Abstract:
A spectrometer comprises a plurality of isolated optical channels comprising a plurality of isolated optical paths. The isolated optical paths decrease cross-talk among the optical paths and allow the spectrometer to have a decreased length with increased resolution. In many embodiments, the isolated optical paths comprise isolated parallel optical paths that allow the length of the device to be decreased substantially. In many embodiments, each isolated optical path extends from a filter of a filter array, through a lens of a lens array, through a channel of a support array, to a region of a sensor array. Each region of the sensor array comprises a plurality of sensor elements in which a location of the sensor element corresponds to the wavelength of light received based on an angle of light received at the location, the focal length of the lens and the central wavelength of the filter.
Abstract:
A spectrum detector includes a substrate, a photodetector formed on the substrate and including a semiconductor having a plurality of convex portions, and a wavelength detection circuit for detecting a wavelength of light transmitted through the plurality of convex portions. Each photodetector comprises different convex portions different from one another with respect to at least one of size, pitch, and height. The photodetectors have a relationship expressed by formula L·m=λ·cos θ/(2n), wherein L is a diameter of each convex portion, n is a refractive index between the air and each convex portion of the GaN layer, m is an integer or a reciprocal of an integer, λ is a wavelength of light transmitted through the plurality of convex portions of each photodetector, and θ is an incident angle of the light with respect to a surface of the p-GaN layer.
Abstract:
Devices and systems which include on-chip waveguides with flattened dispersion are described. In one aspect, silicon nitride slot waveguides that exhibit four zero-dispersion wavelengths with a flattened dispersion over a wavelength range of 500 nm are obtained. The disclosed silicon nitride slot waveguides are used to generate a two-octave supercontinuum from 630 nm to 2650 nm, enabling (a) on-chip generation of 5 fs optical pulses as short as 1.3 cycles, and (b) sensitive single-shot measurements of the absolute carrier-envelope phase using a single integrated waveguide. In another aspect, silicon slot waveguides that exhibits four zero-dispersion wavelengths with a flattened dispersion over a wavelength range of 670-nm are obtained. An octave-spanning supercontinuum is generated in the disclosed silicon slot waveguide, over a wavelength range from 1217 nm to 2451 nm, approximately from bandgap wavelength to half-bandgap wavelength. Input pulses longer that 100 fs can be compressed to 10 fs using the disclosed silicon slot waveguide.
Abstract:
A SGWH-based spectrometer is disclosed that has the following advantages compared to prior art: compactness, high-resolution, high light throughput, high OOB rejection ratio, adjustability to the different wavebands, robustness and environmental stability.
Abstract:
A lightweight, compact hyperspectral imaging system includes a fore-optics module and a wavelength-dispersing module. The imaging system may also include a detector, supporting electronics and a battery module. The fore-optics module may include a telescope with three or more mirrors, where the mirrors include a silver coating that provides high reflectivity over wavelengths in the visible and shortwave infrared portions of the spectrum. The modules of the imaging system may be incorporated in a housing having a longest linear dimension of 16 inches or less. The housing may be cylindrical in shape and have a length of 14 inches or less inches and a diameter of 8 inches or less.
Abstract:
Various embodiments of apparatuses, systems and methods are described herein for a spectrometer comprising at least two dispersive elements configured to receive at least one input optical signal and generate two or more pluralities of spatially separated spectral components, at least a portion of the at least two dispersive elements being implemented on a first substrate; and a single detector array coupled to the at least two dispersive elements and configured to receive and measure two or more pluralities of narrowband optical signals derived from the two or more pluralities of spatially separated spectral components, respectively.
Abstract:
Apparatuses and systems for analyzing light by mode interference are provided. An example of an apparatus for analyzing light by mode interference includes a number of waveguides to support in a multimode region two modes of the light of a particular polarization and a plurality of scattering objects offset from a center of at least one of the number of waveguides.
Abstract:
A device (1) for use in optical spectroscopy and a method for its manufacture are described. The device includes at least one light source (8) and at least one spectrometer (3) fabricated integratively, the optical components of the at least one spectrometer (3) being optical microcomponents (11,13,16,19,20,21) which are mounted integratively on the top and/or bottom side (9,12) of a substrate board (2). In the method according to the present invention, at least one light source (8) is mounted on a substrate board (2), and at least one spectrometer (3) is produced monolithically in a three-dimensional integration on the substrate board (2). In this context, the spectrometer (3) that is produced according to the method is assembled from optical microcomponents (11,13,16,19,20,21).
Abstract:
A method for manufacturing a spectroscopic sensor 1 comprises a first step of forming a cavity layer 21 by etching a surface layer disposed on a handle substrate, a second step of forming a first mirror layer 22 on the cavity layer 21 after the first step, a third step of joining a light-transmitting substrate 3 onto the first mirror layer 22 after the second step, a fourth step of removing the handle substrate from the cavity layer 21 after the third step, a fifth step of forming a second mirror layer 23 on the cavity layer 21 devoid of the handle substrate after the fourth step, and a sixth step of joining a light-detecting substrate 4 onto the second mirror layer after the fifth step.
Abstract:
A sensor device including one or more sensor elements and one or more optical filters is provided. The one or more optical filters each include a plurality of dielectric layers and a plurality of metal layers stacked in alternation. The metal layers are intrinsically protected by the dielectric layers. In particular, the metal layers have tapered edges that are protectively covered by one or more of the dielectric layers.