Abstract:
Photoluminescence quantum yield (PLQY) testing of quantum dots is described. In one embodiment, a method involves heating a sample including quantum dots and illuminating the sample with a light source. The method involves measuring spectra of luminescence from the illuminated quantum dots of the sample at each of a plurality of temperatures. The method involves measuring each of the plurality of temperatures with a temperature sensor. The PLQY at each of the plurality of temperatures is computed based on the measured spectra. The method further involves computing a relationship between QD emission wavelength of the measured spectra and the plurality of temperatures measured with the temperature sensor. The relationship is used to determine the QD temperature corresponding to each of the PLQY computations. In one embodiment, an integrating sphere moves on a gantry over the samples.
Abstract:
A method of and apparatus for controlling the temperature of an inductively coupled or microwave induced plasma for optical emission spectrometry or mass spectrometry in which the intensities of two spectral lines of radiation emitted by the plasma are measured, and the power provided to sustain the plasma is adjusted so that the ratio of the intensities remains substantially constant.
Abstract:
An apparatus and method for detecting cadmium using optical emission spectroscopy is provided. The apparatus contains a system which uses optical emission spectroscopy which is programmed and calibrated to detect the presence of cadmium in PPM. The system is calibrated using test samples which have been prepared with a lead/cadmium matrix material having at least one iron based electrode integrated therein.
Abstract:
An analysis system includes a laser source generating a laser beam for creating a plasma at a location on a sample. A spectrometer is responsive to photons emitted by the sample at said location and has an output. At least one nozzle is configured to deliver inert gas from a source locally to the location on the sample. A controller is responsive to a trigger signal and is configured to activate the laser source generating a series of laser pulses, open a valve to purge the location locally on the sample, and close the valve after one or more laser pulses.
Abstract:
An analysis (e.g., LIBS) system includes a laser source generating a laser beam for creating a plasma at a location on a sample, and a spectrometer responsive to photons emitted by the sample at said location and having an output. A controller is responsive to a trigger signal and is configured to activate the laser source generating a series of laser pulses in a cleaning cycle, process the spectrometer output, and automatically terminate the cleaning cycle based on the spectrometer output.
Abstract:
Systems and methods are disclosed for the detection and identification of objects, wherein an illumination device emits polychromatic light in the infrared range, creating a light curtain, or an essentially two-dimensional area of light in the X and Z axis. The light from the light curtain and light reflected or transmitted by an object in the light curtain is imaged, via aperture-imaging optics, onto an aperture that is in the optical path and behind the aperture-imaging optics. The aperture is an elongated opening extending along the Z axis. A wavelength-dispersive device, such as a grating, diffracts light admitted by the aperture wavelength-dispersively in a diffraction direction along the Y axis. An image sensor detects the diffraction image and generates image signals which are analyzed to identify the materials comprising the object. An output signal may be generated in response to the material identified.
Abstract:
The invention relates to a spectrometer for analyzing the optical emission of a sample by means of pulsed excitation of an optical spectral emission, having an excitation source, a gap arrangement, at least one dispersive element and having detectors for the emitted spectrum, in which two beam paths are provided with two dispersive elements, the first dispersive element of which images the spectrum of the emission onto a number of spatially resolving detectors and the second dispersive element of which images the spectrum of the emission onto a number of time-resolving detectors.
Abstract:
Among the multiple OES data wavelengths, an analysis device identifies the wavelength of light emissions from a substance contained in the plasma from among multiple light emission wavelengths within the chamber by way of the steps of: measuring the light emission within the chamber during etching processing of the semiconductor wafer; finding the time-based fluctuation due to changes over time on each wavelength in the measured intensity of the light emissions in the chamber; comparing the time-based fluctuations in the wavelength of the light emitted from the pre-specified substance; and by using the comparison results, identifying the wavelength of the light emitted from the substance caused by light emission within the chamber.
Abstract:
Provided is a spectroscope that can be manufactured easily, can be reduced in size, and can provide high wavelength resolution of a specific spectral band. Specifically, provided is a spectroscope with a diffraction grating 331 that deflects and separates incident light in different directions depending on to an element of the incident light, at least one optical element 332a, diffusing a light that has passed through this diffraction grating 331 and has entered the optical element 332a, a line sensor 333, which receives the light that has passed through the optical element 332a, thereby only light that has a specific deflection angle within a specific range of wavelengths from among all the light that entered said optical element 332a is selectively expanded and received.
Abstract:
A laser induced breakdown spectroscopy (LIBS) analyser (10) comprises an optical path P (shown by dashed lines P1 and dash-dot lines P2) and an automatic focus (or tracking) system (12). The optical path P focuses a laser beam emitted from a laser (14) onto a portion of sample S which is to be analysed by the analyser (10), and focuses radiation emitted by the sample S when irradiated by the laser beam to a detector (16). The automatic focus system (12) is capable of varying a length of the optical path P to maintain a constant spatial relationship (i.e. distance) between a focal point (18) of the laser beam and the sample S; as well as maintaining a constant instantaneous field of view (IFOV) of the detector (16) on the focal point of the laser.