Abstract:
The present invention relates to a method for quantifying the composition of a product, including: irradiating the product with a radiation source in the near infrared range; receiving radiation which is reflected by or transmitted through the product; providing an output signal corresponding to the intensity of the radiation received at a number of different wavelengths; and determining whether or not the product lies within predetermined integrity criteria on the basis of the output signal using a mathematical method. The moving product contains a solution or homogeneous dispersion and the content of at least one substance contained in the dispersion or solution is quantitatively determined on the basis of the output signal. The invention also relates to a device for carrying out this method.
Abstract:
The present subject matter relates to methods of high-speed analysis of product samples during production of the product. Light is directed to a portion of a product under analysis and reflected from or transmitted through the product toward optical detectors. Signals from the optical detectors are compared to determine characteristics of the product under analysis. Temperature within the monitoring system may be monitored in order to provide compensation for the signals produced by the optical detectors. The products under analysis may be stationary, moved by an inspection point by conveyor or other means, or may be contained within a container, the container including a window portion through which the product illuminating light may pass.
Abstract:
In a reflection characteristic measuring apparatus 10 and a method for calibrating the reflection characteristic measuring apparatus, multiple standard spectral characteristics, or multiple calibration data based on the multiple standard spectral characteristics are obtained in advance with corresponding reference values relating to an emission characteristic of a light source 21. An optimum standard spectral characteristic or an optimum calibration data is selected from the multiple standard spectral characteristics or the multiple calibration data obtained. A spectral reflection characteristic of a sample is calculated using the selected standard spectral characteristic or the selected calibration data.
Abstract:
Methods for matching semiconductor processing chambers using a calibrated spectrometer are disclosed. In one embodiment, plasma attributes are measured for a process in a reference chamber and a process in an aged chamber. Using a calibrated light source, an optical path equivalent to an optical path in a reference chamber and an optical path in an aged chamber can be compared by determining a correction factor. The correction factor is applied to adjust a measured intensity of plasma radiation through the optical path in the aged chamber. Comparing a measured intensity of plasma radiation in the reference chamber and the adjusted measured intensity in the aged chamber provide an indication of changed chamber conditions. A magnitude of change between the two intensities can be used to adjust the process parameters to yield a processed substrate from the aged chamber which matches that of the reference chamber.
Abstract:
A method of preparing nanothin polymer films having uniform and selectively sized pores utilizing pore forming templates. Lipids and pore forming templates are dissolved into a first solution. The solvent is removed thereby creating a lipid bilayer with pore forming templates dispersed throughout. The bilayer is hydrated and monomers and crosslinkers are added to create a second solution. A nanothin film with pore forming templates is created through polymerization of said second solution. The pore forming templates are dissolved into a third solution by addition of a chemical in which the pore forming template is soluble, but the lipid bilayer is insoluble. This third solution is separated from the mixture leaving a nanothin polymer film with pores of a uniform thickness and surface area. In summary, the guided assembly method presented here suggests a new general strategy for the fabrication of nanothin materials with controlled permeability, which provides improvements over the currently existing technology.
Abstract:
In a wavelength calibration method, an observed spectrum of a light that has a wavelength band is obtained, wherein the light has at least an attenuated wavelength component that corresponds to at least a predetermined absorption wavelength that is included in the wavelength band. A corrected spectrum is then obtained from the observed spectrum, wherein the corrected spectrum has reduced dependencies upon the full width at half maximum of an emission band of the light and upon an intensity ripple period of the light.
Abstract:
The apparatus and methods herein provide light sources and endoscopy systems that can improve the quality of images and the ability of users to distinguish desired features when viewing tissues by providing methods and apparatus that improve the dynamic range of images from endoscopes, in particular endoscopes that have dynamic range limited because of small image sensors and small pixel electron well capacity, and other optical systems.
Abstract:
Disclosed herein is a spectrophotometer. The spectrophotometer includes a CPU having a signal prediction part and a comparison/calculation part. The signal prediction part predicts the strength of an output signal from a photodetection unit during the next period based on the strength of the output signal from the photodetection unit. The comparison/calculation part compares a reference value, which defines the limit value of electrical current passing through a photomultiplier tube, of the strength of an output signal from an AD converter with a predicted value predicted by the signal prediction part. In a case where the predicted value exceeds the reference value, a voltage applied to the photomultiplier tube is calculated so that the strength of an output signal from the photodetection unit during the next period does not exceed the reference value. An applied voltage control part is configured to perform applied voltage control based on an applied voltage value calculated by the comparison/calculation part when the predicted value of the strength of an output signal from the photodetection unit during the next period exceeds the reference value.
Abstract:
One embodiments includes a method that includes enabling an excitation laser during an excitation period, after a timed delay following the first excitation period, monitoring a photon scattering caused by the excitation laser, analyzing the photon scattering, automatically adjusting the timed delay to a modified timed delay based on the analyzed photon scattering and following the modified timed delay, enabling a Raman spectrometer to monitor Raman scattering caused by the excitation laser during a Raman monitoring period.
Abstract:
Methods of selecting spectral elements and system components for a multivariate optical analysis system include providing spectral calibration data for a sample of interest; identifying a plurality of combinations of system components; modeling performance of a pilot system with one of the combinations of system components; determining optimal characteristics of the pilot system; and selecting optimal system components from among the combinations of system components.