公开(公告)号：US08553210B2

公开(公告)日：2013-10-08

申请号：US13209688

申请日：2011-08-15

Applicant: Jeffrey Beckstead ,  Patrick Treado ,  Matthew Nelson

Inventor： Jeffrey Beckstead ,  Patrick Treado ,  Matthew Nelson

IPC: G01N21/00

CPC classification number: G01J3/02 ,  G01J3/0208 ,  G01J3/0218 ,  G01J3/0272 ,  G01J3/28 ,  G01J3/44 ,  G01J3/443 ,  G01N21/35 ,  G01N21/6402 ,  G01N21/6456 ,  G01N21/65 ,  G01N21/658 ,  G01N21/718 ,  G01N2021/6423 ,  G01N2201/0221 ,  G01N2201/06113 ,  G01N2201/08 ,  G01N2201/101 ,  G01N2201/1087

Abstract: A system and method for locating and identifying unknown samples. A targeting mode may be utilized to scan regions of interest for potential unknown materials. This targeting mode may interrogate regions of interest using SWIR and/or fluorescence spectroscopic and imaging techniques. Unknown samples detected in regions of interest may be further interrogated using a combination of Raman and LIBS techniques to identify the unknown samples. Structured illumination may be used to interrogate an unknown sample. Data sets generated during interrogation may be compared to a reference database comprising a plurality of reference data sets, each associated with a known material. The system and method may be used to identify a variety of materials including: biological, chemical, explosive, hazardous, concealment, and non-hazardous materials.

Abstract translation: 用于定位和识别未知样品的系统和方法。 可以利用定位模式来扫描潜在未知材料的感兴趣区域。 这种瞄准模式可以使用SWIR和/或荧光光谱和成像技术来询问感兴趣的区域。 可以使用拉曼和LIBS技术的组合进一步询问在感兴趣区域中检测到的未知样品，以识别未知样品。 结构化照明可用于询问未知样品。 在询问期间生成的数据集可以与包括多个参考数据集的参考数据库进行比较，每个参考数据集与已知的资料相关联。 该系统和方法可用于识别各种材料，包括：生物，化学，爆炸，危险，隐蔽和非危险材料。

公开(公告)号：US08547540B2

公开(公告)日：2013-10-01

申请号：US13209670

申请日：2011-08-15

Applicant: Jeffrey Beckstead ,  Patrick Treado ,  Matthew Nelson

Inventor： Jeffrey Beckstead ,  Patrick Treado ,  Matthew Nelson

IPC: G01N21/00

CPC classification number: G01J3/02 ,  G01J3/0218 ,  G01J3/0272 ,  G01J3/28 ,  G01J3/44 ,  G01J3/443 ,  G01N21/6456 ,  G01N21/65 ,  G01N21/718 ,  G01N2201/0221 ,  G01N2201/08

Abstract: A system and method for locating and identifying unknown samples. A targeting mode may be utilized to scan regions of interest for potential unknown materials. This targeting mode may interrogate regions of interest using SWIR and/or fluorescence spectroscopic and imaging techniques. Unknown samples detected in regions of interest may be further interrogated using a combination of Raman and LIBS techniques to identify the unknown samples. Structured illumination may be used to interrogate an unknown sample. Data sets generated during interrogation may be compared to a reference database comprising a plurality of reference data sets, each associated with a known material. The system and method may be used to identify a variety of materials including: biological, chemical, explosive, hazardous, concealment, and non-hazardous materials.

Abstract translation: 用于定位和识别未知样品的系统和方法。 可以利用定位模式来扫描潜在未知材料的感兴趣区域。 这种瞄准模式可以使用SWIR和/或荧光光谱和成像技术来询问感兴趣的区域。 可以使用拉曼和LIBS技术的组合进一步询问在感兴趣区域中检测到的未知样品，以识别未知样品。 结构化照明可用于询问未知样品。 在询问期间生成的数据集可以与包括多个参考数据集的参考数据库进行比较，每个参考数据集与已知的资料相关联。 该系统和方法可用于识别各种材料，包括：生物，化学，爆炸，危险，隐蔽和非危险材料。

公开(公告)号：US08520203B2

公开(公告)日：2013-08-27

申请号：US12682268

申请日：2008-10-10

Applicant: Vincent Couderc ,  Philippe LeProux ,  Laurent LeFort ,  David Bouyge ,  Christelle Lesvigne-Buy ,  Aurelian Crunteanu Stanescu

