Abstract:
Embodiments of the present invention generally describe systems, devices, and methods for directly measuring pulse profiles during pulse delivery. In some embodiment, the pulse profiles may be measured while the pulse is delivered to ablate a material. Embodiments, may calculate ablation spot parameters based on the pulse profiles and may refine one or more subsequent laser pulses based on deviations from the calculated ablation spot parameters from desired ablation spot parameters. In some embodiments, a fluence profiler is provided. The fluence profiler may measure a pulse profile of a laser pulse from a portion of the laser pulse. The fluence profiler may utilize a UV radiation energy sensor device and a camera-based imager. The measurements from the UV radiation energy sensor device and the camera-based imager may be combined and scaled to provide a measured pulse profile that corresponds to the delivered pulse.
Abstract:
The present invention generally pertains to methods and kits for managing the variation in spectroscopic intensity measurements through the use of a reference component. The reference component may comprise a reference spectroscopic substance and may be contained together with a sample of interest in a sample to be tested, wherein the sample of interest may comprise a sample spectroscopic substance. Each sample to be tested may be uniquely identified and, hence, “barcoded” by combinations of different colors and concentrations of spectroscopic substances, contained therein.
Abstract:
A material inspection apparatus includes a light source, a light receiver, a light converter, and a processing unit. The light source is configured to emit light to a surface of an object to be inspected. The light receiver is configured to receive light reflected from the surface of the object. The light converter is configured to convert the light received by the light receiver into an electric current. The processing unit is configured to determine, according to the electric current, a material of the surface of the object.
Abstract:
A method and a system for measuring an optical asynchronous sample signal. The system for measuring an optical asynchronous sampling signal comprises a pulsed optical source capable of emitting two optical pulse sequences with different repetition frequencies, a signal optical path, a reference optical path, and a detection device. Since the optical asynchronous sampling signal can be measured by merely using one pulsed optical source, the complexity and cost of the system are reduced. A multi-frequency optical comb system using the pulsed optical source and a method for implementing the multi-frequency optical comb are further disclosed.
Abstract:
The present invention discloses a method for measuring absolute value of non-linear error and an apparatus thereof. The method comprises: placing N reflecting plates jointed together at the sample port of the optical measuring instrument at the same time, wherein each of reflecting plate has a same covering area at the sample port; placing an aperture along light paths of the optical measuring instrument; adjusting the number of reflecting plates as used according to a position in the measuring range of the optical measuring instrument where the non-linear error is required to be measured; following every adjustment, acquiring the output results when the adjusted reflecting plates are placed at the sample port; performing a computation processing for non-linear error to the output results; and acquiring the non-linear error of the output results of the optical measuring instrument.
Abstract:
The invention relates to a sensor having a filter arrangement, downstream of which there is arranged a detector arrangement, and an evaluating device connected to the detector arrangement. The filter arrangement has at least a first filter, the suspect filter, and at least one second filter, the reference filter(s). The first filter is configured as a band pass filter allowing the passage of a first predetermined band, the suspect band. The at least one second filter is configured as a band pass filter allowing the passage of a second predetermined band(s), the reference band(s). The detector arrangement has at least one detector associated with at least one of the filters. The band passes reference filters are distributed above and below the band pass of the suspect filter. The sensor with advantage could be utilized within the IR band, and could advantageously be used to detect CO2.
Abstract:
A method and a device employing the method of flow cytometry, preferably applicable but not limited to the counting and differentiation of leukocytes. It relates more particularly to the field of simplified haematology instruments with moderate operating costs. The method is characterized in that a technique of impedance measurement is used for identifying the particles whose trajectory did not pass through a predetermined optical measurement zone in order to process them selectively, thus avoiding the use of sheath fluids for guiding the particles towards the measurement zone.
Abstract:
In one embodiment, a heterodyne detection system for detecting light includes a first input aperture adapted for receiving a first light from a scene input, a second input aperture adapted for receiving a second light from a local oscillator input, a broadband local oscillator adapted for providing the second light to the second input aperture, a dispersive element adapted for dispersing the first light and the second light, and a final condensing lens coupled to an infrared detector. The final condensing lens is adapted for concentrating incident light from a primary condensing lens onto the detector, and the detector is a square-law detector capable of sensing the frequency difference between the first light and the second light. More systems and methods for detecting light are disclosed according to more embodiments.
Abstract:
A laser scanner measuring system is disclosed, which has a laser scanner and a calibration target. The laser scanner comprises a light emitting element for emitting a pulsed laser beam, a rotary projecting unit for projecting the pulsed laser beam, a distance measuring unit, and a control unit for driving and controlling the light emitting element and the distance measuring unit. The calibration target has a reflection sector with a known shape and with high reflectance and is installed at a known position. In use, there is a step for judging a reflected pulsed laser beam from the reflection sector by detecting a level of light quantity, a step for determining a center position of the reflection sector based on the result of the judgment, and a step for calibrating the laser scanner measuring system based on the determined center position and on the known position.
Abstract:
Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems.