METHOD FOR OBTAINING FULL REFLECTANCE SPECTRUM OF A SURFACE AND APPARATUS THEREFOR
    13.
    发明申请
    METHOD FOR OBTAINING FULL REFLECTANCE SPECTRUM OF A SURFACE AND APPARATUS THEREFOR 有权
    用于获得表面的全反射光谱的方法及其装置

    公开(公告)号:US20160109292A1

    公开(公告)日:2016-04-21

    申请号:US14894302

    申请日:2014-05-12

    Abstract: Disclosed are a method for obtaining a full reflectance spectrum of a surface and an apparatus therefor. The method for obtaining a full reflectance spectrum of a surface, comprises the steps of: (a) calculating a combination value of spectral characteristics of a light source and response characteristics of a camera for an image of a reference object, the full reflectance spectrum of a surface of which is known, by utilizing the known full reflectance spectrum of a surface; (b) obtaining an image by photographing an object irradiated with light according to a predetermined lighting environment; and (c) obtaining a full reflectance spectrum of a surface for the object by utilizing the combination value of the spectral characteristics of the light source and the response characteristics of the camera for the image.

    Abstract translation: 公开了一种获得表面的全反射光谱的方法及其装置。 用于获得表面的全反射光谱的方法包括以下步骤:(a)计算光源的光谱特性的组合值和用于参考对象的图像的照相机的响应特性,全反射光谱 通过利用表面的已知全反射光谱,其表面是已知的; (b)根据预定的照明环境拍摄照射光的物体获得图像; 和(c)通过利用光源的光谱特性的组合值和相机对于图像的响应特性来获得物体的表面的全反射光谱。

    METHOD OF MEASURING TERAHERTZ WAVE AND TERAHERTZ SPECTROSCOPIC APPARATUS
    14.
    发明申请
    METHOD OF MEASURING TERAHERTZ WAVE AND TERAHERTZ SPECTROSCOPIC APPARATUS 审中-公开
    测量TERAHERTZ波和TERAHERTZ光谱仪的方法

    公开(公告)号:US20090302223A1

    公开(公告)日:2009-12-10

    申请号:US12481140

    申请日:2009-06-09

    CPC classification number: G01J3/02 G01J3/021 G01J3/0275 G01J3/0291 G01N21/3581

    Abstract: A method of measuring a terahertz wave includes the steps of: starting input of a pulse signal showing that scale marks have been detected, which are arranged at equal intervals along a moving direction of a movable stage which can move in a direction in which an optical path length of incident pulse light is contracted or extended; and taking signals outputted at pulse intervals of the pulse light from a terahertz wave detecting section by synchronizing the timing with the pulse signal.

    Abstract translation: 一种测量太赫兹波的方法包括以下步骤:启动表示已经检测出刻度标记的脉冲信号的输入,该脉冲信号沿着可移动台的移动方向以相等的间隔布置,所述移动方向可沿光学 入射脉冲光的路径长度缩小或延长; 并且通过使定时与脉冲信号同步,以脉冲间隔从太赫兹波检测部分输出的信号。

    Optical instrument and parts thereof for optimally defining light pathways
    15.
    发明授权
    Optical instrument and parts thereof for optimally defining light pathways 失效
    光学仪器及其部件,用于最佳地定义光通路

    公开(公告)号:US07557925B2

    公开(公告)日:2009-07-07

    申请号:US11504187

    申请日:2006-08-15

    Abstract: An optical assembly is disclosed that includes an illumination source, a detection sensor, a monitor sensor, and an optical piece having a first side adapted to face a sample. The optical piece defines an illumination channel extending from the illumination source toward the first side, a detection channel extending from the first side toward the detection sensor, and a monitor channel extending from the illumination channel toward the monitor sensor. A spectrophotometer is also disclosed that includes a circuit board, illumination source and one or more sensors. The circuit board includes an optically transparent region, wherein the illumination source is mounted and situated relative to a first surface of the circuit board, so as to direct light through the optically transparent region. Each sensor is mounted and situated relative to a second surface of the circuit board opposite the first surface.

    Abstract translation: 公开了一种光学组件,其包括照明源,检测传感器,监视器传感器和具有适于面向样品的第一侧的光学片。 光学片限定从照明源向第一侧延伸的照明通道,从第一侧向检测传感器延伸的检测通道,以及从照明通道向监视传感器延伸的监视通道。 还公开了一种分光光度计,其包括电路板,照明源和一个或多个传感器。 电路板包括光学透明区域,其中相对于电路板的第一表面安装和定位照明源,以便将光引导通过光学透明区域。 每个传感器相对于与第一表面相对的电路板的第二表面安装和定位。

    Apparatus and method for measuring optical characteristics of an object
    16.
    发明授权
    Apparatus and method for measuring optical characteristics of an object 失效
    用于测量物体的光学特性的装置和方法

    公开(公告)号:US07397562B2

    公开(公告)日:2008-07-08

    申请号:US11475717

    申请日:2006-06-26

    Abstract: A method for determining spectral characteristics of an object is disclosed. A probe is positioned in proximity relative to the object and provides light to a surface of the object and receives light from the object. One or more critical heights are defined below which no specularly refelcted light is received and propagated. Prior to positioning the probe in proximity relative to the object, a plurality of position-sensitive calibration/normalization reference and a plurality of calibration/normalization measurements are taken with the probe at a plurality of predetermined positions with respect to the calibration/normalization reference. The intensity of light received is determined in a plurality of spectral bands with one or more measurements. The spectral characteristics of the object are determined based on the one or more measurements and based on data taken from one or more of the calibration/normalization measurements.

