Electronic component
    21.
    发明授权

    公开(公告)号:US11963302B2

    公开(公告)日:2024-04-16

    申请号:US17412314

    申请日:2021-08-26

    Inventor: Masato Nomiya

    CPC classification number: H05K1/117 H05K1/09 H05K2201/0364 H05K2201/0919

    Abstract: An electronic component includes a substrate and side wires. The substrate includes a first major surface, a second major surface, and a side surface. The side wires are on the side surface of the substrate and spaced apart from each other in a direction along an outer periphery of the substrate when viewed in plan in a thickness direction of the substrate. At least a portion of each of the side wires is provided indirectly on the side surface of the substrate. The electronic component further includes an electrically insulating layer interposed between the side surface of the substrate and the at least a portion of each of the side wires. Each of the side wires includes a bent portion bent when viewed in plan in the thickness direction of the substrate.

    Mems Film for Semiconductor Device Test Socket Including Mems Bump
    24.
    发明申请
    Mems Film for Semiconductor Device Test Socket Including Mems Bump 审中-公开
    用于半导体器件测试插槽的Mems Film包括Mems Bump

    公开(公告)号:US20170027056A1

    公开(公告)日:2017-01-26

    申请号:US14919442

    申请日:2015-10-21

    Abstract: A microelectromechanical system (MEMS) film for a test socket is arranged between a semiconductor device and a test apparatus for performing an electrical test of the semiconductor device and includes a flexible bare film and a plurality of round-type MEMS bumps on the bare film, each of the MEMS bumps being formed on the bare film by using a MEMS processing technique, having an electrical contact with an electrode pad of the test apparatus or a conductive ball of the semiconductor device, and having a contact surface rounded from an edge side toward a center side in a convex manner in a direction toward the electrode pad or the conductive ball.

    Abstract translation: 用于测试插座的微电子机械系统(MEMS)膜布置在半导体器件和用于执行半导体器件的电测试的测试装置之间,并且在裸膜上包括柔性裸片和多个圆形MEMS凸块, 每个MEMS凸块通过使用MEMS处理技术形成在裸膜上,该MEMS处理技术与测试装置的电极焊盘或半导体器件的导电球电接触,并且具有从边缘侧朝向 在朝向电极焊盘或导电球的方向上呈凸形的中心侧。

Patent Agency Ranking