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    Broad spectrum spectrometer apparatus
    121.
    发明授权
    Broad spectrum spectrometer apparatus 失效
    宽光谱仪器

    公开(公告)号：US5784158A

    公开(公告)日：1998-07-21

    申请号：US755486

    申请日：1996-11-22

    Applicant: Alexei Stanco ,  Mark Aizfagendler

    Inventor： Alexei Stanco ,  Mark Aizfagendler

    IPC: G01J3/02 ,  G01J3/12 ,  G01J3/28

    CPC classification number: G01J3/12 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0213 ,  G01J3/0229 ,  G01J3/024 ,  G01J3/0254 ,  G01J3/28

    Abstract: This invention is for a broad spectrum apparatus that provides a substantially uniform spectral response from a spectrometer by introducing one or more elements whose combined response or correction factor is the inverse of that produced by the rest of the apparatus. The response of the elements can be formed either pre or post dispersion. In the case of pre-dispersion the correcting components may be optical components chosen from a full combination of optical filters, either purely transmissive or a combination of transmissive and reflective as in the case of dichroic mirrors, optical lenses with chromatic aberration, integrating spheres or other diffusers coated with material whose response is wavelength dependant. The post-dispersive application may involve a spatial filter or shaped aperture to partially block the more intense wavelengths. A particular attractive application may be a mask that is directly etched onto the surface of a CCD array detector. Post-dispersive applications may also include custom neutral density filters or variable neutral density filters.

    Abstract translation: 本发明涉及一种广谱设备，其通过引入一个或多个元件提供来自光谱仪的基本上均匀的光谱响应，其中组合的响应或校正因子与设备的其余部分产生的相反。 元件的响应可以在分散之前或之后形成。 在预分散的情况下，校正组件可以是从完全组合的滤光器中选择的光学组件，纯滤光器，纯透光或透射和反射组合，如在分色镜的情况下，具有色差的光学透镜，积分球或 其他涂覆有响应波长依赖的材料的扩散器。 后分散应用可以涉及空间滤波器或成形孔以部分地阻挡更强的波长。 特别有吸引力的应用可以是直接蚀刻到CCD阵列检测器的表面上的掩模。 后分散应用还可以包括定制的中性密度滤光片或可变中性密度滤光片。

    Double-beam photometer including structure to eliminate re-radiation from the output signals
    123.
    发明授权
    Double-beam photometer including structure to eliminate re-radiation from the output signals 失效
    双波束测光仪，包括消除输出信号反辐射的结构

    公开(公告)号：US3560098A

    公开(公告)日：1971-02-02

    申请号：US3560098D

    申请日：1969-04-30

    Applicant: BODENSEEWERK PERKIN ELMER CO

    Inventor： WITTE WOLFGANG ,  MARCKMANN JOACHIM

    IPC: G01J3/42 ,  G01J1/36 ,  G01N21/22

    CPC classification number: G01J3/42 ,  G01J3/0213

    Abstract: A DOUBLE-BEAM PHOTOMETRIC SYSTEM (E.G., A SPECTROPHOTOMETER) CAUSES THE RADIATION FROM THE SOURCE TO PASS THROUGH THE (FIRST) SAMPLE PATH DURING A FIRST QUARTERPERIOD TO THE DETECTOR, SO THAT THE DETECTOR RECEIVES SAMPLE-TRANSMITTED RADIATION, P, PLUS "CHARACTERISTIC" RADITION GENERATED BY THE ELEMENTS IN THE SAMPLE PATH, P0. DURING THE SECOND QUARTER-PERIOD THE RADIATION IS BLOCKED FROM THE SAMPLE PATH, WHILE THE DETECTOR "SEES" THIS SAME PATH, THEREBY OBTAINING ONLY THE "CHARACTERISTIC" SAMPLE PATH RADITION, P0. DURING THE THIRD QUARTERPERIOD BOTH THE SOURCE RADIATION AND THE PATH TO THE DETECTOR ARE SWITCHED TO THE SECOND REFERENCE PATH, SO THAT THE DETECTOR "SEES" REFERENCE TRANSMITTED SOURCE ENERGY, V, PLUS RE-RADIATION FROM THE REFERENCE PATH ELEMENTS, V0. IN THE FINAL QUARTER-PERIOD THE SOURCE RADIATION IS BLOCKED FROM THE REFERENCE PATH, SO THAT THE DETECTOR SEES ONLY THE REFERENCE PATH RE-RADIATION, V0. THUS THE FOUR QUARTER-PERIOD SIGNALS ARE: P+P0, P0 V+V0, AND V0. BY SYNCHRONOUSLY DEMODULATING THE DE TECTOR SIGNAL SO AS TO INVERT THE SECOND AND THIRD QUARTERPERIODS TOGETHER RELATIVE TO THE FIRST AND FOURTH, THE FOUR SIGNALS BECOME: +P+P0, -P0, -V -V0, AND +V0. THUS THE D.C. SUM OF THE SIGNALS IS P-V, FREE OF ALL RERADITION COMPONENTS, WHICH SIGNAL MAY THEREFORE BE UTILIZED IN A CONVENTIONAL SERVO-SYSTEM TO DRIVE A REFERENCE BEAM ATTENUATOR SO AS TO CAUSE A NULLING OF THE DIFFERENCE BETWEEN P AND THE ATTENUATED V SIGNAL. THIS SYSTEM IS RELATIVELY INSENSITIVE TO ERRORS IN PHASE SYNCHRONIZATION OF THE OPTICAL SWITCHING MEANS (E.G., ROTATING SECTOR CHOPPERS) AND THE ELECTRICAL DEMODULATOR.

    SPECTROSCOPIC SENSOR
    130.
    发明申请
    SPECTROSCOPIC SENSOR 有权
    光谱传感器

    公开(公告)号：US20150138560A1

    公开(公告)日：2015-05-21

    申请号：US14400702

    申请日：2013-05-08

    Applicant: HAMAMATSU PHOTONICS K.K.

    Inventor： Takashi Kasahara ,  Katsumi Shibayama

    IPC: G01J3/26 ,  G01J3/45

    CPC classification number: G01J3/26 ,  G01J3/0213 ,  G01J3/2803 ,  G01J3/45 ,  G01J2003/1234

    Abstract: A spectroscopic sensor 1A comprises an interference filter unit 20A having a cavity layer 21 and first and second mirror layers 22, 23 and a light detection substrate 30 having a light-receiving surface 32a for receiving light transmitted through the interference filter unit 20A. The interference filter unit 20A has a first filter region 24 corresponding to the light-receiving surface 32a and a ring-shaped second filter region 25 surrounding the first filter region 24. The light detection substrate 30 has a plurality of pad units 33a contained in the second filter region 25, while the second filter region 25 is formed with through holes 6 for exposing the pad units 33a to the outside.

    Abstract translation: 分光传感器1A包括具有空腔层21和第一和第二镜层22,23的干涉滤光器单元20A和具有用于接收透过干涉滤光器单元20A的光的光接收表面32a的光检测基板30。 干涉滤光器单元20A具有对应于受光面32a的第一滤光区域24和围绕第一滤光区域24的环状的第二滤光器区域25.光检测基板30具有包含在第一滤光区域 第二过滤器区域25，而第二过滤器区域25形成有用于将焊盘单元33a暴露于外部的通孔6。

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