Abstract:
An encoder spectrograph is used to analyze radiation from one or more samples in various configurations. The radiation is analyzed by spatially modulating the radiation after it has been dispersed by wavelength or imaged along a line. Dual encoder spectrographs may be used to encode radiation using a single modulator. A spectra sorting algorithm is used to determine calibration training spectra for a spectrometer in a spectrometer calibration training mode.
Abstract:
An encoder spectrograph is used to analyze radiation from one or more samples in various configurations. The radiation is analyzed by spatially modulating the radiation after it has been dispersed by wavelength or imaged along a line. Dual encoder spectrographs may be used to encode radiation using a single modulator. An encoder spectrograph may be used wherein the first optics comprises a diffraction grating that is optimized for an annular-shaped intercept between the dispersed image and the radiation filters on a modulator.
Abstract:
An apparatus and method are provided for creating an image of a microarray. The apparatus includes at least one light source configured to direct light toward the microarray. The apparatus includes an excitation filter configured to filter the light into a first frequency band towards dichromatic mirror. The dichromatic mirror reflects light onto the microarray causing the microarray to emit electromagnetic energy. The apparatus includes emission filter configured to filter the electromagnetic energy within a second frequency band. The apparatus further includes an imaging unit having a charged coupled device (CCD), the CCD having an imaging surface masked by a pinhole blind such that when the pinhole blind receives electromagnetic energy from the emission filter, an image is created of the entire micro array.
Abstract:
An optical spectrometer distinguishes ambiguity between different wavelength constituent components present in incident light. A spatial filter in the spectrometer spatially filters the incident light. A dispersion system receives the spatially filtered light and disperses images of the spatial filter in a wavelength dependent fashion such that two or more wavelength-specific images at least partially overlap at a detector system. The detector system comprises a detector array and processor that detects and processes the dispersed light to remove ambiguity between one or more of the overlapping images. The detector array may detect coded aperture images associated with a coded aperture spatial filter defined by a coded aperture function, and the processor may process the detector array output signals using an analysis function that complements the coded aperture function. The detector system may filter the spatial filter images and electronically process the resulting detector array output signals.
Abstract:
A spectrophotometric system includes a zoom lens assembly that is mounted for axial translation relative to an integrating sphere. The zoom lens assembly includes first and second focusing lens mounted to an axially movable lens carrier. The lens carrier is positioned intermediate first and second sets of mirrors for reflecting/directing SCE and SCI beams toward fiber ports. A reference beam is also emitted from the integrating sphere and transmitted to a processor, thereby resulting in simultaneous tri-beam measurements. The disclosed spectrophotometric systems may also include an aperture plate detection assembly and/or a sample holder assembly that incorporates a dampening gas spring. The aperture plate detection system includes a detection disk that may include a plurality of pre-positioned sensors that interact with an activating ridge formed on the aperture plate for identification thereof.
Abstract:
An encoder spectrograph is used to analyze radiation from one or more samples in various configurations. The radiation is analyzed by spatially modulating the radiation after it has been dispersed by wavelength or imaged along a line. Dual encoder spectrographs may be used to encode radiation using a single modulator.
Abstract:
In one embodiment, the disclosure relates to a method including: collecting photons from the sample having a plurality of regions to form a sample optical data set; selectively transmitting a first portion of the optical data set through a first of a plurality of apertures of an electro-optical shutter, each of the plurality of apertures optically communicating a portion of the optical data set; geometrically conforming the first portion of the optical data set for communication with a spectrometer opening; processing the conformed first portion of the optical data set at the spectrometer to obtain a spectrum for a first of the plurality of sample regions.
Abstract:
A device for selectively detecting specific wavelength components of a light beam includes a spectral spreading element for spectrally spreading the light beam, and a detector array arranged downstream of the element. The detector array includes light-insensitive regions and light-sensitive regions. The element and the detector array are matched to each other so that selectable wavelength components of the light beam hit the light-insensitive regions and remaining wavelength components of the light beam hit the light-sensitive regions.
Abstract:
The present invention relates to a method and system of array imaging that extends or maximizes the longevity of the sensor array by minimizing the effects of photobleaching. The imaging system has a light source, a variable exposure aperture, and a variable filter system. The system extends the longevity of sensors by (1) using the variable exposure aperture to selectively expose sections of the sensor array containing representative numbers of each type of sensor, and/or (2) using the variable filter system to control the intensity of the excitation light, providing only the intensity required to induce the appropriate excitation and increasing that intensity over time as necessary to counteract the effects of photobleaching.
Abstract:
A spectroscopic ellipsometer or polarimeter system having a source of a polychromatic beam of electromagnetic radiation, a polarizer, a stage for supporting a material system, an analyzer, a dispersive optics and a detector system which comprises a multiplicity of detector elements, there being apertures before the stage for supporting a material system, and thereafter, the system being present in an environmental control chamber.