    Abstract translation: 公开了一种用于确定物体的光谱特性的方法。 探针相对于物体定位在邻近处,并且向对象的表面提供光并接收来自物体的光。 下面定义了一个或多个关键的高度,其中没有镜面反射光被接收和传播。 在将探针定位在相对于物体附近之前,多个位置敏感的校准/归一化参考和多个校准/归一化测量在探针相对于校准/归一化参考的多个预定位置处被采集。 在具有一个或多个测量的多个光谱带中确定所接收的光的强度。 基于一个或多个测量并且基于从一个或多个校准/归一化测量获取的数据来确定对象的光谱特性。

    Hyper-spectral/continuously-tunable imager
    17.
    发明授权
    Hyper-spectral/continuously-tunable imager 失效
    超光谱/连续可调成像器

    公开(公告)号:US07148967B1

    公开(公告)日:2006-12-12

    申请号:US11158356

    申请日:2005-06-21

    Inventor: Glenn B. Slagle

    CPC classification number: G01J3/26 G01J3/02 G01J3/0275 G01J3/0289 G01J3/32

    Abstract: The invention employs a linear variable interference filter, which can be manually moved back and forth along its long axis in front of a slit parallel to its short axis. Thus, the filter pass-band varies linearly from 4,000 angstroms to 10,000 angstroms with a pass-band half-width no greater than 65 angstroms. Therefore, this combination of filter and slit can be placed in front of a charge coupled device (CCD) or other electro-optical imaging device and real time images can be taken as the filter is slid back and forth. Magnifying optics, beam-splitters and scale illuminators can be used to make the scale visible within the field of view of the camera imager. Or, as a simpler embodiment, the graduated image scale could in the form of a hologram of a graduated image scale taken at distance consistent with the desired depth of focus of the camera/imager.

    Abstract translation: 本发明采用线性可变干涉滤波器,其可以在平行于其短轴的狭缝前沿其长轴手动地前后移动。 因此,滤波器通带从4,000埃到线性变化到10,000埃,通带半宽不大于65埃。 因此,滤光器和狭缝的组合可以放置在电荷耦合器件(CCD)或其他电光成像器件的前面,并且可以采用实时图像来滤波器来回滑动。 可以使用放大光学元件,光束分离器和刻度照明器,使照相机成像器的视场内的刻度看得见。 或者,作为更简单的实施例,刻度图像尺度可以是与相机/成像器的所需焦点深度一致的刻度图像尺度的全息图的形式。

    Manual and automatic probe calibration
    18.
    发明申请
    Manual and automatic probe calibration 有权
    手动和自动探头校准

    公开(公告)号:US20040147824A1

    公开(公告)日:2004-07-29

    申请号:US10757279

    申请日:2004-01-13

    Abstract: The method and apparatus of the present invention provides a system wherein light-emitting diodes (LEDs) can be tuned within a given range by selecting their operating drive current in order to obtain a precise wavelength. The present invention further provides a manner in which to calibrate and utilize an LED probe, such that the shift in wavelength for a known change in drive current is a known quantity. In general, the principle of wavelength shift for current drive changes for LEDs is utilized in order to allow better calibration and added flexibility in the use of LED sensors, particularly in applications when the precise wavelength is needed in order to obtain accurate measurements. The present invention also provides a system in which it is not necessary to know precise wavelengths of LEDs where precise wavelengths were needed in the past. Finally, the present invention provides a method and apparatus for determining the operating wavelength of a light emitting element such as a light emitting diode.

    Abstract translation: 本发明的方法和装置提供了一种系统,其中可以通过选择它们的工作驱动电流来在给定范围内调节发光二极管(LED),以获得精确的波长。 本发明还提供了校准和利用LED探针的方式,使得驱动电流已知变化的波长偏移是已知量。 通常,利用LED的电流驱动变化的波长偏移原理,以便在使用LED传感器时更好地进行校准和增加灵活性,特别是在需要精确波长以获得准确测量的应用中。 本发明还提供一种系统,其中不需要知道过去需要精确波长的LED的精确波长。 最后,本发明提供了一种用于确定诸如发光二极管的发光元件的工作波长的方法和装置。

    MANUAL AND AUTOMATIC PROBE CALIBRATION
    20.
    发明申请
    MANUAL AND AUTOMATIC PROBE CALIBRATION 有权
    手动和自动探头校准

    公开(公告)号:US20010020123A1

    公开(公告)日:2001-09-06

    申请号:US09451151

    申请日:1999-11-30

    Abstract: The method and apparatus of the present invention provides a system wherein light-emitting diodes (LEDs) can be tuned within a given range by selecting their operating drive current in order to obtain a precise wavelength. The present invention further provides a manner in which to calibrate and utilize an LED probe, such that the shift in wavelength for a known change in drive current is a known quantity. In general, the principle of wavelength shift for current drive changes for LEDs is utilized in order to allow better calibration and added flexibility in the use of LED sensors, particularly in applications when the precise wavelength is needed in order to obtain accurate measurements. The present invention also provides a system in which it is not necessary to know precise wavelengths of LEDs where precise wavelengths were needed in the past. Finally, the present invention provides a method and apparatus for determining the operating wavelength of a light emitting element such as a light emitting diode.

    Abstract translation: 本发明的方法和装置提供了一种系统,其中可以通过选择它们的工作驱动电流来在给定范围内调节发光二极管(LED),以获得精确的波长。 本发明还提供了校准和利用LED探针的方式,使得驱动电流已知变化的波长偏移是已知量。 通常,利用LED的电流驱动变化的波长偏移原理,以便在使用LED传感器时更好地进行校准和增加灵活性,特别是在需要精确波长以获得准确测量的应用中。 本发明还提供一种系统,其中不需要知道过去需要精确波长的LED的精确波长。 最后,本发明提供了一种用于确定诸如发光二极管的发光元件的工作波长的方法和装置。

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