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公开(公告)号:JPH065792A
公开(公告)日:1994-01-14
申请号:JP2566293
申请日:1993-02-15
Applicant: ST MICROELECTRONICS SRL
Inventor: CONSIGLIO PIETRO , ERRATICO PIETRO
Abstract: PURPOSE: To maintain a required function, even when a voltage lower than a reference voltage of a substrate is applied to a circuit. CONSTITUTION: This substrate insulating device comprises a power source terminal connected to a terminal 106 of a functional integrated element 100. The element 100 has at least one junction reversely biased, with respect to the substrate 104 specified with the element 100 thereon.
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公开(公告)号:JPH06244930A
公开(公告)日:1994-09-02
申请号:JP18150993
申请日:1993-07-22
Applicant: ST MICROELECTRONICS SRL
Inventor: TOMASINI LUCIANO , CASTELLO RINALDO , ERRATICO PIETRO
Abstract: PURPOSE: To synthesize impedance related with the circuit of a telephone subscriber connected with a pair-wire telephone line. CONSTITUTION: One precision resistor R is serially connected with a line 3, and this circuit is provided with at least one low-pass filter 8 and an amplifier 7 between the filter 8 and the resistor R. Thus, a terminal impedance can be synthesized with a balanced impedance by one outside precision element.
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3.
公开(公告)号:JPH066423A
公开(公告)日:1994-01-14
申请号:JP2566393
申请日:1993-02-15
Applicant: ST MICROELECTRONICS SRL
Abstract: PURPOSE: To avoid the occurrence of the erroneous closing of a device switch in telephone communication. CONSTITUTION: A device for limiting an operating voltage for the device switch in elephone communication includes connecting terminals 20 and 21 to a telephone line, and a connection and a source branch for a control circuit 24 extending from the 1st terminal 21. The branch has a 1st switch 25. The cathode terminal of a 1st Zener diode 26 and the source terminal of a 1st MOSFET transistor 27 are connected to the output terminal of the 1st switch 25. The gate terminal of the 1st MOSFET transistor 27 is connected to the 1st terminal 2 via the anode terminal of the Zener diode 26. A current absorbed by this device may be controlled.
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4.
公开(公告)号:JP2001291839A
公开(公告)日:2001-10-19
申请号:JP2001054817
申请日:2001-02-28
Applicant: ST MICROELECTRONICS SRL
Inventor: ERRATICO PIETRO , SACCHI ENRICO , VILLA FLAVIO , BARLOCCHI GABRIELE , CORONA PIETRO
IPC: H01L21/822 , B81C1/00 , G01N37/00 , H01L21/306 , H01L21/308 , H01L21/314 , H01L21/316 , H01L27/04
Abstract: PROBLEM TO BE SOLVED: To solve the problem that, in forming an embedding cavity within a semiconductor material main body in the prior art, a special mask needed complicates the processes, or increases the cost, or further increas the area where the cavity occupies on silicon. SOLUTION: This process comprises the steps of: forming, on a top part of a semiconductor material wafer, a perforated mask which contains a plurality of openings each having a substantially square shape and a side face having an inclination of 45 deg. with respect to the flat part of the semiconductor material wafer, and has a lattice structure, using the perforated mask to perform anisotropic etching on the semiconductor material wafer in TMAH, thereby forming a cavity having a section of a reverse isosceles trapezoid, and using TEOS to perform a chemical vapor phase growth, thereby forming a TEOS layer which can completely airtightly close the opening of the perforated mask, can define a film coating on the cavity, and can form later a suspended integration structure.
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公开(公告)号:JPH04321224A
公开(公告)日:1992-11-11
申请号:JP28066491
申请日:1991-10-01
Applicant: ST MICROELECTRONICS SRL
Inventor: BALDI LIVIO , ERRATICO PIETRO
IPC: H01L21/28 , H01L21/285 , H01L21/302 , H01L21/3065 , H01L21/768
Abstract: PURPOSE: To secure flatness of a hole and an insulating layer, without decrease of a filler by overetching a 1st metallic substance, so as to remove a residue of a metallic substance present on an unmasked surface. CONSTITUTION: A tungsten peak of a plug 1, which is coplanar with the surface of an insulating layer 2, is completely masked with a cap 5 of resist. After this masking, etching conditions is corrected more preferably over operation under conditions similar to precedent etching-back conditions for decreasing the anisotropy of etching, thereby over-etching a tungsten residue in an RIE plasma, while increasing the selectivity of an insulating substance (oxide) forming a separate layer 2. For this purpose, a 2nd masked etching-back process of tungsten filling for removing the residue is performed in a mixture of F6 , Cl2 , and Ar and/or under a pressure lower than the 1st etching-back step.
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公开(公告)号:IT1261880B
公开(公告)日:1996-06-03
申请号:ITMI920338
申请日:1992-02-17
Applicant: ST MICROELECTRONICS SRL
Inventor: CONSIGLIO PIETRO , ERRATICO PIETRO
Abstract: A substrate insulation device includes power supply terminals which are connected to a terminal (106) of an active integrated element (100) which has, with respect to a substrate (104) on which it is defined, at least one reverse-biased junction (103).
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公开(公告)号:IT1254796B
公开(公告)日:1995-10-11
申请号:ITMI920339
申请日:1992-02-17
Applicant: ST MICROELECTRONICS SRL
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公开(公告)号:DE69228807T2
公开(公告)日:1999-08-12
申请号:DE69228807
申请日:1992-07-22
Applicant: ST MICROELECTRONICS SRL
Inventor: TOMASINI LUCIANO , CASTELLO RINALDO , ERRATICO PIETRO
Abstract: A circuit (1) for synthesizing an impedance associated with a telephone subscriber's circuit (2) connected to a two-wire telephone line (3) is a positive feedback configuration comprising: a single precision resistance (R) connected serially to the line (3); at least one low-pass filter; and an amplifier (7) between the filter (8) and the resistance (R). This circuit (1) allows both the termination impedance and the balance impedance to be synthesized through a single external precision component.
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公开(公告)号:ITVI20110246A1
公开(公告)日:2013-03-15
申请号:ITVI20110246
申请日:2011-09-14
Applicant: ST MICROELECTRONICS SRL
Inventor: DEPETRO RICCARDO , ERRATICO PIETRO
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公开(公告)号:DE69324621T2
公开(公告)日:1999-12-09
申请号:DE69324621
申请日:1993-02-12
Applicant: ST MICROELECTRONICS SRL
Inventor: CONSIGLIO PIETRO , ERRATICO PIETRO
Abstract: A substrate insulation device includes power supply terminals which are connected to a terminal (106) of an active integrated element (100) which has, with respect to a substrate (104) on which it is defined, at least one reverse-biased junction (103).
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