Absolute measurement method and apparatus thereof for non-linear error

    公开(公告)号:US09347823B2

    公开(公告)日:2016-05-24

    申请号:US14166796

    申请日:2014-01-28

    Inventor: Ruoduan Sun

    Abstract: The present invention discloses a method for measuring absolute value of non-linear error and an apparatus thereof. The method comprises: placing N reflecting plates jointed together at the sample port of the optical measuring instrument at the same time, wherein each of reflecting plate has a same covering area at the sample port; placing an aperture along light paths of the optical measuring instrument; adjusting the number of reflecting plates as used according to a position in the measuring range of the optical measuring instrument where the non-linear error is required to be measured; following every adjustment, acquiring the output results when the adjusted reflecting plates are placed at the sample port; performing a computation processing for non-linear error to the output results; and acquiring the non-linear error of the output results of the optical measuring instrument.

    Sensor utilizing band pass filters
    186.
    发明授权
    Sensor utilizing band pass filters 有权
    传感器利用带通滤波器

    公开(公告)号:US09329121B2

    公开(公告)日:2016-05-03

    申请号:US13264419

    申请日:2010-04-16

    Abstract: The invention relates to a sensor having a filter arrangement, downstream of which there is arranged a detector arrangement, and an evaluating device connected to the detector arrangement. The filter arrangement has at least a first filter, the suspect filter, and at least one second filter, the reference filter(s). The first filter is configured as a band pass filter allowing the passage of a first predetermined band, the suspect band. The at least one second filter is configured as a band pass filter allowing the passage of a second predetermined band(s), the reference band(s). The detector arrangement has at least one detector associated with at least one of the filters. The band passes reference filters are distributed above and below the band pass of the suspect filter. The sensor with advantage could be utilized within the IR band, and could advantageously be used to detect CO2.

    Abstract translation: 本发明涉及一种具有滤波器装置的传感器,其下游设置有检测器装置,以及连接到检测器装置的评估装置。 过滤器装置至少具有第一过滤器,可疑过滤器和至少一个第二过滤器,参考过滤器。 第一滤波器被配置为允许第一预定频带(可疑频带)通过的带通滤波器。 至少一个第二滤波器被配置为带通滤波器,允许通过第二预定带(参考频带)。 检测器装置具有至少一个与至少一个滤波器相关的检测器。 带通过参考滤波器分布在可疑滤波器的带通上方和下方。 有利的传感器可以在IR带内使用,并且可以有利地用于检测CO 2。

    Room-temperature quantum noise limited spectrometry and methods of the same
    188.
    发明授权
    Room-temperature quantum noise limited spectrometry and methods of the same 有权
    室温量子噪声限制光谱测定及方法相同

    公开(公告)号:US08901495B2

    公开(公告)日:2014-12-02

    申请号:US13076107

    申请日:2011-03-30

    CPC classification number: G01J3/453 G01J3/10 G01J3/4338 G01N21/35

    Abstract: In one embodiment, a heterodyne detection system for detecting light includes a first input aperture adapted for receiving a first light from a scene input, a second input aperture adapted for receiving a second light from a local oscillator input, a broadband local oscillator adapted for providing the second light to the second input aperture, a dispersive element adapted for dispersing the first light and the second light, and a final condensing lens coupled to an infrared detector. The final condensing lens is adapted for concentrating incident light from a primary condensing lens onto the detector, and the detector is a square-law detector capable of sensing the frequency difference between the first light and the second light. More systems and methods for detecting light are disclosed according to more embodiments.

    Abstract translation: 在一个实施例中,用于检测光的外差检测系统包括适于接收来自场景输入的第一光的第一输入孔,适于接收来自本地振荡器输入的第二光的第二输入孔,适于提供 第二光到第二输入孔,适于分散第一光和第二光的分散元件,以及耦合到红外检测器的最终聚光透镜。 最终聚光透镜适用于将来自主聚焦透镜的入射光集中到检测器上,检测器是能够检测第一光与第二光之间的频差的平方律检测器。 根据更多实施例公开了用于检测光的更多系统和方法。

    Laser Scanner, Laser Scanner Measuring System, Calibration Method For Laser Scanner Measuring System And Target For Calibration
    189.
    发明申请
    Laser Scanner, Laser Scanner Measuring System, Calibration Method For Laser Scanner Measuring System And Target For Calibration 有权
    激光扫描仪,激光扫描仪测量系统,激光扫描仪测量系统和目标校准方法

    公开(公告)号:US20120218546A1

    公开(公告)日:2012-08-30

    申请号:US13449389

    申请日:2012-04-18

    CPC classification number: G01S7/497 G01S7/4812 G01S17/42 G01S17/89

    Abstract: A laser scanner measuring system is disclosed, which has a laser scanner and a calibration target. The laser scanner comprises a light emitting element for emitting a pulsed laser beam, a rotary projecting unit for projecting the pulsed laser beam, a distance measuring unit, and a control unit for driving and controlling the light emitting element and the distance measuring unit. The calibration target has a reflection sector with a known shape and with high reflectance and is installed at a known position. In use, there is a step for judging a reflected pulsed laser beam from the reflection sector by detecting a level of light quantity, a step for determining a center position of the reflection sector based on the result of the judgment, and a step for calibrating the laser scanner measuring system based on the determined center position and on the known position.

    Abstract translation: 公开了一种具有激光扫描仪和校准目标的激光扫描仪测量系统。 激光扫描器包括用于发射脉冲激光束的发光元件,用于投射脉冲激光束的旋转投影单元,距离测量单元和用于驱动和控制发光元件和距离测量单元的控制单元。 校准目标具有已知形状和高反射率的反射扇区,并且安装在已知位置。 在使用中,存在通过检测光量水平来判断来自反射扇区的反射脉冲激光束的步骤,基于判断结果确定反射扇区的中心位置的步骤,以及校准步骤 激光扫描仪测量系统基于确定的中心位置和已知位置。

    METHOD AND SYSTEM FOR STANDARDIZING MICROSCOPE INSTRUMENTS
    190.
    发明申请
    METHOD AND SYSTEM FOR STANDARDIZING MICROSCOPE INSTRUMENTS 有权
    用于标准显微镜仪器的方法和系统

    公开(公告)号:US20120133930A1

    公开(公告)日:2012-05-31

    申请号:US13360532

    申请日:2012-01-27

    Abstract: Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems.

    Abstract translation: 用于从显微镜系统标准化定量测量的方法和装置。 该过程包括校准过程,由此通过显微镜系统的光学器件获得校准载玻片的图像。 校准滑块产生标准响应,可用于确定特定系统的机器固有因素。 机器固有因素可以存储供以后参考。 在使用中,获取目标样本和激发光源的图像。 使用配置为采样强度的校准仪器获得激发光源样品。 校准仪器具有相关的校正因子,以补偿其对普遍标准化校准仪器的性能。 机器固有因子,采样强度和校准仪器校正因子可用于补偿目标样品的定量测量,以便将结果归一化以与其他显微镜系统进行比较。

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