Specimen holder, specimen inspection apparatus, specimen inspection method, and method of fabricating specimen holder
    11.
    发明授权
    Specimen holder, specimen inspection apparatus, specimen inspection method, and method of fabricating specimen holder 有权
    试样支架,试样检查装置,试样检查方法和制造试样夹持器的方法

    公开(公告)号:US07745802B2

    公开(公告)日:2010-06-29

    申请号:US12023443

    申请日:2008-01-31

    Abstract: A specimen holder, a specimen inspection apparatus, and a specimen inspection method permitting a specimen consisting of cultured cells to be observed or inspected. Also, a method of fabricating the holder is offered. The holder has an open specimen-holding surface. At least a part of this surface is formed by a film. A specimen cultured on the specimen-holding surface of the film can be irradiated via the film with a primary beam for observation or inspection of the specimen. Consequently, the cultured specimen (e.g., cells) can be observed or inspected in vitro. Especially, if an electron beam is used as the primary beam, the specimen in vitro can be observed or inspected by SEM. Because the specimen-holding surface is open, a manipulator can gain access to the specimen. A stimulus can be given to the specimen using the manipulator. The reaction can be observed or inspected.

    Abstract translation: 试样支架,试样检查装置和允许观察或检查由培养细胞组成的试样的试样检查方法。 此外,提供了制造保持器的方法。 支架具有开放的标本保持表面。 该表面的至少一部分由膜形成。 可以在膜的试样保持表面上培养的样品通过膜通过主光束照射,用于观察或检查样品。 因此,可以在体外观察或检查培养的标本(例如细胞)。 特别地,如果使用电子束作为主光束,则可以通过SEM观察或检查体外的样本。 由于样品保持表面是开放的,操纵器可以进入样品。 可以使用机械手对试样给予刺激。 可以观察或检查反应。

    Specimen Holder, Specimen Inspection Apparatus, Specimen Inspection Method, and Method of Fabricating Specimen Holder
    12.
    发明申请
    Specimen Holder, Specimen Inspection Apparatus, Specimen Inspection Method, and Method of Fabricating Specimen Holder 有权
    试样支架,试样检查装置,试件检验方法和试样架制造方法

    公开(公告)号:US20080308731A1

    公开(公告)日:2008-12-18

    申请号:US12023443

    申请日:2008-01-31

    Abstract: A specimen holder, a specimen inspection apparatus, and a specimen inspection method permitting a specimen consisting of cultured cells to be observed or inspected. Also, a method of fabricating the holder is offered. The holder has an open specimen-holding surface. At least a part of this surface is formed by a film. A specimen cultured on the specimen-holding surface of the film can be irradiated via the film with a primary beam for observation or inspection of the specimen. Consequently, the cultured specimen (e.g., cells) can be observed or inspected in vitro. Especially, if an electron beam is used as the primary beam, the specimen in vitro can be observed or inspected by SEM. Because the specimen-holding surface is open, a manipulator can gain access to the specimen. A stimulus can be given to the specimen using the manipulator. The reaction can be observed or inspected.

    Abstract translation: 试样支架,试样检查装置和允许观察或检查由培养细胞组成的试样的试样检查方法。 此外,提供了制造保持器的方法。 支架具有开放的标本保持表面。 该表面的至少一部分由膜形成。 可以在膜的试样保持表面上培养的样品通过膜通过主光束照射,用于观察或检查样品。 因此,可以在体外观察或检查培养的标本(例如细胞)。 特别地,如果使用电子束作为主光束,则可以通过SEM观察或检查体外的样本。 由于样品保持表面是开放的,操纵器可以进入样品。 可以使用机械手对试样给予刺激。 可以观察或检查反应。

    PLASMA PROCESSING APPARATUS
    19.
    发明申请
    PLASMA PROCESSING APPARATUS 审中-公开
    等离子体加工设备

    公开(公告)号:US20090139658A1

    公开(公告)日:2009-06-04

    申请号:US11758959

    申请日:2007-06-06

    Abstract: A slotted conducting cylinder (11) surrounds a reactor chamber body (10) and is in turn surrounded by an antenna (12). The cylinder (11) can be grounded during normal operation of plasma processing apparatus, but when RF driven it serves to enhance capacitive coupling with the plasma causing the inner surface (16) of the body (10) to become charged and hence the plasma will sputter clean the inner surface (16).

    Abstract translation: 开槽的导电圆筒(11)围绕反应室主体(10)并由天线(12)围绕。 气缸(11)在等离子体处理装置的正常操作期间可以接地,但是当RF驱动时,其用于增强与等离子体的电容耦合,使得主体(10)的内表面(16)变得带电,因此等离子体将 溅射清洁内表面(16)。

    Double shield for electron and ion beam columns
    20.
    发明授权
    Double shield for electron and ion beam columns 失效
    电子和离子束柱双屏蔽

    公开(公告)号:US06297512B1

    公开(公告)日:2001-10-02

    申请号:US09052583

    申请日:1998-03-31

    CPC classification number: H01J37/09 H01J37/30 H01J2237/0266 H01J2237/317

    Abstract: The column surrounding an electron or ion beam is shielded with a second shield which is outside the column and isolated from the column, being connected to chassis ground at a location remote from the column. Also, wiring into the column is double shielded with the shields connected to ground at the end remote from the column and not at the column itself.

    Abstract translation: 围绕电子或离子束的柱子被第二屏蔽层屏蔽,该第二屏蔽件在柱外部并与柱隔离,在远离柱的位置连接到机壳接地。 此外,连接到列中的接线是双屏蔽的,屏蔽层在远离柱的端部连接到地,而不是在柱本身。

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