Abstract:
A hand held spectrometer is used to illuminate the object and measure the one or more spectra. The spectral data of the object can be used to determine one or more attributes of the object. In many embodiments, the spectrometer is coupled to a database of spectral information that can be used to determine the attributes of the object. The spectrometer system may comprise a hand held communication device coupled to a spectrometer, in which the user can input and receive data related to the measured object with the hand held communication device. The embodiments disclosed herein allow many users to share object data with many people, in order to provide many people with actionable intelligence in response to spectral data.
Abstract:
A hand held spectrometer is used to illuminate the object and measure the one or more spectra. The spectral data of the object can be used to determine one or more attributes of the object. In many embodiments, the spectrometer is coupled to a database of spectral information that can be used to determine the attributes of the object. The spectrometer system may comprise a hand held communication device coupled to a spectrometer, in which the user can input and receive data related to the measured object with the hand held communication device. The embodiments disclosed herein allow many users to share object data with many people, in order to provide many people with actionable intelligence in response to spectral data.
Abstract:
Disclosed are a method for obtaining a full reflectance spectrum of a surface and an apparatus therefor. The method for obtaining a full reflectance spectrum of a surface, comprises the steps of: (a) calculating a combination value of spectral characteristics of a light source and response characteristics of a camera for an image of a reference object, the full reflectance spectrum of a surface of which is known, by utilizing the known full reflectance spectrum of a surface; (b) obtaining an image by photographing an object irradiated with light according to a predetermined lighting environment; and (c) obtaining a full reflectance spectrum of a surface for the object by utilizing the combination value of the spectral characteristics of the light source and the response characteristics of the camera for the image.
Abstract:
A method of measuring a terahertz wave includes the steps of: starting input of a pulse signal showing that scale marks have been detected, which are arranged at equal intervals along a moving direction of a movable stage which can move in a direction in which an optical path length of incident pulse light is contracted or extended; and taking signals outputted at pulse intervals of the pulse light from a terahertz wave detecting section by synchronizing the timing with the pulse signal.
Abstract:
An optical assembly is disclosed that includes an illumination source, a detection sensor, a monitor sensor, and an optical piece having a first side adapted to face a sample. The optical piece defines an illumination channel extending from the illumination source toward the first side, a detection channel extending from the first side toward the detection sensor, and a monitor channel extending from the illumination channel toward the monitor sensor. A spectrophotometer is also disclosed that includes a circuit board, illumination source and one or more sensors. The circuit board includes an optically transparent region, wherein the illumination source is mounted and situated relative to a first surface of the circuit board, so as to direct light through the optically transparent region. Each sensor is mounted and situated relative to a second surface of the circuit board opposite the first surface.
Abstract:
A method for determining spectral characteristics of an object is disclosed. A probe is positioned in proximity relative to the object and provides light to a surface of the object and receives light from the object. One or more critical heights are defined below which no specularly refelcted light is received and propagated. Prior to positioning the probe in proximity relative to the object, a plurality of position-sensitive calibration/normalization reference and a plurality of calibration/normalization measurements are taken with the probe at a plurality of predetermined positions with respect to the calibration/normalization reference. The intensity of light received is determined in a plurality of spectral bands with one or more measurements. The spectral characteristics of the object are determined based on the one or more measurements and based on data taken from one or more of the calibration/normalization measurements.
Abstract:
The invention employs a linear variable interference filter, which can be manually moved back and forth along its long axis in front of a slit parallel to its short axis. Thus, the filter pass-band varies linearly from 4,000 angstroms to 10,000 angstroms with a pass-band half-width no greater than 65 angstroms. Therefore, this combination of filter and slit can be placed in front of a charge coupled device (CCD) or other electro-optical imaging device and real time images can be taken as the filter is slid back and forth. Magnifying optics, beam-splitters and scale illuminators can be used to make the scale visible within the field of view of the camera imager. Or, as a simpler embodiment, the graduated image scale could in the form of a hologram of a graduated image scale taken at distance consistent with the desired depth of focus of the camera/imager.
Abstract:
The method and apparatus of the present invention provides a system wherein light-emitting diodes (LEDs) can be tuned within a given range by selecting their operating drive current in order to obtain a precise wavelength. The present invention further provides a manner in which to calibrate and utilize an LED probe, such that the shift in wavelength for a known change in drive current is a known quantity. In general, the principle of wavelength shift for current drive changes for LEDs is utilized in order to allow better calibration and added flexibility in the use of LED sensors, particularly in applications when the precise wavelength is needed in order to obtain accurate measurements. The present invention also provides a system in which it is not necessary to know precise wavelengths of LEDs where precise wavelengths were needed in the past. Finally, the present invention provides a method and apparatus for determining the operating wavelength of a light emitting element such as a light emitting diode.
Abstract:
The method and apparatus of the present invention provides a system wherein light-emitting diodes (LEDs) can be tuned within a given range by selecting their operating drive current in order to obtain a precise wavelength. The present invention further provides a manner in which to calibrate and utilize an LED probe, such that the shift in wavelength for a known change in drive current is a known quantity. In general, the principle of wavelength shift for current drive changes for LEDs is utilized in order to allow better calibration and added flexibility in the use of LED sensors, particularly in applications when the precise wavelength is needed in order to obtain accurate measurements. The present invention also provides a system in which it is not necessary to know precise wavelengths of LEDs where precise wavelengths were needed in the past. Finally, the present invention provides a method and apparatus for determining the operating wavelength of a light emitting element such as a light emitting diode.
Abstract:
The method and apparatus of the present invention provides a system wherein light-emitting diodes (LEDs) can be tuned within a given range by selecting their operating drive current in order to obtain a precise wavelength. The present invention further provides a manner in which to calibrate and utilize an LED probe, such that the shift in wavelength for a known change in drive current is a known quantity. In general, the principle of wavelength shift for current drive changes for LEDs is utilized in order to allow better calibration and added flexibility in the use of LED sensors, particularly in applications when the precise wavelength is needed in order to obtain accurate measurements. The present invention also provides a system in which it is not necessary to know precise wavelengths of LEDs where precise wavelengths were needed in the past. Finally, the present invention provides a method and apparatus for determining the operating wavelength of a light emitting element such as a light emitting diode.