Abstract:
The present invention relates to different types of micromirror spectrometers using MEMS (Micro Electro Mechanical Systems) for various applications in the UV, VIS, NIR and MIR wavelength regions. The invention enables a wavelength selection using micro scanning mirror and integrated grating on a much smaller scale than previously encountered conventional diffraction grating monochromators. Especially small designs are obtained via simultaneous usage of collimation optics for both spatial filters, by using entrance and exit slit apertures, which are located very close together. Until now, the spatial filters themselves are not part of the miniaturization. The utilization of the precision from this technology allows for reproducible slits with defined geometries and surface roughness and accurate spatial classification towards the rotation axis of the diffraction grating. Therefore the assembly and adjustment effort of the monochromator is reduced. Due to the option of additional slit apertures, several independent monochromator channels with crossed beam paths can be created; whereas all remaining optical elements (diffraction grating and collimator optic) are utilized together. Such additional channels can serve, for example, as reference measurements of a radiation source, or enable the direct optical control of the grating torsion angle as a monitoring channel. The goal of the invention is to define a simple design and arrangement for monochromators based upon micromechanical elements, which avoids all disadvantages described above.
Abstract:
An apparatus and method for producing a substantially straight instrument image is provided. The apparatus and method for producing a substantially straight instrument image, according to the present invention includes a curved slit. The curved slit may be formed in a light beam controller. The curved slit is capable of admitting a light beam into the instrument. The instrument parameters associated with optical devices located in the instrument in the path of the light beam are determined. One or more formulae are used to transform and process the instrument spectral parameters to determine the shape or curvature of the curved slit.
Abstract:
A compact, grating spectrometer (1A) particularly adapted for visual observation of the sun's spectrum, from the Calcium K line to the Fraunhofer B line, at very high dispersion. The numerical aperture of the spectrometer's collimating mirror is intentionally mismatched to the numerical aperture of the spectrometer's light-input device in order to exploit, by means of the exceedingly narrow width of the spectrometer's entrance slit (110), the high degree of coherence of the central region of the Airy disk formed by the light-input device. The resulting Fraunhofer diffraction illuminates totally, or nearly totally, the collimating mirror throughout the K-B interval. The human eye's dynamic range is compensated to maintain resolution at the lowest, light levels of the K-B interval. UV spill is suppressed. Both input-optics and slit are shielded against differential heating.
Abstract:
An apparatus and method for producing a substantially straight instrument image is provided. The apparatus and method for producing a substantially straight instrument image, according to the present invention includes a curved slit. The curved slit may be formed in a light beam controller. The curved slit is capable of admitting a light beam into the instrument. The instrument parameters associated with optical devices located in the instrument in the path of the light beam are determined. One or more formulae are used to transform and process the instrument spectral parameters to determine the shape or curvature of the curved slit.
Abstract:
Concentric spectrometers are plagued with internal reflections due to inherent nature of more than one optical surface possessing a common center of curvature. Reflections from optical surfaces arise when there is a difference or change in the refractive index of the media in which an optical beam or ray of a given wavelength is propagating. Internal reflections in concentric optical systems can produce a myriad of undesirable optical phenomenon at the image plane such as multiple images of an object, interference fringes, and stray light. As a result a loss in contrast or detection limit arise from such phenomenon in which light or detectable radiation that impinges on the image plane does not add to the formation of the intended image, (stray light). The present invention produces high quality images without the optical phenomenon(s) that arise from internal reflections by removing the reflected radiation from propagating through the optical system.
Abstract:
Optical characteristic measuring systems and methods such as for determining the color or other optical characteristics of teeth are disclosed. Perimeter receiver fiber optics are spaced apart from a source fiber optic and receive light from the surface of the object/tooth being measured. Light from the perimeter fiber optics pass to a variety of filters. The system utilizes the perimeter receiver fiber optics to determine information regarding the height and angle of the probe with respect to the object/tooth being measured. Under processor control, the optical characteristics measurement may be made at a predetermined height and angle. Various color spectral photometer arrangements are disclosed. Translucency, fluorescence, gloss and/or surface texture data also may be obtained. Audio feedback may be provided to guide operator use of the system. The probe may have a removable or shielded tip for contamination prevention. A method of producing dental prostheses based on measured data also is disclosed. Measured data also may be stored and/or organized as part of a patient data base. Such methods and implements may be desirably utilized for purposes of detecting and preventing counterfeiting or the like.
Abstract:
Color measuring systems and methods are disclosed. Perimeter receiver fiber optics are spaced apart from a central source fiber optic and receive light reflected from the surface of the object being measured. Light from the perimeter fiber optics pass to a variety of filters. The system utilizes the perimeter receiver fiber optics to determine information regarding the height and angle of the probe with respect to the object being measured. Under processor control, the color measurement may be made at a predetermined height and angle. Various color spectral photometer arrangements are disclosed. Translucency, fluorescence and/or surface texture data also may be obtained. Audio feedback may be provided to guide operator use of the system. The probe may have a removable or shielded tip for contamination prevention.
Abstract:
Color measuring systems and methods are disclosed. Perimeter receiver fiber optics are spaced apart from a central source fiber optic and receive light reflected from the surface of the object being measured. Light from the perimeter fiber optics pass to a variety of filters. The system utilizes the perimeter receiver fiber optics to determine information regarding the height and angle of the probe with respect to the object being measured. Under processor control, the color measurement may be made at a predetermined height and angle. Various color spectral photometer arrangements are disclosed. Translucency, fluorescence and/or surface texture data also may be obtained. Audio feedback may be provided to guide operator use of the system. The probe may have a removable or shielded tip for contamination prevention.
Abstract:
A spectroanalytical system includes entrance aperture defining structure for receiving radiation to be analyzed along a first path; dispersion structure in the first path for spatially dispersing the radiation as a function of wavelength; exit aperture structure defining a non-elongate aperture for receiving radiation from the dispersion structure; detector aperture structure coupled to the exit aperture structure for detecting selected wavelengths of the dispersion radiation; and wedge-like conditioner structure disposed between the first path and between the dispersion structure and the entrance and exit aperture structures.
Abstract:
An optical spectrometer system that includes an optical element having a two-dimensional, curved, reflective, low emissivity slit body, or surround, in which an imaging slit is formed. The optical spectrometer system includes a detector, such as an infrared detector, for example, disposed in a cavity at a focal plane thereof, an optical system in the cavity for focusing radiation onto the detector, and an entrance pupil disposed in the cavity. The curved slit body effectively and substantially eliminates out-of-field radiation from impinging upon the slit body, and its low emissivity greatly reduces self-emission from the slit body. The reflective slit body is a low emissivity element that images the detector back upon itself and passes background energy that falls within a cone defined by the entrance pupil. By using the two-dimensional curved slit body, a relatively small detector dewar or focal plane cooler may be employed in the optical spectrometer system to cool the detector. The two-dimensional curved slit body emits less than three percent of in-field radiation and permits virtually none of the radiation derived from walls of the cavity from being imaged at the detector. The curved slit body preferably has a torroidal shape, and is formed so that central rays are normal to the slit body at all points. The curved slit body images the detector back upon itself, thus minimizing background effects. Use of the curved slit body eliminates the need to cool the slit body and walls of the cavity.