Wavelength calibration method for monochromator

    公开(公告)号:US09752934B2

    公开(公告)日:2017-09-05

    申请号:US14478903

    申请日:2014-09-05

    Inventor: Hiroyuki Minato

    CPC classification number: G01J3/18 G01J3/28 G01J2003/2866

    Abstract: Provided is a method for performing a wavelength calibration of a monochromator with a diffraction grating by casting light from a standard light source whose emission intensity contains a change with a predetermined cycle onto the diffraction grating and measuring an intensity of light reflected by the grating. The method includes the steps of: measuring at least two times the intensity of the reflected light from the grating within the aforementioned cycle at each of the rotational positions of the grating corresponding to a range of wavelengths including a peak wavelength of a bright line spectral light generated by the standard light source; determining an intensity value 201 at each rotational position based on all the measured values obtained at the rotational position; and locating, as the peak wavelength of the bright line spectral light, a wavelength at which the intensity value 201 is maximized.

    OPTICAL SENSOR
    173.
    发明申请
    OPTICAL SENSOR 审中-公开

    公开(公告)号:US20170244218A1

    公开(公告)日:2017-08-24

    申请号:US15248763

    申请日:2016-08-26

    Inventor: Kwang Ryong OH

    Abstract: Disclosed is an optical sensor, including an external cavity laser configured to output sensing light and reference light; and a photodetector configured to detect a beating signal by an interference of the sensing light and the reference light output from the external cavity laser, in which the external cavity laser includes a reflecting filter including a sensing grating, to which a sensing object is attachable, and a reference grating, which is disposed on the same plane as that of the sensing grating, and outputs sensing light reflected from the sensing grating and reference light reflected from the reference grating. Accordingly, the optical sensor does not require a high-resolution spectroscope and has improved resolution and sensitivity.

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