Inventor： Vincent Couderc ,  Philippe LeProux ,  Laurent LeFort ,  David Bouyge ,  Christelle Lesvigne-Buy ,  Aurelian Crunteanu Stanescu

IPC: G01J3/30

CPC classification number: G01J3/443 ,  G01J3/4406 ,  G01N21/645

Abstract: A method and device is provided for characterizing microscopic elements. A source signal may be chopped by means of microsystems of opto-electromechanical elements (MOEMS), which gives rise to temporal modulation of the excitation signals. The method of characterizing microscopic elements involves propagating a dispersed light source signal, spatially chopping the spectrum of the source signal into at least two excitation signals having predetermined wavelengths λi, coding the excitation signals, focusing the excitation signals in order to generate a sensor signal propagated towards a measurement zone, and analyzing an interaction signal issuing from the interaction of the sensor signal with the microscopic elements situated in the measuring space. The spatial chopping of the spectrum of the source light signal is performed by a microsystem of opto-electromechanical elements (MOEMS).

Abstract translation: 提供了表征微观元素的方法和装置。 源信号可以通过光电机械元件（MOEMS）的微系统来切割，这导致激励信号的时间调制。 表征微观元素的方法涉及传播分散的光源信号，将源信号的光谱空间斩波成具有预定波长lambdai的至少两个激励信号，编码激励信号，聚焦激励信号以产生传播的传感器信号 朝向测量区域，并且分析从传感器信号与位于测量空间中的微观元件的相互作用发出的相互作用信号。 源光信号的光谱的空间斩波由光机电元件（MOEMS）的微系统执行。

公开(公告)号：US20130155404A1

公开(公告)日：2013-06-20

申请号：US13325840

申请日：2011-12-14

Applicant: Sungho JEONG ,  Seokhee LEE ,  Hee-Sang SHIM

Inventor： Sungho JEONG ,  Seokhee LEE ,  Hee-Sang SHIM

IPC: G01J3/30

CPC classification number: G01J3/443 ,  G01N21/718

Abstract: The present invention relates to a process control system which can measure the physical properties of a CIGS thin film in real-time in a continuous production line of a CIGS thin film solar cell, more specifically to a system for real-time analysis of material distribution of a CIGS thin film comprising: a header, which comprises a laser irradiation unit producing plasma from the CIGS thin film by irradiating a laser beam to a part of the CIGS thin film; and a spectrum detection optical unit detecting a spectrum generated from the plasma; a transfer unit, which transfers the header at the same rate and to the direction with the transfer rate and direction of the CIGS thin film; and a spectrum analysis unit, which analyzes the spectrum detected by the spectrum detection optical unit.

Abstract translation: 本发明涉及一种能够在CIGS薄膜太阳能电池的连续生产线中实时测量CIGS薄膜的物理性能的工艺控制系统，更具体地涉及一种实时分析材料分布的系统 包括：头部，其包括通过将激光束照射到CIGS薄膜的一部分而从CIGS薄膜产生等离子体的激光照射单元; 以及频谱检测光学单元，检测从等离子体产生的光谱; 传送单元，其以相同的速率传送头部并且传送到具有CIGS薄膜的传送速率和方向的方向; 以及分析由频谱检测光学单元检测到的频谱的频谱分析单元。

公开(公告)号：US20130148118A1

公开(公告)日：2013-06-13

申请号：US13817001

申请日：2011-08-22

Applicant: Jean-Luc Dorier ,  Fabio Demarco ,  Edmund Halasz

Inventor： Jean-Luc Dorier ,  Fabio Demarco ,  Edmund Halasz

IPC: G01J3/10

CPC classification number: G01J3/10 ,  G01J3/443 ,  G01N21/05 ,  G01N21/67

Abstract: A spark chamber for an optical emission analyser, comprising: a gas inlet located on a first side of the spark chamber for supplying a gas into the spark chamber; and a gas outlet located on a second side of the spark chamber arranged to convey the gas from the spark chamber; wherein an elongated electrode having an electrode axis generally along the direction of elongation is located within the spark chamber; and wherein: the first and second sides of the spark chamber lie at either side of the elongated electrode in directions generally perpendicular to the electrode axis; there is a gas flow axis through the spark chamber between the gas inlet and the gas outlet; and on passing along the gas flow axis from the gas inlet to the gas outlet the unobstructed internal cross sectional area of the spark chamber perpendicular to the gas flow axis remains constant to within a factor A, wherein A lies between 1.0 and 2.0.

