ELECTRONIC DEVICE 审中-公开
Title translation: 结构上形成法,电子敏感或极紫外线辐射敏感组合物,抗蚀层,方法的电子设备和电子设备公开(公告)号:EP2761374A4
公开(公告)日:2015-05-27
申请号:EP12837295
申请日:2012-09-14
Applicant: FUJIFILM CORP
Inventor: TAKIZAWA HIROO , IWATO KAORU , TSUBAKI HIDEAKI
IPC: G03F7/038 , G03F7/004 , G03F7/039 , G03F7/32 , H01L21/027
CPC classification number: G03F7/0388 , G03F7/0045 , G03F7/0046 , G03F7/038 , G03F7/0392 , G03F7/0397 , G03F7/11 , G03F7/2041 , G03F7/325 , G03F7/405
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5.ORGANIC SOLVENT DEVELOPMENT OR MULTIPLE DEVELOPMENT PATTERN-FORMING METHOD USING ELECTRON BEAMS OR EUV RAYS 有权
Title translation: 结构成形过程的一个或多个有机溶剂中的开发中使用电子束或射线EUV公开(公告)号:EP2399171A4
公开(公告)日:2012-07-11
申请号:EP10743883
申请日:2010-02-19
Applicant: FUJIFILM CORP
Inventor: TSUBAKI HIDEAKI , SHIRAKAWA KOJI , TSUCHIHASHI TORU
IPC: G03F7/32 , G03F7/038 , G03F7/039 , H01L21/027
CPC classification number: G03F7/325 , G03F7/0392 , G03F7/0397 , G03F7/322
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6.ACTINIC-RAY- OR RADIATION-SENSITIVE RESIN COMPOSITION AND METHOD OF FORMING PATTERN USING THE COMPOSITION 审中-公开
Title translation: 光化辐射敏感性树脂组合物及结构形成方法使用该组合物公开(公告)号:EP2433178A4
公开(公告)日:2012-11-21
申请号:EP10777867
申请日:2010-05-20
Applicant: FUJIFILM CORP
Inventor: TSUCHIHASHI TORU , TSUBAKI HIDEAKI , SHIRAKAWA KOJI , TAKAHASHI HIDENORI , TSUCHIMURA TOMOTAKA
IPC: G03F7/039 , G03F7/004 , H01L21/027
CPC classification number: G03F7/0045 , G03F7/0046 , G03F7/0397
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7.RESIST COMPOSITION FOR NEGATIVE WORKING-TYPE DEVELOPMENT, AND METHOD FOR PATTERN FORMATION USING THE RESIST COMPOSITION 有权
Title translation: PHOTO涂料组合物与PHOTO涂料组合物,教育结构发展不利的工作和方法公开(公告)号:EP2157477A4
公开(公告)日:2012-04-11
申请号:EP08777178
申请日:2008-06-12
Applicant: FUJIFILM CORP
Inventor: TSUBAKI HIDEAKI
IPC: G03F7/004 , G03F7/039 , G03F7/32 , H01L21/027
CPC classification number: G03F7/325 , G03F7/0045 , G03F7/0046 , G03F7/0392 , G03F7/0397 , G03F7/2041 , G03F7/30 , G03F7/32
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8.PATTERN-FORMING METHOD, ELECTRON BEAM-SENSITIVE OR EXTREME ULTRAVIOLET RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM, MANUFACTURING METHOD OF ELECTRONIC DEVICE USING THEM AND ELECTRONIC DEVICE 审中-公开
Title translation: 结构上形成法,电子敏感或极紫外线辐射敏感树脂组合物保护层,方法的电子设备和电子设备公开(公告)号:EP2756353A4
公开(公告)日:2015-04-29
申请号:EP12831380
申请日:2012-09-11
Applicant: FUJIFILM CORP
Inventor: TAKIZAWA HIROO , TSUBAKI HIDEAKI , HIRANO SHUJI
IPC: G03F7/038 , C08F212/14 , C08F220/10 , G03F7/004 , G03F7/039 , H01L21/027
CPC classification number: G03F7/0041 , C08F12/20 , C08F12/24 , C08F212/14 , C08F212/32 , G03F7/004 , G03F7/038 , G03F7/039 , G03F7/0392 , G03F7/0397 , G03F7/20 , G03F7/2037 , G03F7/2059 , G03F7/325 , H01J37/3174
Abstract: A pattern-forming method includes in this order: step (1) of forming a film with an electron beam-sensitive or extreme ultraviolet radiation-sensitive resin composition that contains (A) a resin having an acid-decomposable repeating unit and capable of decreasing a solubility of the resin (A) in a developer containing an organic solvent by an action of an acid, (B) a compound capable of generating an acid upon irradiation with an electron beam or extreme ultraviolet radiation and (C) a solvent; step (2) of exposing the film with an electron beam or extreme ultraviolet radiation; and step (4) of forming a negative pattern by development of the film with a developer containing an organic solvent after the exposing of the film, wherein a content of the compound (B) is 21% by mass to 70% by mass on the basis of all solids content of the composition.
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9.CHEMICAL AMPLIFICATION RESIST COMPOSITION, AND MOLD PREPARATION METHOD AND RESIST FILM USING THE SAME 审中-公开
Title translation: 化学增强的抗蚀剂组合物方法以及FORM抗蚀膜生产订单公开(公告)号:EP2399168A4
公开(公告)日:2013-06-05
申请号:EP10792234
申请日:2010-06-23
Applicant: FUJIFILM CORP
Inventor: FUJIMORI TORU , SHIRAKAWA KOJI , USA TOSHIHIRO , SUGIYAMA KENJI , ITO TAKAYUKI , TSUBAKI HIDEAKI , NISHIMAKI KATSUHIRO , HIRANO SHUJI , TAKAHASHI HIDENORI
IPC: G03F7/039 , B29C33/38 , B29C59/02 , C08F12/00 , C08F20/00 , C08F20/50 , G03F7/00 , G03F7/004 , H01L21/027
CPC classification number: C08F20/50 , B29C33/38 , B29C2033/426 , B29C2059/023 , B82Y10/00 , B82Y40/00 , G03F7/0002 , G03F7/0017 , G03F7/0046 , G03F7/0392 , G03F7/0397
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公开(公告)号:EP2761373A4
公开(公告)日:2015-06-10
申请号:EP12836848
申请日:2012-08-28
Applicant: FUJIFILM CORP
Inventor: INOUE NAOKI , TAKIZAWA HIROO , HIRANO SHUJI , TSUBAKI HIDEAKI
IPC: G03F7/038 , C08F212/02 , C08F220/10 , G03F7/039 , G03F7/32 , H01L21/027
CPC classification number: G03F7/2002 , C08F12/24 , C08F212/14 , G03C1/733 , G03F7/0046 , G03F7/0397 , G03F7/0758 , G03F7/2039 , G03F7/2041 , G03F7/325 , C08F212/32
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