Abstract translation: 1.一种用于光发射分析器的火花室，包括：位于火花室第一侧的气体入口，用于将气体供应到火花室中; 以及位于所述火花室的第二侧上的气体出口，其布置成从所述火花室输送气体; 其中具有大致沿着伸长方向的电极轴的细长电极位于火花室内; 并且其中：火花室的第一和第二侧位于大致垂直于电极轴线的方向上位于细长电极的任一侧; 通过气体入口和气体出口之间的火花室有气流轴线; 并且在气体流动轴线从气体入口到气体出口的过程中，垂直于气体流动轴线的火花室的无阻碍的内部横截面积保持恒定在A因子内，其中A在1.0和2.0之间。

公开(公告)号：US20130141115A1

公开(公告)日：2013-06-06

申请号：US13705351

申请日：2012-12-05

Applicant: Pellenc Selective Technologies ,  Universite De Savoie

Inventor： Antoine BOURELY ,  David MOUNEYRAC ,  Jean-Louis COUTAZ ,  Frederic GARET ,  Benjamin BLAMPEY

IPC: G01N21/17 ,  G01N23/223 ,  G01J3/28 ,  G01N22/00

CPC classification number: G01N21/17 ,  B07C5/34 ,  G01J3/28 ,  G01J3/443 ,  G01N22/00 ,  G01N23/223 ,  G01N2223/071

Abstract: Automatic process and installation for inspecting and/or sorting objects or articles belonging to at least two different categories, and made to advance approximately in a single layer, for example on a conveyor belt or a similar transport support. The process includes subjecting the advancing flow of objects or articles to at least two different types of contactless analysis by radiation, whose results are used in a combined manner for each object or article to perform a discrimination among these objects or articles and/or an evaluation of at least one characteristic of the latter, the analyses including at least one surface analysis process able to determine the physical and/or chemical composition of the outer layer of an object or article exposed to the radiation used in this process, and at least one volume analysis process able to determine the equivalent thickness of material of the same object or article.

Abstract translation: 自动过程和安装，用于检查和/或分类属于至少两个不同类别的物品或制品，并使其大致在单层中前进，例如在传送带或类似的传送支架上。 该过程包括使物体或物品的前进流动通过辐射进行至少两种不同类型的非接触式分析，其结果以组合的方式用于每个物体或物品以执行这些物体或物品之间的鉴别和/或评价 的分析包括至少一个表面分析过程，其能够确定暴露于在该过程中使用的辐射的物体或制品的外层的物理和/或化学成分，以及至少一个 体积分析过程能够确定同一物体或物品的材料的等效厚度。

公开(公告)号：US20130100444A1

公开(公告)日：2013-04-25

申请号：US13653017

申请日：2012-10-16

Applicant: Chesner Engineering. P.C.

Inventor： Warren H. Chesner ,  Matteo Forgione ,  Henry G Justus

IPC: G01J3/443

CPC classification number: G01J3/443 ,  G01N21/718 ,  G01N21/85 ,  G01N2021/8592

Abstract: A method is described for providing a continuous flow of a target material past a laser to enable repeated firings of the laser beam at the material in a controlled and uniform fashion. The objective is to provide a means to characterize the target material using laser induced breakdown spectroscopy. The method can be employed in a laboratory or field environment providing improved methods for characterizing in real time the properties of bulk materials.

Abstract translation: 描述了一种用于提供目标材料经过激光器的连续流动的方法，以使激光束能够以受控和均匀的方式在材料处重复点火。 目的是提供使用激光诱导击穿光谱来表征目标材料的手段。 该方法可以在实验室或现场环境中使用，提供用于实时表征散装材料的特性的改进方法。

公开(公告)号：US20130016349A1

公开(公告)日：2013-01-17

申请号：US13183228

申请日：2011-07-14

Applicant: Andrew J. Effenberger, JR. ,  Jill R. Scott ,  Timothy R. McJunkin

Inventor： Andrew J. Effenberger, JR. ,  Jill R. Scott ,  Timothy R. McJunkin

IPC: G01J3/30

CPC classification number: G01J3/18 ,  G01J3/26 ,  G01J3/443 ,  G01N21/718

Abstract: In laser-induced breakdown spectroscopy (LIBS), an apparatus includes a pulsed laser configured to generate a pulsed laser signal toward a sample, a constructive interference object and an optical element, each located in a path of light from the sample. The constructive interference object is configured to generate constructive interference patterns of the light. The optical element is configured to disperse the light. A LIBS system includes a first and a second optical element, and a data acquisition module. The data acquisition module is configured to determine an isotope measurement based, at least in part, on light received by an image sensor from the first and second optical elements. A method for performing LIBS includes generating a pulsed laser on a sample to generate light from a plasma, generating constructive interference patterns of the light, and dispersing the light into a plurality of wavelengths.

Abstract translation: 在激光诱发击穿光谱（LIBS）中，一种装置包括脉冲激光器，其经配置以产​​生朝向样品的脉冲激光信号，构造干涉物体和光学元件，每个位于来自样品的光的路径中。 构造性干扰对象被配置为产生光的建设性干涉图案。 光学元件构造成分散光。 LIBS系统包括第一和第二光学元件，以及数据采集模块。 数据采集​​模块被配置为至少部分地基于图像传感器从第一和第二光学元件接收的光来确定同位素测量。 用于执行LIBS的方法包括在样本上产生脉冲激光以产生来自等离子体的光，产生光的建设性干涉图案，以及将光分散成多个波长。

公开(公告)号：US20120327416A1

公开(公告)日：2012-12-27

申请号：US13579838

申请日：2011-02-15

Applicant: Rainer Simons ,  Armin Schmidt

Inventor： Rainer Simons ,  Armin Schmidt

IPC: G01J3/46

CPC classification number: G01J3/20 ,  G01J3/02 ,  G01J3/0286 ,  G01J3/443

Abstract: The invention relates to a spectrometer comprising a hollow main optical body having at least one light channel, a light source, a diffraction grating having a grating central point, a light inlet opening, and a detector unit, which are arranged in such a way that the focal curve of the spectrometer satisfies the back focus equation. In order to create a spectrometer having sufficient spectral resolution from a low-price, light, and easy-to-process material, which spectrometer is able to operate in a large temperature interval even without thermostatic control, according to the invention the light inlet opening is arranged on a compensation body, the compensation body is arranged in the light channel and fastened to the main optical body between the light source and the diffraction grating, and the compensation body is dimensioned in such a way that the compensation body changes the distance between the light inlet opening and the grating central point when the main optical body thermally expands.

Abstract translation: 本发明涉及一种光谱仪，其包括具有至少一个光通道的中空主光学主体，光源，具有光栅中心点的衍射光栅，光入口和检测器单元，其布置成 光谱仪的焦点曲线满足后焦点方程。 为了从低价格，轻便且易于处理的材料制造具有足够的光谱分辨率的光谱仪，即使没有恒温控制，该光谱仪也能够在大的温度范围内操作，根据本发明，光入口开口 被配置在补偿体上，补偿体配置在光通道中并且紧固在光源与衍射光栅之间的主光学体上，并且补偿体的尺寸使得补偿体的尺寸使得补偿体之间的距离 当主光学体热膨胀时，光入口和光栅中心点。

公开(公告)号：US20120325783A1

公开(公告)日：2012-12-27

申请号：US13602267

申请日：2012-09-03

Applicant: Peter Morrisroe

Inventor： Peter Morrisroe

IPC: B23K10/00

CPC classification number: G01N21/73 ,  G01J3/443 ,  G01N21/68 ,  G01N2201/126 ,  H01J49/105

Abstract: A device for sustaining a plasma in a torch is provided. In certain examples, the device comprises a first electrode configured to couple to a power source and constructed and arranged to provide a loop current along a radial plane of the torch. In some examples, the radial plane of the torch is substantially perpendicular to a longitudinal axis of the torch.

Abstract translation: 提供了一种用于在割炬中维持等离子体的装置。 在某些示例中，该装置包括被配置为耦合到电源并被构造和布置成沿着焊炬的径向平面提供回路电流的第一电极。 在一些示例中，焊炬的径向平面基本上垂直于焊炬的纵向轴线。